IP Library Granted Patent US 8,402,819
Granted Patent B2
US 8,402,819 · App. 12/315,859 · Granted Mar 26, 2013

High frequency deflection measurement of IR absorption

Inventors: A. Dazzi Dazzi (Les Ulis, FR); Clotilde Policar (Paris, FR); Kevin Kjoller (Santa Barbara, CA); Michael Reading (Norwich, GB); Konstantin Vodopyanov (San Jose, CA); Craig Prater (Santa Barbara, CA)
Assignee: Anasys Instruments, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,402,819
App. No.
12/315,859
Granted
Mar 26, 2013
Kind
B2
Abstract

An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Claims (21)

1. An instrument for measuring infrared absorption of a sample on a sub-wavelength scale comprising:

a benchtop source of infrared radiation, adapted to be modulated at a pulse repetition rate in excess of 100 Hz, optically coupled to a region of the sample;

a probe including a tip with a sub-micron end radius that interacts with the sample and to respond to infrared radiation absorbed by the sample; and,

a detector for measuring the probe response at one or more wavelengths of the infrared radiation,

wherein the instrument creates a spatially resolved map indicative of absorbed infrared radiation over the region of the sample with at least 100×100 pixels in less than thirty minutes.

2. The instrument of claim 1 wherein the spatially resolved map has a spatial resolution of less than 1 um.

3. The instrument of claim 1 wherein each pixel in the spatially resolved map uses the probe response from at least ten pulses from the benchtop source of infrared radiation.

4. A method of measuring a spectrum of infrared absorption of a sample on a sub-wavelength scale comprising the steps of:

optically coupling a benchtop source of coherent infrared radiation to a region of a sample;

modulating the intensity of the radiation incident on the sample at a frequency in excess of 100 Hz;

interacting a cantilever probe with a tip with a sub-micron end radius with the sample such that the probe responds to infrared radiation absorbed by the sample;

detecting a probe response to modulated infrared radiation absorbed by the sample at one or more wavelengths;

generating relative lateral motion between the probe and the sample; and,

creating a spatial map from the detected probe response indicative of infrared absorption of a region of the sample, wherein the map has a pixel density of at least 100×100 pixels and the map is completed in a time of less than thirty minutes.

5. The method of claim 4 wherein the radiation from the benchtop source is selected to have at least one wavelength corresponding to an absorption band of the sample.

6. The method of claim 4 further comprising the steps of attaching an infrared tag to a plurality of molecules and introducing the tagged molecules into the sample, wherein the spatially resolved map of infrared absorption is indicative of the spatial uptake of the tagged molecules by the sample.

7. The method of claim 6 wherein the sample is a biological cell.

8. The method of claim 4 wherein the spatial map is used to create a spatially resolved map of chemical composition with sub-micron resolution.

9. The method of claim 4 further comprising sweeping the wavelength of the infrared radiation supplied by the benchtop source.

10. The method of claim 9 further completing the sweeping step in less than 100 seconds.

11. The method of claim 9 further comprising sweeping the wavelength of the infrared radiation supplied by the benchtop source over a range of at least 100 cm −1 .

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 21, 2018
From: ANASYS INSTRUMENTS CORP.
To: BRUKER NANO, INC.
Reel/Frame 046942/0185 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 7, 2018
From: KJOLLER, KEVIN; PRATER, CRAIG; READING, MICHAEL
To: ANASYS INSTRUMENTS CORP
Reel/Frame 044853/0168 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2010
From: VODOPYANOV, KONSTANTIN
To: ANASYS INSTRUMENTS CORP.
Reel/Frame 024680/0960 →
Continuity (2)
Continuation In Part 11803421 · May 15, 2007
Related Publication 20090249521A1 · Oct 1, 2009