IP Library Granted Patent US 8,313,628
Granted Patent B2
US 8,313,628 · App. 12/374,048 · Granted Nov 20, 2012

Method and apparatus for evaluating dielectrophoretic intensity of microparticle

Assignee: Shimadzu Corporation
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Quick Facts
Patent No.
US 8,313,628
App. No.
12/374,048
Granted
Nov 20, 2012
Kind
B2
Abstract

A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.

Claims (17)

1. A dielectrophoretic intensity evaluation method, comprising the steps of:

forming a distribution of AC electric field regularly arranged in a cell while storing a sample having particles dispersed in a medium in the cell, thereby dielectrically migrating the particles in the medium to generate a diffraction grating by density distribution of the particles;

detecting diffracted light generated by irradiating the diffraction grating by density distribution with measuring light; and

evaluating characteristics for dielectrophoretic intensity of the particles and/or the medium from the detection result.

2. The dielectrophoretic intensity evaluation method according to claim 1 , wherein the operation of forming the distribution of AC electric field in the cell while storing the sample having the particles dispersed in the medium in the cell, thereby dielectrically migrating the particles in the medium to generate the diffraction grating by the particles, and detecting the diffracted light generated by irradiating the diffraction grating with measuring light is performed to the same sample more than once by varying frequency of the AC electric field, and frequency dependency of the dielectrophoretic intensity or dielectrophoretic sensitivity of the sample is evaluated based on a difference in detection result of each diffracted light.

3. The dielectrophoretic intensity evaluation method according to claim 1 , wherein the operation of forming the distribution of AC electric field in the cell while storing the sample having the particles dispersed in the medium in the cell, thereby dielectrically migrating the particles in the medium to generate the diffraction grating by the particles, and detecting the diffracted light generated by irradiating the diffraction grating with measuring light is performed to the same sample more than once by varying intensity of the AC electric field, and field intensity dependency of the dielectrophoretic intensity or dielectrophoretic sensitivity of the sample is evaluated based on a difference in detection result of each diffracted light.

4. A dielectrophoretic intensity evaluation method, comprising:

forming a distribution of AC electric field regularly arranged in a cell while storing a sample having particles dispersed in a medium in the cell, thereby dielectrically migrating the particles in the medium to generate a diffraction grating by density distribution of the particles; and

performing evaluation for dielectrophoretic intensities of the particles and/or the medium, using diffracted light intensity information obtained by detecting diffracted light generated by irradiating the diffraction grating by density distribution with measuring light, and further particle size information obtained from a temporal attenuation rate of the diffracted light after interrupting the AC electric field.

5. An apparatus for evaluating dielectrophoretic intensity, comprising:

a cell for holding a sample having particles dispersed in a medium;

an AC power source;

a pair of electrodes for forming an electric field distribution regularly arranged in the cell by application of voltage from the AC power source;

a light source for irradiating a diffraction grating resulting from a density distribution caused by dielectrophoresis of the particles by formation of the electric field with measuring light;

a light detector for detecting diffracted light of the measuring light by the diffraction grating; and

a recording means for recording output of the light detector, in which magnitude of diffracted light intensity based on a time when the application of voltage to the electrodes is not performed is used as a dielectrophoretic evaluation signal.

6. The apparatus for evaluating dielectrophoretic intensity according to claim 5 , wherein in addition to use of the magnitude of diffracted light intensity based on a time when the application of voltage to the electrodes is not performed as the dielectrophoretic evaluation signal, and a temporal attenuation rate of the diffracted light after interrupting the AC power source is measured to obtain particle size information of the particles.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2009
From: TSUNAZAWA, YOSHIO; WADA, YUKIHISA; MORIYA, NAOJI; TAKUBO, KENJI; TOTOKI, SHINICHIRO; SHIMAOKA, HARUO
To: SHIMADZU CORPORATION
Reel/Frame 022116/0200 →
Continuity (1)
Related Publication 20100012496A1 · Jan 21, 2010