IP Library Granted Patent US 8,446,074
Granted Patent B2
US 8,446,074 · App. 13/636,883 · Granted May 21, 2013

Piezoelectric thin-film element and piezoelectric thin-film device

Inventors: Kenji Shibata (Tokyo, JP); Kazufumi Suenaga (Tokyo, JP); Kazutoshi Watanabe (Tokyo, JP); Akira Nomoto (Tokyo, JP); Fumimasa Horikiri (Tokyo, JP)
Assignee: Hitachi Cable Ltd.
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Quick Facts
Patent No.
US 8,446,074
App. No.
13/636,883
Granted
May 21, 2013
Kind
B2
Abstract

There is provided a piezoelectric thin film element, comprising: a substrate 1 ; and a piezoelectric thin film 3 having an alkali niobium oxide-based perovskite structure represented by a composition formula (K 1-x Na x ) y NbO 3 provided on the substrate 1 , wherein a carbon concentration of the piezoelectric thin film 3 is 2×10 19 /cm 3 or less, or a hydrogen concentration of the piezoelectric thin film 3 is 4×10 19 /cm 3 or less.

Claims (19)

1. A piezoelectric thin film element, comprising:

a substrate; and

a piezoelectric thin film having an alkali niobium oxide-based perovskite structure represented by a composition formula (K 1-x Na x ) y NbO 3 (satisfying 0.4≦x≦0.7 and 0.75≦y≦0.90) provided on the substrate,

wherein a carbon concentration of the piezoelectric thin film is 2×10 19 /cm 3 or less, and a hydrogen concentration is 4×10 19 /cm 3 or less.

2. The piezoelectric thin film element according to claim 1 , wherein the piezoelectric thin film has a pseudo-cubic structure and is preferentially oriented in (001) plane direction.

3. The piezoelectric thin film according to claim 2 , wherein a base layer is provided between the substrate and the piezoelectric thin film.

4. The piezoelectric thin film according to claim 3 , wherein the base layer is a Pt layer, and the Pt layer is preferentially oriented in (111) plane direction.

5. The piezoelectric thin film according to claim 2 , wherein the substrate is a Si substrate, a surface oxide film-attached Si substrate, or a SOI substrate.

6. A piezoelectric thin film device, comprising:

the piezoelectric thin film element of claim 2 ;

an upper electrode and a lower electrode provide in an upper part and in a lower part, with the piezoelectric thin film of the piezoelectric thin film element interposed between them; and

a function generator or a voltage detector connected between the upper electrode and the lower electrode.

7. The piezoelectric thin film according to claim 1 , wherein a base layer is provided between the substrate and the piezoelectric thin film.

8. The piezoelectric thin film according to claim 7 , wherein the base layer is a Pt layer, and the Pt layer is preferentially oriented in (111) plane direction.

9. The piezoelectric thin film according to claim 1 , wherein the substrate is a Si substrate, a surface oxide film-attached Si substrate, or a SOI substrate.

10. A piezoelectric thin film device, comprising:

the piezoelectric thin film element of claim 1 ;

an upper electrode and a lower electrode provide in an upper part and in a lower part, with the piezoelectric thin film of the piezoelectric thin film element interposed between them; and

a function generator or a voltage detector connected between the upper electrode and the lower electrode.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2016
From: SCIOCS COMPANY LIMITED
To: SUMITOMO CHEMICAL COMPANY, LIMITED
Reel/Frame 037524/0275 →
CORPORATE SPLIT AND CONFIRMATORY ASSIGNMENT EFFECTIVE APRIL 1, 2015 Recorded Jul 20, 2015
From: HITACHI METALS, LTD.
To: SCIOCS COMPANY LIMITED
Reel/Frame 036134/0081 →
MERGER Recorded Dec 22, 2014
From: HITACHI CABLE, LTD.
To: HITACHI METALS, LTD.
Reel/Frame 034565/0727 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2012
From: SHIBATA, KENJI; SUENAGA, KAZUFUMI; WATANABE, KAZUTOSHI; NOMOTO, AKIRA; HORIKIRI, FUMIMASA
To: HITACHI CABLE, LTD.
Reel/Frame 029026/0361 →
Priority Claims (1)
JP 2010-070361 · Mar 25, 2010 · national
Continuity (1)
Related Publication 20130009519A1 · Jan 10, 2013