IP Library › Granted Patent US 8,405,077
Granted Patent B2
US 8,405,077 · App. 13/070,890 · Granted Mar 26, 2013

Magnetic memory devices

Inventor: Ki Joon Kim (Hwaseong-si, KR)
Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 8,405,077
App. No.
13/070,890
Granted
Mar 26, 2013
Kind
B2
Abstract

Provided is a magnetic memory device and a method of forming the same. A first magnetic conductive layer is disposed on a substrate. A first tunnel barrier layer including a first metallic element and a first non-metallic element is disposed on the first magnetic conductive layer. A second magnetic conductive layer is disposed on the first tunnel barrier layer. A content of an isotope of the first metallic element having a non-zero nuclear spin quantum number is lower than a natural state.

Claims (30)

1. A magnetic memory device comprising:

a first magnetic conductive layer on a substrate;

a first tunnel barrier layer on the first magnetic conductive layer, and comprising a first metallic element and a first non-metallic element; and

a second magnetic conductive layer on the first tunnel barrier layer,

wherein a content of an isotope of the first metallic element having a non-zero nuclear spin quantum number is lower than a natural state.

2. The magnetic memory device of claim 1 , wherein the first metallic element comprises magnesium (Mg), titanium (Ti), aluminum (Al), and/or vanadium (V).

3. The magnetic memory device of claim 2 , wherein:

the first metallic element comprises magnesium (Mg), and

a content of isotope ( 25 Mg) of the magnesium is lower than about 10 at. %.

4. The magnetic memory device of claim 1 , wherein a content of an isotope of the first non-metallic element having a non-zero nuclear spin quantum number is lower than the natural state.

5. The magnetic memory device of claim 4 , wherein the first non-metallic element comprises oxygen (O), nitrogen (N), and/or carbon (C).

6. The magnetic memory device of claim 5 , wherein:

the first non-metallic element comprises oxygen, and

a content of isotope ( 17 O) of the oxygen is lower than about 0.04 at. %.

7. The magnetic memory device of claim 1 , wherein a content of an isotope comprised in the first magnetic conductive layer having a non-zero nuclear spin quantum number is lower than the natural state.

8. The magnetic memory device of claim 1 , wherein a content of an isotope comprised in the second magnetic conductive layer having a non-zero nuclear spin quantum number is lower than the natural state.

9. The magnetic memory device of claim 1 , wherein a magnetization direction of the first magnetic conductive layer and a magnetization direction of the second magnetic conductive layer are substantially parallel to a planar surface of the substrate during operation of the magnetic memory device.

10. The magnetic memory device of claim 9 , wherein the first magnetic conductive layer comprises a pinning layer and a pinned layer.

11. The magnetic memory device of claim 1 , further comprising a second tunnel barrier layer and a third magnetic conductive layer, which are sequentially stacked on the second magnetic conductive layer.

12. The magnetic memory device of claim 11 , wherein the second tunnel barrier layer comprises a second metallic element and a second non-metallic element,

wherein a content of an isotope of the second metallic element having a non-zero nuclear spin quantum number is lower than the natural state.

13. The magnetic memory device of claim 12 , wherein:

the second metallic element comprises magnesium (Mg), and

a content of isotope ( 25 Mg) of the magnesium is lower than about 10 at. %.

14. The magnetic memory device of claim 1 , wherein a magnetization direction of the first magnetic conductive layer and a magnetization direction of the second magnetic conductive layer are substantially vertical to a planar surface of the substrate during operation of the magnetic memory device.

15. The magnetic memory device of claim 14 , further comprising:

a first junction magnetic layer between the first magnetic conductive layer and the first tunnel barrier layer; and

a second junction magnetic layer between the second magnetic conductive layer and the first tunnel barrier layer.

16. The magnetic memory device of claim 1 , wherein the first tunnel barrier layer is crystalline.

17. The magnetic memory device of claim 1 , wherein a content of an isotope of the first metallic element having even numbers of both protons and neutrons is higher than the natural state.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 24, 2011
From: KIM, KI JOON
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 026015/0692 →
Priority Claims (1)
KR 10-2010-0028011 · Mar 29, 2010 · national
Continuity (1)
Related Publication 20110233698A1 · Sep 29, 2011