IP Library Granted Patent US 8,389,393
Granted Patent B2
US 8,389,393 · App. 12/511,634 · Granted Mar 5, 2013

Nanoparticle synthesis

Inventors: Silvija Grade{hacek over (c)}ak (Cambridge, MA); Chun-Hao Tseng (Taichung, TW); Sung Keun Lim (Revere, MA)
Assignee: Massachusetts Institute of Technology
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,389,393
App. No.
12/511,634
Granted
Mar 5, 2013
Kind
B2
Abstract

A noble metal nanoparticle can be grown on a semiconductor substrate by contacting a predetermined region of the substrate with a solution including noble metal ions. The predetermined region of the semiconductor substrate can be exposed by applying a polymeric layer over the substrate selectively removing a portion of the polymeric layer. The nanoparticles can be prepared in a predetermined pattern. The nanoparticle can be formed with a barrier separating it from another nanoparticle on the substrate; for example, nanoparticle can be located in a pit etched in the substrate. The size and location of the nanoparticle can be stable at elevated temperatures.

Claims (19)

1. A method of growing a nanoparticle on a substrate comprising contacting a predetermined region of a semiconductor substrate with a solution including noble metal ions,

wherein contacting a predetermined region of a semiconductor substrate with a solution including noble metal ions comprises forming a nanoparticle on the semiconductor substrate, the nanoparticle being laterally separated from other nanoparticles in predetermined positions on the semiconductor substrate by a barrier; and the barrier is a portion of the semiconductor substrate that is raised relative to the region of the semiconductor substrate upon which the nanoparticle is positioned

wherein the nanoparticle is positioned in a pit in a surface of the semiconductor substrate, the pits having sidewalls that form in the surface of the semiconductor substrate.

2. The method of claim 1 , further comprising exposing the predetermined region of the semiconductor substrate, wherein exposing includes applying a polymeric layer over the semiconductor substrate; and

selectively removing a portion of the polymeric layer.

3. The method of claim 1 , wherein the substrate includes GaAs.

4. The method of claim 2 , wherein the polymeric layer includes PMMA.

5. The method of claim 1 , wherein the noble metal is Au.

6. The method of claim 1 , wherein the nanoparticle is a nanocrystal.

7. The method of claim 1 , wherein contacting a predetermined region of a semiconductor substrate with a solution including noble metal ions includes selecting conditions for a galvanic reaction between the semiconductor substrate and the noble metal ions.

8. The method of claim 1 , wherein exposing a portion of the substrate through the polymeric layer comprises e-beam lithography.

9. The method of claim 1 , wherein the nanoparticle is a member of a nanoparticle population having an average diameter of 25 nm or smaller, or of 10 nm or smaller.

10. The method of claim 1 , wherein the nanoparticle is positioned in a pit on the substrate.

11. The method of claim 2 , wherein selectively removing a portion of the polymeric layer comprises forming a pattern.

12. The method of claim 11 , wherein the pattern is an array of openings.

13. The method of claim 12 , wherein the openings in the array have a dimension of 1 nm or less, 5 nm or less, 10 nm or less, 25 nm or less, or a larger dimension.

14. The method of claim 1 , wherein the average diameter of the nanoparticle is 25 nm or smaller.

15. The method of claim 1 , wherein the average diameter of the nanoparticle is 10 nm or smaller.

16. The method of claim 10 , further comprising etching a portion of the semiconductor substrate to form the pit.

Assignments (3)
CONFIRMATORY LICENSE Recorded May 17, 2012
From: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 028231/0866 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2011
From: GRADECAK, SILVIJA; TSENG, CHUN-HAO; LIM, SUNG KEUN
To: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Reel/Frame 026412/0514 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2011
From: GRADECAK, SILVIJA; TSENG, CHUN-HAO; LIM, SUNG KEUN
To: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
Reel/Frame 025994/0795 →
Continuity (1)
Related Publication 20110024723A1 · Feb 3, 2011