IP Library Granted Patent US 8,378,458
Granted Patent B2
US 8,378,458 · App. 12/728,423 · Granted Feb 19, 2013

Semiconductor chip with a rounded corner

Inventors: Seah S. Too (San Jose, CA); Edward Alcid (Sunnyvale, CA)
Assignee: Advanced Micro Devices, Inc.
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Quick Facts
Patent No.
US 8,378,458
App. No.
12/728,423
Granted
Feb 19, 2013
Kind
B2
Abstract

Various semiconductor chips and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes providing a semiconductor wafer that has plural semiconductor chips. Each of the plural semiconductor chips includes a first principal side and a second and opposite principal side. Material is removed from the semiconductor wafer to define at least one rounded corner of the first principal side of at least one of the plural semiconductor chips.

Claims (20)

1. A method of manufacturing, comprising:

forming a semiconductor chip with a first principal side, a second and opposite principal side, and at least two edge surfaces that intersect, the semiconductor chip being part of a semiconductor wafer; and

forming at least one rounded corner at the intersection of the at least two edge surfaces by laser ablation and thereafter singulating the semiconductor chip from the semiconductor wafer by mechanical sawing, the at least one rounded corner extending from the first principal side toward but not to the second principal side to leave a ledge.

2. The method of claim 1 , wherein the singulating the semiconductor chip forms a substantially orthogonal corner of the second principal side opposite to the at least one rounded corner.

3. The method of claim 1 , comprising coupling a circuit board to the semiconductor chip.

4. A method of manufacturing, comprising:

providing a semiconductor wafer including plural semiconductor chips, each of the plural semiconductor chips including a first principal side and a second and opposite principal side and at least two edge surfaces that intersect;

removing material from the semiconductor wafer by laser ablation to define at least one rounded corner at the intersections of the at least two edge surfaces of at least one of the plural semiconductor chips, the at least one rounded corner extending from the first principal side toward but not to the second principal side to leave a ledge; and

singulating the at least one semiconductor chip from the semiconductor wafer by mechanical sawing.

5. The method of claim 4 , comprising singulating the at least one semiconductor chip to form a substantially orthogonal corner of the second principal side opposite to the at least one rounded corner.

6. The method of claim 4 , wherein at least one of the semiconductor chips includes four intersecting edge surfaces, the method comprising removing material from the semiconductor wafer to define four rounded corners of the intersections of the edge surfaces.

7. The method of claim 6 , wherein the four rounded corners are set back to define a ledge extending about a periphery of the at least one semiconductor chip.

8. The method of claim 4 , comprising coupling a circuit board to the semiconductor chip.

9. An apparatus, comprising:

a semiconductor chip including a first principal side, a second principal side and at least two edge surfaces that intersect;

at least one rounded corner at the intersection of the at least two edge surfaces, the at least one rounded corner extending from the first principal side toward but not to the second principal side to leave a ledge; and

a substantially orthogonal corner of the second principal side opposite to the at least one rounded corner.

10. The apparatus of claim 9 , wherein the semiconductor chip includes four intersecting edge surfaces and a rounded corner at each intersection of the four edges surfaces.

11. The apparatus of claim 10 , wherein the four rounded corners are set back to define a ledge extending about a periphery of the semiconductor chip.

12. The apparatus of claim 9 , comprising a circuit board coupled to the semiconductor chip.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2010
From: TOO, SEAH S.; ALCID, EDWARD
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 024113/0793 →
Continuity (1)
Related Publication 20110227201A1 · Sep 22, 2011