Near-field scanning optical microscopy with nanoscale resolution from microscale probes
To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely. Numerical modeling shows that, even with substantial measurement noise, the suggested probes can resolve objects that are significantly smaller than the probe size and, in certain cases, can perform better than miniature nanoprobes.
1. A probe for near-field scanning optical microscopy which has an active area for near-field interaction with a sample illuminated by light of a wavelength λ, the active area extending over a lateral dimension in excess of a wavelength and comprising a plurality of optical discontinuities which generate sharp index gradients and electric field gradients over regions that are smaller than a wavelength and are distributed within the active area over a lateral dimension in excess of a wavelength.
2. The probe of claim 1 wherein the discontinuities are induced by elements selected from the group comprising: edges, corners, absorbing particles, scattering particles, emitting particles and bubbles.
3. The probe of claim 1 wherein the discontinuities are distributed in a random pattern.
4. The probe of claim 1 wherein the discontinuities are distributed in a regular pattern.
5. The probe of claim 1 wherein the active area of the probe comprises a region having a diameter in the range from 0.2 micron to 30 microns.
6. The probe of claim 1 wherein the active area of the probe comprises a region of optical fiber having a diameter in the range from 0.2 micron to 3 microns.
7. The probe of claim 1 wherein the active region comprises a flat or rounded tip of an optical fiber.
8. The probe of claim 1 wherein the discontinuities comprise nanoparticles distributed with a density in the range of 1 per square nanometer to 1 per 10,000 square nanometers.
9. The probe of claim 8 wherein the nanoparticles have effective diameters in the range of 1 nanometer to 100 nanometers.
10. The probe of claim 1 wherein the discontinuities comprise air core microstructures within an optical fiber.
11. The probe of claim 10 wherein the air core microstructures have effective diameters in the range of 10 nanometers to 3 microns.
12. The probe of claim 1 wherein the discontinuities comprise sharp edges/corners.
13. The probe of claim 12 wherein the edges/corners have edge radii of less than 3 nanometers.
14. The probe of claim 1 further comprising a waveguide for guiding light to or from the sample.
15. The probe of claim 1 wherein the active area comprises the tip of a fiber of uniform cross section.
16. The probe of claim 1 wherein the active area comprises the top of a tapered fiber.
17. The probe of claim 1 wherein the active area has a cross-section with an effective diameter on the order of the wavelength.
18. The probe of claim 1 fabricated of an unclad optical fiber.
19. The probe of claim 1 fabricated of a clad optical fiber.
20. The probe of claim 1 fabricated of a microstructured optical fiber.
21. The probe of claim 1 wherein the active region comprises metal or dielectric nanoparticles distributed across the end-face of an optical fiber.
22. The probe of claim 21 wherein the metal or dielectric nanoparticles are wholly or partially embedded in the optical fiber.
23. The probe of claim 1 wherein the active region comprises metal film islands distributed across the end-face of an optical fiber.
24. A near-field scanning optical microscope comprising an illumination light source, a sample stage, a near-field optical probe, a positioning mechanism for positioning the probe a fraction of an illumination wavelength from an object on the sample stage, a scanner for scanning the probe over a two-dimensional area of the sample, a detector for detecting light from the illuminated sample, wherein the probe comprises the probe of claim 1 .
25. A near-field scanning optical microscope comprising an illumination light source, a sample stage, a near-field optical probe, a positioning mechanism for positioning the probe a fraction of an illumination wavelength from an object on the sample stage, a scanner for scanning the probe over a two-dimensional area of the sample, a detector for detecting light from the illuminated sample, wherein the probe comprises the probe of claim 2 .
26. A near-field scanning optical microscope comprising an illumination light source, a sample stage, a near-field optical probe, a positioning mechanism for positioning the probe a fraction of an illumination wavelength from an object on the sample stage, a scanner for scanning the probe over a two-dimensional area of the sample, a detector for detecting light from the illuminated sample, wherein the probe comprises the probe of claim 5 .
27. A near-field scanning optical microscope comprising an illumination light source, a sample stage, a near-field optical probe, a positioning mechanism for positioning the probe a fraction of an illumination wavelength from an object on the sample stage, a scanner for scanning the probe over a two-dimensional area of the sample, a detector for detecting light from the illuminated sample, wherein the probe comprises the probe of claim 6 .