Semiconductor-based detection and decontamination system
A system and method for identifying and making quantitative determinations of different deposits on a portion thereof, determining that the deposit is a contaminant and decontaminating at least the portion of the system is disclosed. The system comprises a controller, a sensing portion and a decontamination portion. The controller contains information about at least one noncontaminant. The sensing portion communicates with at least the controller and the portion of the system and is adapted to detect the deposit. The decontaminating portion communicates with at least the controller and is adapted to decontaminate the portion of the system.
1. A method for identifying and making quantitative determinations with respect to a deposit on at least a portion of a surface, the method comprising:
a. sensing the concentration of contaminants with a sensor affixed into said surface and identifying the contaminants present within said deposit on the portion of the surface by measuring the resistance and temperature of said portion of surface;
b. upon identification of a contaminant, initiating decontamination with a decontamination source affixed into said surface of at least the contaminated portion of the same surface in near realtime, wherein the sensor is affixed to the decontamination source;
c. determining said decontamination of at least the previously-contaminated portion of the same surface is complete using resistance data; and
d. terminating said decontamination; wherein steps a) through d) take place in a constant ambient atmosphere.
2. The method as recited in claim 1 wherein steps a) through d) are performed in a repetitive fashion as a means to continually self decontaminate the surface.
3. The method as recited in claim 2 wherein initiating said decontamination comprises illuminating a light having energy greater than the semiconductor's bandgap energy, thereby decontaminating at least the portion of the surface.
4. The method as recited in claim 1 comprising measuring resistance and temperature of the portion of the surface having the deposit using an embedded sensing portion.
5. The method as recited in claim 4 comprising comparing said measured resistance and temperature with stored data of resistance and temperature values of predetermined moieties.
6. The method as recited in claim 5 comprising determining the deposit is a contaminant based on said comparison prior to initiating decontamination.
7. The method as recited in claim 1 wherein the step of sensing the deposit initiates self decontamination of the surface.
8. A method for identifying and making quantitative determinations with respect to deposits on at least a portion of a surface, the method comprising:
a. determining concentration of contaminants and identifying the contaminants present within the portion of the surface that is contaminated using a sensing portion affixed into said surface;
b. upon identification of a contaminant, initiating decontamination of at least the contaminated portion of the surface using a decontamination portion affixed into said surface, wherein the sensing portion is affixed to the decontamination portion;
c. determining, using temperature and resistance data that the portion of the same surface is decontaminated using the sensing portion; and
d. terminating decontamination of the portion; wherein steps a) through d) take place in a constant ambient atmosphere.
9. The method of claim 8 wherein steps a) through b) are performed in a repetitive fashion.
10. The method as recited in claim 8 comprising measuring resistance and temperate of the portion of the surface having the deposit using an affixed sensing portion.
11. The method as recited in claim 10 comprising comparing said measured resistance and temperature with a stored resistance and temperature, thereby determining the deposit is a contaminant.
12. The method as recited in claim 8 wherein the step of determining the portion of the surface contaminated initiates self decontamination of the surface.