Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same
The present invention is a circuit and method for providing a reference voltage and/or one or more circuit/circuit-block enabling signals for an IC. As the voltage level on a power supply line ramps upward towards or above a nominal operating voltage, a first threshold voltage detector circuit segment may be activated and may begin to generate a bandgap reset signal once the voltage level of the power supply reaches a first threshold voltage level. The bandgap reset signal may trigger the power-up and operation of a bandgap reference circuit segment, and according to further embodiments of the present invention, a second threshold voltage detector circuit segment, which second threshold voltage detector circuit segment may be matched with the first voltage detector circuit, may generate a voltage reset signal indicating that the bandgap reference source is powering-up. Once the supply voltage reaches a third threshold reference voltage, the first detector may disable the bandgap reset.
1. A method of providing a reference voltage to an integrated circuit (“IC”) comprising:
i generating a bandgap reset signal and a voltage reset signal once a supply voltage of the IC reaches a first threshold voltage level;
ii disabling the bandgap reset signal once the supply voltage reaches a second threshold voltage level, which second threshold voltage level is sufficient for an associated bandgap reference circuit segment to produce a substantially stable reference voltage; and
iii modulating the voltage-reset signal once the supply voltage reaches a third threshold voltage so as to indicate that the bandgap reference circuit segment is operational.
2. The method according to claim 1 , wherein the third threshold voltage is greater than the second threshold voltage by some voltage margin value.
3. The method according to claim 2 , wherein the voltage margin value is selected such that once the supply voltage reaches the third threshold value the bandgap reference circuit segment has substantially established a steady state output.
4. The method according to claim 1 , wherein the third threshold voltage is substantially equal to the second threshold voltage.
5. The method according to claim 1 , wherein as part of generating a voltage reset signal an input node of a logic device is pulled to down to ground.
6. The method according to claim 5 , wherein as part of modulating the voltage reset signal, the input node of the logic device is pulled up to the supply voltage level.
7. The method according to claim 1 , wherein as part of generating a bandgap reset signal an input node of a logic device is pulled to down to ground.
8. The method according to claim 7 , wherein as part of disabling the bandgap reset signal the input node of the logic device is pulled up to the supply voltage.
9. A circuit for providing a reference voltage to an integrated circuit (“IC”) comprising:
i a first voltage threshold detection circuit segment adapted to generate a bandgap reset signal once a supply voltage of the IC reaches a first threshold voltage level and to disable the bandgap reset signal once the supply voltage reaches a second threshold voltage level, which second threshold voltage level is sufficient for an associated bandgap reference circuit segment to produce a substantially stable reference voltage, and
ii a second voltage threshold detection circuit segment adapted to generate a voltage reset signal once the supply voltage of the IC reaches the first threshold voltage level and to modulate the voltage reset signal once the supply voltage reaches a third threshold voltage level so to indicate that the bandgap reference is operational.
10. The circuit according to claim 9 , wherein said first voltage threshold detection circuit segment comprises two or transistor mirrors and a logic device.
11. The circuit according to claim 9 , wherein said second voltage threshold detection circuit segment comprises two or transistor mirrors and a logic device.
12. The circuit according to claim 9 , further comprising a bangap reference follower circuit segment.
13. The circuit according to claim 12 , wherein said bandgap reference follower includes a voltage offset element adapted to introduce a voltage margin between the first and second threshold voltages.
14. An integrate circuit comprising:
i non-volatile memory circuitry;
ii a first voltage threshold detection circuit segment adapted to generate a bandgap reset signal once a supply voltage of the IC reaches a first threshold voltage level and to disable the bandgap reset signal once the supply voltage reaches a second threshold voltage level, which second threshold voltage level is sufficient for an associated bandgap reference circuit segment to produce a substantially stable reference voltage,
iii a second voltage threshold detection circuit segment adapted to generate a voltage reset signal once the supply voltage of the IC reaches the first threshold voltage level and to modulate the voltage reset signal once the supply voltage reaches a third threshold voltage level so to indicate that the bandgap reference is operational; and
iv wherein said non-volatile memory circuitry utilizes an output signal from the bandgap reference circuit segment.
15. The circuit according to claim 14 , wherein said first voltage threshold detection circuit segment comprises two or transistor mirrors and a logic device.
16. The circuit according to claim 14 , wherein said second voltage threshold detection circuit segment comprises two or transistor mirrors and a logic device.
17. The circuit according to claim 14 , further comprising a bangap reference follower circuit segment.
18. The circuit according to claim 17 , wherein said bandgap reference follower includes a voltage offset element adapted to introduce a voltage margin between the first and second threshold voltages.