Trimming of operative parameters in electronic devices based on corrections mappings

1. An electronic device having a plurality of operative parameters, wherein the electronic device includes:

means for applying a plurality of trimming actions to each operative parameter for causing a corresponding correction of the operative parameter,

for at least one reference parameter, means for measuring the at least one reference parameter responsive to the application of at least part of the trimming actions to select one of the trimming actions providing a target value of the at least one reference parameter, and

means for forcing the application of the selected trimming action for the at least one reference parameter,

further comprising for each non-reference parameter different from the at least one reference parameter, means for selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter according to a predetermined mapping of each group of multiple corrections of the at least one reference parameter on a single correction of the non-reference parameter, and

means for forcing the application of the selected trimming action for each non-reference parameter.

2. The electronic device according to claim 1 , further including: means for storing a code in the electronic device for each reference parameter being indicative of the selected trimming action for the reference parameter, means for converting the code for the at least one reference parameter into a code for each non-reference parameter being indicative of the selected trimming action for the non-reference parameter, and means for causing the application of the selected trimming action corresponding to each code.

3. The electronic device according to claim 1 , wherein the at least one reference parameter consists of a single reference parameter, the number of the trimming actions for the reference parameter being higher than the number of the trimming actions for each non-reference parameter.

4. The electronic device according to claim 3 , wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non reference parameter as corresponding to the correction for the non-reference parameter related to a conversion value associated with the correction corresponding to the selected trimming action for the reference parameter according to a predefined relationship between the corrections for the reference parameter and the corrections for the non-reference parameter.

5. The electronic device according to claim 1 , wherein the at least one reference parameter comprises a plurality of reference parameters.

6. The electronic device according to claim 5 , wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non-reference parameter as corresponding to the correction for the non-reference parameter related to a conversion value associated with a combination of the corrections corresponding to the selected trimming actions for the reference parameters according to a predefined relationship between the corrections for the reference parameter and the corrections for the non-reference parameter.

7. The electronic device according to claim 4 , wherein the predefined relationship is a linear relationship.

8. The electronic device according to claim 7 , wherein the means for selecting the trimming action for each non-reference parameter includes means for selecting the trimming action for the non-reference parameter according to an approximation of the conversion value to the closest correction for the non-reference parameter.

9. The electronic device according to claim 1 , wherein the at least one reference parameter includes a characteristic of a clock signal of the electronic device.

10. The electronic device according to claim 1 , wherein each non-reference parameter is not measurable from outside the electronic device.

11. A method for tuning a plurality of operative parameters of an electronic device, for each operative parameter a plurality of trimming actions being applicable each one for causing a corresponding correction of the operative parameter, wherein the method includes the steps of:

for at least one reference parameter, measuring the at least one reference parameter responsive to the application of at least part of the trimming actions to select one of the trimming actions providing a target value of the at least one reference parameter, and

forcing the application of the selected trimming action for the at least one reference parameter,

for each non-reference parameter different from the at least one reference parameter, selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter according to a predetermined mapping of each group of multiple corrections of the at least one reference parameter on a single correction of the non-reference parameter, and

forcing the application of the selected trimming action for each non-reference parameter.