IP Library › Granted Patent US 8,451,457
Granted Patent B2
US 8,451,457 · App. 12/681,926 · Granted May 28, 2013

Chromatic confocal sensor

Inventors: Brian J. Gates (Osceola, WI); Craig R. Sykora (New Richmond, WI); Dean Faklis (Wayland, NY); Andrew J. Murnan (Saratoga Springs, NY); Nestor O. Farmiga (Rochester, NY)
Assignee: 3m Innovative Properties Company
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,451,457
App. No.
12/681,926
Granted
May 28, 2013
Kind
B2
Abstract

A system comprising a substrate having thereon a multiphoton curable photoreactive composition, a light source that emits a light beam comprising a plurality of wavelengths onto at least one region of the composition on the substrate, and a detector that detects a portion of light reflected from the composition to obtain a location signal with respect to the substrate, wherein the location signal is based at least on a wavelength of the reflected light.

Claims (34)

1. A system comprising:

a substrate having thereon a multiphoton curable photoreactive composition;

a light source that emits a light beam comprising a plurality of wavelengths onto at least one region of the composition on the substrate; and

a detector that detects a portion of light reflected from the composition to obtain a location signal with respect to the substrate, wherein the location signal is based on at least a wavelength of the reflected light.

2. The system of claim 1 , wherein the location signal further comprises an intensity of the light reflected off the substrate.

3. The system of claim 1 , wherein the location signal further comprises a size of the light reflected off the substrate.

4. The system of claim 1 , wherein the detector comprises a camera.

5. The system of claim 1 , wherein the detector comprises a spectrometer.

6. The system of claim 1 , wherein the substrate is on a moveable stage.

7. The system of claim 1 , wherein the light source is moveable.

8. The system of claim 1 , wherein the light beam at least partially cures a region of the multiphoton curable photoreactive composition.

9. The system of claim 1 , further comprising a second light beam emitted from a second light source, wherein the second light beam at least partially cures a region of the multiphoton curable photoreactive composition.

10. The system of claim 1 , further comprising a fiber optic cable which directs the reflected light to the detector.

11. The system of claim 1 , further comprising at least two fiber optic cables which may direct the reflected light to the detector, wherein at least one of the fiber optic cables comprises a diameter different than the diameter of at least one other of the fiber optic cables.

12. The system of claim 1 , wherein the light source comprises an ultrafast laser.

13. A method comprising:

providing a substrate having thereon a multiphoton curable photoreactive composition;

applying at least one light beam comprising a plurality of wavelengths to at least one region of the material, wherein at least one of the wavelengths comprises a sufficient intensity to at least partially cure the multiphoton curable photoreactive composition by multiphoton absorption; and

processing a portion of the light reflected off the material to obtain a location signal with respect to the substrate, wherein the location signal comprises the wavelength of the reflected light.

14. The method of claim 13 , wherein the at least one light beam comprises a first light beam and a second light beam.

15. The method of claim 14 , wherein the first light beam comprises the at least one of the wavelengths which comprises a sufficient intensity to at least partially cure the multiphoton curable photoreactive composition, and the second light beam comprises the portion of the light beam reflected off the material to obtain a location signal with respect to the material.

16. The method of claim 14 , where the first light beam at least partially cures a region of the multiphoton curable photoreactive composition before, after, or at the same time as the processing step to form a cured object.

17. The method of claim 13 , wherein a single light beam comprises the at least one of the wavelengths which comprises a sufficient intensity to at least partially cure the multiphoton curable photoreactive composition and the portion of the light beam reflected off the material to obtain a location signal with respect to the material.

18. The method of claim 13 , wherein the location signal further comprises an intensity of the light reflected off of the substrate.

19. The method of claim 13 , wherein the location signal further comprises a shape of the light reflected off of the substrate.

20. The method of claim 13 , wherein the location signal is obtained from an optical apparatus comprising a fiber optic cable.

21. The method of claim 13 , wherein the optical apparatus further comprises at least two fiber optic cables and at least two detectors, wherein each fiber optic cable directs light to a respective one of the at least two detectors.

22. The method of claim 13 , wherein the step of applying at least one light beam comprises introducing chromatic aberration into the at least one light beam.

23. The method of claim 13 , further comprising removing from the substrate at least a portion of an uncured material.

24. The method of claim 13 , further comprising adjusting a relative location of the substrate and the at least one light beam in response to the location signal.

25. A system, comprising:

a multiphoton curable photoreactive composition;

a light source emitting a light beam comprising a plurality of wavelengths incident onto at least a region of the composition, at least a portion of the light beam being reflected by the composition; and

a detector detecting the reflected beam and generating a position signal based on a wavelength of the reflected beam.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2010
From: GATES, BRIAN J.; SYKORA, CRAIG R.; FAKLIS, DEAN; MURNAN, ANDREW J.; FARMIGA, NESTOR O.
To: 3M INNOVATIVE PROPERTIES COMPANY
Reel/Frame 024743/0705 →
Continuity (2)
Provisional Application 60979240 · Oct 11, 2007
Related Publication 20100296106A1 · Nov 25, 2010