IP Library › Granted Patent US 8,521,460
Granted Patent B2
US 8,521,460 · App. 12/892,774 · Granted Aug 27, 2013

Multi-domain test and measurement instrument

Inventor: Kenneth P. Dobyns (Beaverton, OR)
Assignee: Tektronix, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,521,460
App. No.
12/892,774
Granted
Aug 27, 2013
Kind
B2
Abstract

A test and measurement instrument including an input port configured to receive an input signal; a digitizer configured to digitize the input signal; a decimator coupled to the digitizer and configured to decimate the digitized input signal to generate a decimated input signal; a digital downconverter coupled to the digitizer and configured to frequency shift the digitized input signal to generate a frequency shifted input signal; and a memory configured to store the decimated input signal and the frequency shifted input signal.

Claims (38)

1. A test and measurement instrument, comprising:

an input port configured to receive an input signal;

a digitizer configured to digitize the input signal;

a decimator coupled to the digitizer and configured to decimate the digitized input signal to generate a decimated input signal;

a digital downconverter coupled to the digitizer and configured to frequency shift the digitized input signal to generate a frequency shifted input signal; and

a memory configured to store the decimated input signal and the frequency shifted input signal; and further comprising:

a user interface; and

a controller configured to present the decimated input signal and the frequency shifted input signal through the user interface; wherein

the user interface comprises time domain controls and frequency domain controls; and

the controller is configured to adjust parameters of the decimator in response to the time domain controls and configured to adjust parameters of the digital downconverter in response to the frequency domain controls.

2. The test and measurement instrument of claim 1 , wherein the decimated input signal and the frequency shifted input signal have different sample rates.

3. The test and measurement instrument of claim 1 , wherein the decimated input signal and the frequency shifted input signal have different record lengths.

4. The test and measurement instrument of claim 1 , wherein:

the digitizer is configured to sample the input signal at a first sample rate;

the decimator is configured to generate the decimated input signal at a second sample rate that is less than the first sample rate; and

the digital downconverter is configured to generate the frequency shifted input signal at a third sample rate that is less than the first sample rate.

5. The test and measurement instrument of claim 1 , wherein the controller is configured to present the decimated input signal and the frequency shifted input signal through the user interface substantially simultaneously.

6. The test and measurement instrument of claim 1 , wherein the controller is configured to adjust a sample rate of the decimator in response to the time domain controls; and configured to adjust a sample rate of the digital downconverter in response to the frequency domain controls.

7. The test and measurement instrument of claim 1 , further comprising:

a trigger system coupled to the decimator and the digital downconverter, and configurable to trigger an acquisition in response to at least one of the decimated input signal and the frequency shifted input signal.

8. A method of operating a test and measurement instrument, comprising:

digitizing an input signal;

decimating the digitized input signal to generate a decimated input signal;

frequency shifting the digitized input signal to generate a frequency shifted input signal; and

storing the decimated input signal and the frequency shifted input signal in a memory; and further comprising presenting the decimated input signal and the frequency shifted input signal through a user interface and further comprising:

adjusting the decimation of the digitized input signal in response to a time domain control of the user interface; and

adjusting the frequency shifting of the digitized input signal in response to the frequency domain control of the user interface.

9. The method of claim 8 , wherein the decimated input signal and the frequency shifted input signal have different sample rates.

10. The method of claim 8 , wherein the decimated input signal and the frequency shifted input signal have different record lengths.

11. The method of claim 8 , wherein:

digitizing the input signal comprises digitizing the input signal at a first sample rate;

decimating the digitized input signal comprises decimating the digitized input signal to a second sample rate that is less than the first sample rate; and

frequency shifting the digitized input signal comprises frequency shifting the digitized input signal to a third sample rate that is less than the first sample rate.

12. The method of claim 8 , further comprising presenting the decimated input signal and the frequency shifted input signal through the user interface substantially simultaneously.

13. The method of claim 8 , further comprising:

adjusting a sample rate of the decimator in response to the time domain control of the user interface; and

adjusting a sample rate of the frequency shifting in response to the frequency domain control of the user interface.

14. The method of claim 8 , further comprising triggering an acquisition in response to at least one of the decimated input signal and the frequency shifted input signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2013
From: DOBYNS, KENNETH P.
To: TEKTRONIX, INC.
Reel/Frame 030806/0632 →
Continuity (1)
Related Publication 20120078557A1 · Mar 29, 2012