IP Library › Granted Patent US 8,283,737
Granted Patent B2
US 8,283,737 · App. 12/558,171 · Granted Oct 9, 2012

MEMS package and method of manufacturing the MEMS package

Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 8,283,737
App. No.
12/558,171
Granted
Oct 9, 2012
Kind
B2
Abstract

An MEMS chip is mounted face-down on a semiconductor wafer such that a movable section is opposed to the semiconductor wafer. A resin layer is formed on the semiconductor wafer around the MEMS chip to reduce a step between the MEMS chip and the semiconductor wafer. After the semiconductor substrate is removed, the land electrode is formed on the resin layer.

Claims (27)

1. An MEMS package, comprising:

a semiconductor chip on which a semiconductor element and a first pad electrode are formed;

a movable section formed above an insulating layer;

a first resin layer formed on the insulating layer so as to seal the movable section;

first and second electrodes electrically connected to the movable section formed above the insulating layer;

a first protruding electrode formed on the first electrode, the first protruding electrode connecting the first pad electrode and the first electrode; and

a first land electrode connected to a rear surface of the second electrode via a first opening formed in the insulating layer.

2. The MEMS package according to claim 1 , further comprising:

a second pad electrode formed on the semiconductor chip; and

a second land electrode formed on the first resin layer and connected to the second pad electrode via a through hole pierced through the first resin layer.

3. The MEMS package according to claim 1 , further comprising a conductor bump embedded in the through hole.

4. The MEMS package according to claim 2 , further comprising:

a second protruding electrode formed on the first land electrode; and

a third protruding electrode formed on the second land electrode.

5. The MEMS package according to claim 2 , further comprising:

a first metal pillar formed on the first land electrode;

a second metal pillar formed on the second land electrode;

a second resin layer formed on the first land electrode and the second land electrode to cover peripheries of the first metal pillar and the second metal pillar such that upper edges of the first metal pillar and the second metal pillar are exposed;

a second protruding electrode formed on the first metal pillar; and

a third protruding electrode formed on the second metal pillar.

6. The MEMS package according to claim 1 ,

wherein the first resin layer is filled between the insulating layer and the semiconductor chip around the movable section.

7. The MEMS package according to claim 6 ,

wherein the first protruding electrode is buried in the first resin layer.

8. The MEMS package according to claim 7 , further comprising:

a cap layer formed on the insulating layer so as to separate the movable section from the first resin layer, the cap layer being provided on the inner surface of the first resin layer over the movable section.

9. The MEMS package according to claim 8 , wherein the insulating layer is wholly buried in the first resin layer with the movable section.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2009
From: SUGIZAKI, YOSHIAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 023454/0900 →
Priority Claims (1)
JP 2008-298247 · Nov 21, 2008 · national
Continuity (1)
Related Publication 20100127340A1 · May 27, 2010