3T DRAM cell with added capacitance on storage node

1. An integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

a first transistor having a first control element connected as a storage node;

a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line;

a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line; and

a supplemental capacitance connected to between the storage node and a current sinking voltage;

wherein the read bit line and the write bit line are a common read/write bit line.

2. An integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

a first transistor having a first control element connected as a storage node;

a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line;

a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line; and

a supplemental capacitance connected to between the storage node and a current sinking voltage;

wherein at least a portion of the supplemental capacitance is supplied by an intrinsic metallization level inherent in the 3T DRAM cell.

3. An integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

a first transistor having a first control element connected as a storage node;

a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line;

a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line; and

a supplemental capacitance connected to between the storage node and a current sinking voltage;

wherein at least a portion of the supplemental capacitance is supplied by an extrinsic metallization level added to the 3T DRAM cell.

4. The integrated circuit as recited in claim 3 wherein the extrinsic metallization level uses substantially a full footprint of the 3T DRAM cell to provide at least a portion of the supplemental capacitance.

5. An integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

a first transistor having a first control element connected as a storage node;

a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line;

a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line; and

a supplemental capacitance connected between the storage node and a current sinking voltage;

wherein the supplemental capacitance is provided by one selected from the group consisting of:

an overlap capacitance between two metallization levels; and

an edge capacitance in at least one metallization level.

6. An integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

a first transistor having a first control element connected as a storage node;

a second transistor connected between the first transistor and a read bit line having a second control element connected to a read word line;

a third transistor connected between the storage node and a write bit line having a third control element connected to a write word line; and

a supplemental capacitance connected to between the storage node and a current sinking voltage;

wherein the supplemental capacitance is provided by a metal-insulator-metal capacitor.

7. The integrated circuit as recited in claim 6 wherein the metal-insulator-metal capacitor employs a high-dielectric coefficient insulator.

8. A method of operating an integrated circuit including a three transistor dynamic random access memory (3T DRAM) cell, comprising:

writing a memory state on a storage node of the 3T DRAM cell employing a write bit line controlled by a write word line;

reading the memory state on the storage node employing a read bit line controlled by a read word line; and

extending a refresh interval of the memory state with a supplemental capacitance added to the storage node; the supplemental capacitance being connected between the storage node and a current sinking voltage.

9. The method as recited in claim 8 wherein the read bit line and the write bit line are a common read/write bit line.

10. The method as recited in claim 8 wherein the supplemental capacitance is formed between the storage node and a current sinking voltage.

11. The method as recited in claim 8 wherein at least a portion of the supplemental capacitance is supplied by an intrinsic metallization level inherent in the 3T DRAM cell.

12. The method as recited in claim 8 wherein at least a portion of the supplemental capacitance is supplied by an extrinsic metallization level added to the 3T DRAM cell.

13. The method as recited in claim 12 wherein the extrinsic metallization level uses substantially a full footprint of the 3T DRAM cell to provide at least a portion of the supplemental capacitance.

14. The method as recited in claim 8 wherein the supplemental capacitance is provided by one selected from the group consisting of:

an overlap capacitance between two metallization levels; and

an edge capacitance in at least one metallization level.

15. The method as recited in claim 8 wherein an electrical connection between metallization levels is used to provide at least a portion of the supplemental capacitance.

16. The method as recited in claim 8 wherein the supplemental capacitance is provided by a metal-insulator-metal capacitor.

17. The method as recited in claim 16 wherein the metal-insulator-metal capacitor employs a high-dielectric coefficient insulator.