IP Library › Granted Patent US 8,337,619
Granted Patent B2
US 8,337,619 · App. 12/234,038 · Granted Dec 25, 2012

Polymeric coating of substrate processing system components for contamination control

Assignee: Applied Materials, Inc.
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Quick Facts
Patent No.
US 8,337,619
App. No.
12/234,038
Granted
Dec 25, 2012
Kind
B2
Abstract

A method of treating a metal surface of a portion of a substrate processing system to lower a defect concentration near a processed surface of a substrate includes forming a protective coating on the metal surface, wherein the protective coating includes nickel (Ni) and a fluoropolymer. Forming the protective coating on the metal surface can further include forming a nickel layer on the metal surface, impregnating the nickel layer with a fluoropolymer, and removing fluoropolymer from the surface leaving a predominantly nickel surface so the fluoropolymer is predominantly subsurface. A substrate processing system includes a process chamber into which a reactant gas is introduced, a pumping system for removing material from the process chamber, a first component with a protective coating, wherein the protective coating forms a surface of the component which is exposed to an interior of the substrate processing chamber or an interior of the pumping system. The protective coating includes nickel (Ni) and a flouropolymer.

Claims (26)

1. A component for use in an apparatus comprising:

a body having a first plurality of dimensions that meet a specification within design tolerances such that the body fits within the apparatus, wherein the component is an exhaust assembly and the apparatus is a semiconductor processing system;

a protective coating comprising an exposed surface and a layer of thickness deposited over a surface of the body, wherein the protective coating comprises a nickel layer and impregnated with a fluoropolymer, and a fluoropolymer, and a concentration of the nickel is higher at the exposed surface than within the layer of thickness;

wherein the body and the protective coating have a second plurality of dimensions that meet the specification within the design tolerances such that the body with the protective coating fits within the apparatus.

2. The component of claim 1 wherein the apparatus is a substrate processing system.

3. The component of claim 1 wherein the surface of the body is metal and the protective coating lowers a defect concentration near a processed surface of a substrate.

4. The component of claim 1 wherein the protective coating is less than 100 μm thick.

5. The component of claim 1 wherein the protective coating is between about 3 μm and 40 μm thick.

6. The component of claim 1 wherein the protective coating is between about 4 μm and 30 μm thick.

7. The component of claim 1 wherein the protective coating is between about 5 μm and 20 μm thick.

8. A substrate processing system comprising:

a process chamber into which a reactant gas is introduced;

a pumping system for removing material from the process chamber;

a first component with a protective coating; wherein the protective coating comprises an exposed surface and a layer of thickness to form a surface on the component which is exposed to an interior of the substrate processing chamber or an interior of the pumping system, wherein the component is an exhaust assembly and the substrate processing system is semiconductor processing system;

wherein the protective coating comprises a nickel (Ni) layer impregnated with fluoropolymer, and a concentration of the nickel is higher at the exposed surface than within the layer of thickness.

9. The substrate processing system of claim 8 wherein:

the first component has a first plurality of dimensions that meet a specification within design tolerances such that the first component fits within a second component of the semiconductor processing system; and

the first component with the protective coating has a second plurality of dimensions that meet the specification within the design tolerances such that the first component with the protective coating fits within the second component of the semiconductor processing system.

10. The substrate processing system of claim 8 wherein the protective coating is less than 100 μm thick.

11. The substrate processing system of claim 8 wherein the protective coating is between about 3 μm and 40 μm thick.

12. The substrate processing system of claim 8 wherein the first component comprises a component selected from the group consisting of an exhaust cap, an exhaust pipe and a valve assembly.

13. The substrate processing system of claim 12 wherein the exhaust pipe comprises a pressure measurement exhaust pipe.

14. The substrate processing system of claim 12 wherein the valve assembly comprises a valve assembly selected from the group consisting of an isolation valve assembly and a pressure control valve assembly.

15. The substrate processing system of claim 8 further comprising:

a second component, wherein the first component and the second component have at least one point of contact and experience a mutual dynamic friction, wherein the first component has the protective coating near the at least one point of contact.

16. The substrate processing system of claim 15 , wherein the second component also has a protective coating near the at least one point of contact comprising nickel (Ni) and a fluoropolymer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2008
From: CARLSON, DAVID K.; ANDERSON, ROGER N.
To: APPLIED MATERIALS, INC.
Reel/Frame 021557/0953 →
Continuity (1)
Related Publication 20100071622A1 · Mar 25, 2010