Testing device for hazard alarm systems

1. A testing device for hazard alarm systems, comprising:

a hazard alarm control panel;

at least one device loop having a plurality of devices connected to the hazard alarm control panel; and

at least one communication circuit for communication with individual devices of the device loop and their control, the communication circuit comprising the following functional units:

a voltage supply of the device loop;

a control unit configured as a microprocessor or a microcontroller;

a voltage pulse generator;

a voltage measurement unit;

a current measurement unit;

an output unit; and

and at least one device simulation unit,

wherein said at least one device simulation unit is adapted for testing functionality of the current measurement unit and thus of the hazard alarm control panel, and wherein testing of the functionality of the current measurement unit as well as of the entire communication circuit takes place by means of software implementation of the control unit.

2. The testing device according to claim 1 , wherein the device simulation unit is integrated into the communication circuit of the hazard alarm control panel or is disposed externally of the communication circuit.

3. The testing device according to claim 2 , wherein the control unit is configured as a microprocessor or microcontroller and the functional units are switched one behind the other in the following sequence:

voltage supply,

voltage pulse generator,

voltage measurement unit,

current measurement unit,

subscriber simulation unit,

output unit,

connection of the device loop by means of a connection line;

wherein the functional units are connected with the control unit by means of signal technology, and wherein the voltage measurement unit and the current measurement unit are interchangeable in terms of their placement and circuit sequence.

4. The testing device according to claim 1 , wherein the device simulation unit is configured as a real device having its own device address and its own electronic control, and is disposed in the hazard alarm control panel as a completely independent module or an integral part of the communication circuit, and wherein the real device is specifically configured for the testing device and has a board and a microprocessor specifically adapted for the testing device.

5. The testing device according to claim 1 , wherein the device simulation unit is configured as a current sink whose control and signal evaluation takes place by a microprocessor or a microcontroller of the control unit, wherein input transistors of the current sink are connected with a port of the microcontroller or the microprocessor by way of a signal line using signal and circuit technology.

6. The testing device according to claim 5 , wherein the current sink is configured as a constant current sink, as a multi-stage current sink, or as a current sink that can be adjusted by means of a microcontroller or microprocessor, wherein the current sink is adapted and configured so that any desired communication protocol can be used for modulation of the signal pulses of the communication circuit and on the device loop.

7. The testing device according to claim 1 , wherein the hazard alarm system is configured as a fire alarm system, and the hazard alarm control panel is configured as a fire alarm and extinguishing control panel, wherein the connection line is configured as a ring bus system and the devices are selected from the group consisting of signal transmitters, detectors, fire detectors, multi-functional alarm systems, automatic optical or acoustical alarm signaling devices, controls and circuits for air conditioning systems, device shut-offs, sprinkler systems, and remote alarm signaling devices.

8. A method for testing a current measurement unit of a communication circuit of a hazard alarm system that has a hazard alarm control panel, at least one device loop having a plurality of devices connected to the hazard alarm control panel, and at least one communication circuit for communication with individual devices of the device loop and their control, the communication circuit comprising the following functional units:

a voltage supply of the device loop;

a control unit configured as a microprocessor or a microcontroller;

a voltage pulse generator;

a voltage measurement unit;

a current measurement unit;

an output unit; and

and at least one device simulation unit,

the method comprising the step of testing functionality of the current measurement unit using the device simulation unit, wherein said step of testing also tests the hazard alarm control panel, and wherein the step of testing takes place by software implementation of the control unit.

9. The method according to claim 8 , wherein the device simulation unit is configured as a current sink, multi-stage current sink, or adjustable current sink, and the step of testing the functionality of the current measurement unit comprises:

separating the device loop from the hazard alarm control panel with the output stage of the communication circuit;

controlling functions and switching schematics of the functional units with the control unit, the control unit being configured as a microprocessor system or has a microcontroller; and

activating the current sink by with a microcontroller port of the control unit.

10. The method according to claim 9 , wherein testing of the current measurement unit of the communication circuit is carried out by current measurements and software implementation of the control unit configured as a microprocessor or microcontroller and of the device simulation unit according to the following measurement sequence:

a. measuring a quiescent current of the communication circuit;

b. turning on the current sink;

c. measuring the current of a total current composed of current sink and communication circuit;

d. turning off the current sink;

e. testing a quiescent current for value differences as compared with the measurement in step a; and

f. determining a current increase from a difference between total current and quiescent current and checking the current increase that has been established for a permissible value.

11. The method according to claim 9 , wherein the test sequence of a device loop with devices provided by software implementation of the control unit of the communication circuit comprises the following method steps:

a. turning on loop voltage;

b. measuring loop rest current and comparing it with a reference value;

c. measuring loop voltage and comparing it with a reference value;

d. turning on a voltage pulse with a voltage pulse generator, measuring a pulse voltage level with the voltage measurement unit and comparing a measured pulse voltage level with the reference value and turning the voltage pulse off again;

e. turning on a constant current sink, measuring the current, determining a difference from the quiescent current and comparing the difference with the reference value and, turning the current sink off again; and

f. after the reference values have been reached, turning on the output stage to activate communication with the devices of the subscriber loop.

12. The method according to claim 11 , further comprising the step of checking additional different test currents of the current measurement unit with a current sink that is adjustable by way of a DA output of the microcontroller, to recognize errors in non-linearity in the current measurement.

13. The method according to claim 8 , wherein the device simulation unit is configured as a current sink and wherein testing of the current measurement unit of the communication circuit is adapted to take place with the device simulation unit at any desired time interval and during operation of the device loop.

14. The method according to claim 13 , wherein control of the current sink takes place by means of a microcontroller so that a pulse or a pulse sequence is generated as a response of a device.