Flash memory device and method of programming flash memory device
A flash memory device performs a program operation using an incremental step pulse programming (ISPP) scheme comprising a plurality of program loops. In each of the program loops, a program pulse operation is performed to increase the threshold voltages of selected memory cells, and a program verify operation is performed to verify a program status of the selected memory cells. The program verify operation can be selectively skipped in some program loops based on a voltage increment of one or more of the program pulse operations, an amount by which threshold voltages of the selected memory cells are to be increased in the ISPP scheme, or a total number of program loops of the ISPP scheme.
1. A method of programming a flash memory device, comprising:
programming selected memory cells using an incremental step pulse programming (ISPP) process comprising a plurality of program loops based on at least two voltage increments having respectively different levels, wherein each of the program loops comprises a program pulse operation that applies a program pulse to the selected memory cells, and at least one of the program loops comprises a program verify operation that verifies a program state of the selected memory cells; and
selectively skipping the program verify operation in at least one of the program loops according to a voltage increment of one or more of the program pulse operations.
2. The method of claim 1 , wherein the program verify operation is skipped where the voltage increment is greater than or equal to a predetermined reference voltage.
3. The method of claim 2 , wherein the program verify operation is performed where the voltage increment is smaller than the predetermined reference voltage.
4. The method of claim 1 , wherein the selected memory cells are 4-bit multi-level cells.
5. A flash memory device, comprising:
a memory cell array comprising multi-level cells; and
a control logic circuit configured to control a program operation of selected memory cells among the multi-level cells, wherein the program operation is performed by an incremental step pulse programming (ISPP) process comprising a plurality of program loops based on at least two voltage increments having respectively different levels, wherein each of the program loops comprises a program pulse operation, and one or more of the program loops comprises a program verify operation,
wherein the control logic circuit controls the program operation to selectively skip a program verify operation in at least one of the program loops according to a voltage increment of one or more of the program pulse operations.
6. The flash memory device of claim 5 , wherein the control logic circuit controls the program operation to skip the program verify operation where the voltage increment is greater than or equal to a predetermined reference voltage.
7. The flash memory device of claim 6 , wherein the control logic circuit controls the program operation to perform the program verify operation where the voltage increment is smaller than the predetermined reference voltage.
8. The flash memory device of claim 5 , wherein the program verify operation is selectively skipped in at least one of the program loops.
9. The flash memory device of claim 5 , wherein the memory cell array has a NAND flash configuration.
10. An electronic system comprising:
a flash memory device; and
a memory controller configured to control the flash memory device, the flash memory device comprising:
a memory cell array comprising multi-level cells; and
a control logic circuit configured to control a program operation of selected memory cells among the multi-level cells, wherein the program operation is performed by an incremental step pulse programming (ISPP) process comprising a plurality of program loops based on at least two voltage increments having respectively different levels, wherein each of the program loops comprises a program pulse operation, and one or more of the program loops comprises a program verify operation,
wherein the control logic circuit controls the program operation to selectively skip a program verify operation in at least one of the program loops according to a voltage increment of one or more of the program pulse operations.
11. The electronic system of claim 10 , further comprising a host configured to provide commands to the memory controller to initiate memory access operations of the flash memory device.