IP Library Granted Patent US 8,466,552
Granted Patent B2
US 8,466,552 · App. 13/165,689 · Granted Jun 18, 2013

Semiconductor device and method of manufacturing the same

Inventors: Masanori Onodera (Tokyo, JP); Kouichi Meguro (Tokyo, JP)
Assignee: Spansion LLC
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Quick Facts
Patent No.
US 8,466,552
App. No.
13/165,689
Granted
Jun 18, 2013
Kind
B2
Abstract

A manufacturing method of a semiconductor device includes: forming a columnar electrode on a semiconductor wafer; flip-chip bonding a second semiconductor chip onto the semiconductor wafer; forming a molding portion on the semiconductor wafer, the molding portion covering and molding the columnar electrode and the second semiconductor chip; grinding or polishing the molding portion and the second semiconductor chip so that an upper face of the columnar electrode and an upper face of the semiconductor chip are exposed; and cutting the molding portion and the semiconductor wafer so that a first semiconductor chip, where the second semiconductor chip is flip-chip bonded and the columnar electrode is formed, is formed.

Claims (28)

1. A semiconductor device comprising:

a columnar electrode comprising a barrier electrode portion formed on a semiconductor wafer;

a second semiconductor chip that is flip-chip bonded onto the semiconductor wafer;

a molding portion formed on the semiconductor wafer, the molding portion covering and molding the columnar electrode and the second semiconductor chip,

wherein an upper face of the barrier electrode and an upper face of the semiconductor chip are exposed and the upper face of the barrier electrode and the upper face of the second semiconductor chip are coplanar; and

a first semiconductor chip that is formed where the second semiconductor chip is flip-chip bonded and the columnar electrode is formed.

2. The semiconductor device of claim 1 further comprising a grinded or polished lower face of the semiconductor wafer.

3. The semiconductor device of claim 1 wherein the columnar electrode is electrically coupled to the first semiconductor chip and the second semiconductor chip.

4. The semiconductor device of claim 1 wherein the columnar electrode is plated.

5. The semiconductor device of claim 4 wherein:

the columnar electrode comprises a lower electrode and a barrier electrode; and

the molding portion is grinded or polished together with an upper portion of the barrier electrode.

6. The semiconductor device of claim 5 further comprising a solder terminal formed on the barrier electrode.

7. The semiconductor device of claim 1 wherein the columnar electrode is formed lower than the second semiconductor chip.

8. The semiconductor device of claim 1 further comprising:

a first resin portion formed to cover an area between an upper face of the semiconductor wafer and a lower face of the second semiconductor chip;

and a second resin portion formed on the first resin portion.

9. The semiconductor device of claim 8 wherein a liquid resin is coated on the semiconductor wafer to form the first resin portion.

10. The semiconductor device of claim 1 wherein the first semiconductor chip is mounted to a mount portion.

11. The semiconductor device of claim 1 wherein the base of the columnar electrode is parallel with the top surface of the columnar electrode over a span that extends from a first to a second sidewall of the columnar electrode.

12. A semiconductor device comprising:

a first semiconductor chip;

a second semiconductor chip that is flip-chip bonded onto the first semiconductor chip;

a columnar electrode comprising a barrier electrode portion that is provided on the first semiconductor chip and is electrically coupled to the first semiconductor chip; and

a molding portion having a first resin portion and a second resin portion, the first resin portion covering space between an upper face of the first semiconductor chip and a lower face of the second semiconductor chip,

the second resin portion being provided on the first resin portion and molding the columnar electrode and the second semiconductor chip so that an upper face of the barrier electrode portion and an upper face of the second semiconductor chip are exposed wherein the upper face of the barrier electrode portion and the upper face of the second semiconductor chip are coplanar.

13. The semiconductor device of claim 12 wherein a lower face and a side face of the first semiconductor chip are exposed from the molding portion.

14. The semiconductor device of claim 12 further comprising a mount portion where the first semiconductor chip is mounted.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Oct 28, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 050896/0366 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036055/0276 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
SECURITY AGREEMENT Recorded Aug 23, 2012
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 028837/0076 →
Priority Claims (1)
JP 2007-057828 · Mar 7, 2007 · national
Continuity (2)
Division 12044851 · Mar 7, 2008
Related Publication 20110248400A1 · Oct 13, 2011