Minimization of mask undercut on deep silicon etch
A method for forming features in a silicon layer is provided. A mask is formed with a plurality of mask openings over the silicon layer. A polymer layer is deposited over the mask by flowing a hydrogen free deposition gas comprising C 4 F 8 , forming a plasma from the deposition gas, depositing a polymer from the plasma for at least 20 seconds, and stopping the depositing the polymer after the at least 20 seconds. The deposited polymer layer is opened by flowing an opening gas, forming a plasma from the opening gas which selectively removes the deposited polymer on bottoms of the plurality of mask openings with respect to deposited polymer on sides of the plurality of mask openings, and stopping the opening when at least some of the plurality of mask features are opened. The silicon layer is etched through the mask and deposited polymer layer.
1. A method for forming features in a silicon layer, comprising:
forming a mask with a plurality of mask openings over the silicon layer;
depositing a polymer layer over the mask, comprising:
flowing a hydrogen free deposition gas comprising C 4 F 8 , wherein the deposition gas consists essentially of C 4 F 8 ;
forming a plasma from the deposition gas;
depositing a polymer from the plasma for at least 20 seconds; and
stopping the depositing the polymer after the at least 20 seconds;
opening the deposited polymer layer, comprising:
flowing an opening gas;
forming a plasma from the opening gas which selectively removes the deposited polymer on bottoms of the plurality of mask openings with respect to deposited polymer on sides of the plurality of mask openings; and
stopping the opening when at least some of the plurality of mask features are opened; and
etching the silicon layer through the mask and deposited polymer layer, wherein the deposited polymer layer is completely etched away by etching the silicon layer.
2. The method, as recited in claim 1 , wherein the etching the silicon layer comprises:
flowing an etching gas; and
forming a plasma from the etching gas, which etches the silicon layer.
3. The method, as recited in claim 2 , wherein the opening gas is different from the etching gas.
4. The method, as recited in claim 3 , wherein the depositing the polymer, opening the deposited polymer, and etching the silicon layer are done in situ in a single plasma processing chamber.
5. The method, as recited in claim 4 , wherein the mask is a photoresist mask.
6. The method, as recited in claim 5 , wherein the deposited polymer layer is at least 200 nm thick on the sides of the plurality of mask openings.
7. The method, as recited in claim 6 , wherein the at least 200 nm thick deposited polymer on the sides of the plurality of mask openings eliminates undercutting.
8. The method, as recited in claim 1 , wherein the depositing the polymer, opening the deposited polymer, and etching the silicon layer are done in situ in a single plasma processing chamber.
9. The method, as recited in claim 1 , wherein the mask is a photoresist mask.
10. The method, as recited in claim 1 , wherein the deposited polymer layer is at least 200 nm thick on the sides of the plurality of mask openings.
11. The method, as recited in claim 10 , wherein the at least 200 nm thick deposited polymer on the sides of the plurality of mask openings eliminates undercutting.
12. A method for forming features in a silicon layer, comprising:
forming a mask with a plurality of mask openings over the silicon layer;
placing the silicon layer in a plasma process chamber;
depositing a polymer layer over the mask, comprising:
flowing a hydrogen free deposition gas consisting essentially of C 4 F 8 into the plasma process chamber;
forming a plasma from the deposition gas;
depositing a polymer from the plasma for at least 20 seconds to form a layer at least 200 nm thick; and
stopping the depositing the polymer after the at least 20 seconds;
opening the deposited polymer layer, comprising:
flowing an opening gas into the plasma process chamber;
forming a plasma from the opening gas which selectively removes the deposited polymer on bottoms of the plurality of mask openings with respect to deposited polymer on sides of the plurality of mask openings; and
stopping the opening when at least some of the plurality of mask features is opened;
etching the silicon layer through the mask and deposited polymer layer, comprising:
flowing an etching gas different from the opening gas; and
forming a plasma from the etching gas, which etches the silicon layer, wherein the deposited polymer layer prevents undercutting of the silicon layer under the photoresist mask, and the deposited polymer layer is completely etched away by etching the silicon layer; and
removing the silicon layer from the plasma process chamber.
13. The method, as recited in claim 12 , wherein the mask is a photoresist mask.
14. The method, as recited in claim 13 , further comprising removing the photoresist mask and deposited polymer layer in the plasma process chamber.
15. The method, as recited in claim 1 , wherein the deposited polymer layer on the sides of the plurality of mask openings eliminates undercutting.