Nonvolatile memory device and method of manufacturing the same
A nonvolatile memory device includes gate electrodes three dimensionally arranged on a semiconductor substrate, a semiconductor pattern extending from the semiconductor substrate and crossing sidewalls of the gate electrodes, a metal liner pattern formed between the semiconductor pattern and formed on a top surface and a bottom surface of each of the gate electrodes, and a charge storage layer formed between the semiconductor pattern and the metal liner pattern.
1. A nonvolatile memory device comprising:
a plurality of gate electrodes three dimensionally arranged on a semiconductor substrate;
a semiconductor pattern extending from the semiconductor substrate and crossing sidewalls of the gate electrodes;
a metal liner pattern formed between the semiconductor pattern and the gate electrode and formed on a top surface and a bottom surface of each of the gate electrodes; and
a charge storage layer formed between the semiconductor pattern and the metal liner pattern.
2. The nonvolatile memory device of claim 1 , wherein each of the gate electrodes comprises:
a polycrystalline semiconductor layer adjacent to the semiconductor pattern; and
a silicide layer formed on one sidewall of the polycrystalline semiconductor layer.
3. The nonvolatile memory device of claim 2 , wherein the metal liner pattern covers a top surface and a bottom surface of the polycrystalline semiconductor layer and a top surface and a bottom surface of the silicide layer.
4. The nonvolatile memory device of claim 2 , wherein the metal liner pattern electrically connects the polycrystalline semiconductor layer and the silicide layer.
5. The nonvolatile memory device of claim 1 , wherein the metal liner pattern comprises one of TiN, TaN and WN.
6. A nonvolatile memory device comprising:
a plurality of gate electrodes three dimensionally arranged on a semiconductor substrate;
a semiconductor pattern extending from the semiconductor substrate and crossing first sidewalls of the gate electrodes;
an insulating layer extending from the semiconductor substrate and crossing second sidewalls of the gate electrodes and spaced apart from the semiconductor pattern;
a metal liner pattern formed between the semiconductor pattern and the gate electrodes and formed on a top surface and a bottom surface of each of the gate electrodes; and
a charge storage layer formed between the semiconductor pattern and the metal liner pattern,
wherein the gate electrodes, the metal liner, and charge storage layer each contact the insulating layer.
7. The nonvolatile memory device of claim 6 , wherein each of the gate electrodes comprises:
a polycrystalline semiconductor layer adjacent to the semiconductor pattern; and
a silicide layer formed on one sidewall of the polycrystalline semiconductor layer.
8. The nonvolatile memory device of claim 7 , wherein the metal liner pattern covers a top surface and a bottom surface of the polycrystalline semiconductor layer and a top surface and a bottom surface of the silicide layer.
9. The nonvolatile memory device of claim 7 , wherein the metal liner pattern electrically connects the polycrystalline semiconductor layer and the silicide layer.
10. The nonvolatile memory device of claim 6 , wherein the metal liner pattern comprises one of TiN, TaN and WN.