Method for manufacturing semiconductor device or apparatus, and apparatus for manufacturing the same
A method for manufacturing a semiconductor device or apparatus having at least a semiconductor as a component, characterized by including irradiating the semiconductor with light having a longer wavelength than the absorption edge wavelength of the semiconductor to change the threshold voltage of the semiconductor device or apparatus, and checking the threshold voltage of the semiconductor device or apparatus, after or during irradiation with the light, to determine whether the threshold voltage is in a predetermined range, during manufacturing the semiconductor device or apparatus.
1. A method for manufacturing a semiconductor device or apparatus having at least a display element and a TFT for controlling the display element, comprising:
forming the TFT having a protection layer, the protection layer being formed in an atmosphere containing approximately 10 to 80% of oxygen gas;
evaluating a threshold voltage of the formed TFT; and
forming the display element after the evaluating, wherein the evaluating comprises irradiating the TFT with light having a wavelength which is equal to or more than an absorption edge wavelength of a semiconductor of the TFT to change the threshold voltage of the TFT, and checking the changed threshold voltage of the TFT, after the irradiating with the light, to determine whether the changed threshold voltage is in a predetermined range.
2. The method according to claim 1 , wherein the TFT is shielded from light having a shorter wavelength than the absorption edge wavelength of the semiconductor.
3. The method according to claim 2 , wherein the shielding is performed by a filter located between a light source and the TFT.
4. The method according to claim 1 , wherein the semiconductor device or apparatus has at least a gate electrode, a source electrode, a drain electrode, a channel layer, a gate insulating layer, and a protection layer, and the semiconductor is the channel layer.
5. The method according to claim 4 , wherein the channel layer is an oxide comprising any of In, Ga, Zn, and Sn.
6. The method according to claim 1 , wherein the predetermined range is a range in which a minimum value of the predetermined range is defined by a minimum value of voltage applied when the semiconductor device or apparatus is operated, and a maximum value of the predetermined range is defined by a value of one tenth of a maximum value of the voltage applied when the semiconductor device or apparatus is operated.
7. An apparatus for manufacturing a semiconductor device or apparatus having at least a semiconductor as a component, comprising:
a check chamber for determining the semiconductor device or apparatus by the method according to claim 1 , in a manufacturing line for the semiconductor device or apparatus; and
the check chamber comprising at least a light source for irradiating the semiconductor with light having a longer wavelength than an absorption edge wavelength of the semiconductor, and a mechanism for checking a threshold voltage of the semiconductor device or apparatus after or during irradiation with the light.
8. The method according to claim 2 , wherein the semiconductor device or apparatus has at least a gate electrode, a source electrode, a drain electrode, a channel layer, a gate insulating layer, and a protection layer, and that the semiconductor is the channel layer.
9. The method according to claim 8 , wherein the shielding is performed by a filter located between a light source and the semiconductor.
10. The method according to claim 8 , wherein the channel layer is an oxide comprising any of In, Ga, Zn, and Sn.
11. The method according to claim 9 , wherein the channel layer is an oxide comprising any of In, Ga, Zn, and Sn.
12. The method according to claim 2 , wherein the predetermined range is a range in which a minimum value of the predetermined range is defined by a minimum value of voltage applied when the semiconductor device or apparatus is operated, and a maximum value of the predetermined range is defined by a value of one tenth of a maximum value of the voltage applied when the semiconductor device or apparatus is operated.
13. The method according to claim 12 , the shielding is performed by a filter located between a light source and the semiconductor.
14. The method according to claim 4 , wherein the semiconductor device or apparatus has at least a gate electrode, a source electrode, a drain electrode, a channel layer, a gate insulating layer, and a protection layer, and that the semiconductor is the channel layer.
15. The method according to claim 14 , wherein the channel layer is an oxide comprising any of In, Ga, Zn, and Sn.
16. The apparatus according to claim 7 , wherein the semiconductor is shielded from light having a shorter wavelength than the absorption edge wavelength of the semiconductor.
17. The apparatus according to claim 16 , wherein the shielding is performed by a filter located between a light source and the semiconductor.
18. The apparatus according to claim 7 , wherein the semiconductor device or apparatus has at least a gate electrode, a source electrode, a drain electrode, a channel layer, a gate insulating layer, and a protection layer, and that the semiconductor is the channel layer.
19. The apparatus according to claim 18 , wherein the channel layer is an oxide comprising any of In, Ga, Zn, and Sn.
20. The apparatus according to claim 19 , wherein the predetermined range is a range in which a minimum value of the predetermined range is defined by a minimum value of voltage applied when the semiconductor device or apparatus is operated, and a maximum value of the predetermined range is defined by a value of one tenth of a maximum value of the voltage applied when the semiconductor device or apparatus is operated.
21. An organic EL display comprising:
an organic EL element; and
a TFT, having a-IGZO film as a channel layer, for controlling the organic EL element, and having a protection layer, the protection layer being formed in an atmosphere containing approximately 10 to 80% of oxygen gas,
wherein a threshold voltage of the TFT is in a predetermined range after the TFT has been irradiated with light having a wavelength of 550 nm and an intensity of 0.2 mW/cm2 for 120 seconds.
22. The organic EL display according to claim 21 , wherein the predetermined range is a range in which a minimum value of the predetermined range is defined by a minimum value of voltage applied when the TFT is operated, and a maximum value of the predetermined range is defined by a value of one tenth of a maximum value of the voltage applied when the TFT is operated.