IP Library › Granted Patent US 8,451,582
Granted Patent B2
US 8,451,582 · App. 11/658,201 · Granted May 28, 2013

Capacitors with high energy storage density and low ESR

Inventors: Anat Sneh (Boulder, CO); Ofer Sneh (Broomfield, CO)
Assignee: Sundew Technologies, LLC
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Quick Facts
Patent No.
US 8,451,582
App. No.
11/658,201
Granted
May 28, 2013
Kind
B2
Abstract

Electrostatic capacitors with high capacitance density and high-energy storage are implemented over conventional electrolytic capacitor anode substrates using highly conformal contact layers deposited by atomic layer deposition. Capacitor films that are suitable for energy storage, electrical and electronics circuits, and for integration onto PC boards endure long lifetime and high-temperature operation range.

Claims (52)

1. A capacitor including a capacitor foil, said capacitor foil comprising:

a chemically etched metallic foil;

a conformal and substantially uniform dielectric layer formed over a first portion of said chemically etched metallic foil; and

further comprising an electrolyte in electrical contact with said dielectric layer and an electrical bias system for applying an electrical potential between said chemically etched metallic foil and said electrolyte; and said electrical potential is selected to increase the breakdown voltage of said dielectric layer without substantially increasing the thickness of said dielectric layer;

a substantially uniform and conformal first conductive film formed over said dielectric layer;

wherein a second portion of said chemically etched metallic foil is not covered with said dielectric layer; and

said conformal conductive film is electrically insulated from said portion of said chemically etched foil that is not covered with said dielectric layer.

2. The capacitor of claim 1 , and further comprising an additional metal foil and wherein said additional metal foil is in electrical contact with said conformal first conductive film.

3. The capacitor of claim 2 , said capacitor further comprising:

a strip of said capacitor foil;

said strip of said additional metal foil having substantially similar width and length to said capacitor foil; and

wherein said strip of capacitor foil and said strip of additional metal foil are wound together to form a substantially compact capacitor core shape.

4. The capacitor of claim 1 wherein at least a portion of said conformal first conductive film is grown by atomic layer deposition (ALD).

5. The capacitor of claim 1 , further comprising a second conductive layer in electrical contact with said conformal first conductive film wherein said second conductive layer is electrically insulated from said portion of said etched foil that is not covered with said formed dielectric layer.

6. The capacitor of claim 5 , further comprising an additional metal foil in electrical contact with said second conductive layer.

7. The capacitor of claim 6 , said capacitor further comprising:

a strip of said capacitor foil;

said strip of said additional metal foil having substantially similar width and length as said strip of capacitor foil; and

wherein said strip of capacitor foil and said strip of additional metal foil are wound together to form a substantially compact capacitor core shape.

8. The capacitor of claim 5 and further comprising a strip of said capacitor foil wound to form a substantially compact capacitor core shape.

9. The capacitor of claim 5 wherein said capacitor foil is mounted onto a PCB;

said PCB comprises electrical contact pads;

said mounting comprises substantially making low ESR electrical contact with said electrical contact pads;

said capacitor foil is delineated to define capacitors;

said defined capacitors comprise of selected capacitance; and

said selected capacitance is determined by the capacitance per area of said capacitor foil and the area of said defined capacitors.

10. The capacitor of claim 1 wherein at least a portion of said dielectric layer is formed by atomic layer deposition (ALD).

11. The capacitor of claim 1 wherein at least a portion of said dielectric layer is formed by anodic oxidation.

12. The capacitor of claim 1 wherein said capacitor foil is mounted onto a PCB; and

said PCB comprises:

electrical contact pads;

said mounting comprises substantially making low ESR electrical contact with said electrical contact pads;

said capacitor foil is delineated to define capacitors;

said defined capacitors comprise of selected capacitance; and

said selected capacitance is determined by the capacitance per area of said capacitor foil and the area of said defined capacitors.

13. The capacitor of claim 1 wherein said chemically etched metallic foil comprises aluminum.

14. The capacitor of claim 1 wherein said dielectric layer comprises aluminum oxide.

15. The capacitor of claim 1 wherein said conformal conductive film comprises titanium nitride.

16. The capacitor of claim 1 wherein said high area comprises more than 10 times area enhancement.

17. The capacitor of claim 1 wherein said capacitor foil further comprises:

both sides of said metallic foil are chemically etched;

said dielectric layer is formed on both sides of said chemically etched metallic foil; and

said conformal conductive film is formed on said dielectric layer on both sides of said capacitor foil.

18. A capacitor including a capacitor foil, said capacitor foil comprising:

a chemically etched metallic foil;

a conformal and substantially uniform dielectric layer formed over a first portion of said chemically etched metallic foil; and

a substantially uniform and conformal first conductive film formed over said dielectric layer;

wherein a second portion of said chemically etched metallic foil is not covered with said dielectric layer; and

said conformal conductive film is electrically insulated from said portion of said chemically etched foil that is not covered with said dielectric layer;

wherein at least a portion of said dielectric layer is formed by atomic layer deposition (ALD);

a portion of said dielectric layer is anodically oxidized; and

the thickness of said ALD portion is selected to substantially increase the breakdown voltage of said dielectric layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2007
From: SNEH, ANAT; SNEH, OFER
To: SUNDEW TECHNOLOGIES, LLC
Reel/Frame 018978/0034 →
Continuity (2)
Provisional Application 60590748 · Jul 23, 2004
Related Publication 20080094775A1 · Apr 24, 2008