IP Library Granted Patent US 8,541,815
Granted Patent B2
US 8,541,815 · App. 13/351,869 · Granted Sep 24, 2013

High electron mobility transistor circuit

Inventors: Yoshihiro Takemae (Yokohama, JP); Tsutomu Hosoda (Yokohama, JP); Toshiya Sato (Yokohama, JP)
Assignee: Fujitsu Semiconductor Limited
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,541,815
App. No.
13/351,869
Granted
Sep 24, 2013
Kind
B2
Abstract

A transistor circuit includes a first high electron mobility transistor and a second high electron mobility transistor having a negative threshold voltage, wherein a source of the second high electron mobility transistor is coupled to a gate of the first high electron mobility transistor, and a gate of the second high electron mobility transistor is coupled to a source of the first high electron mobility transistor.

Claims (16)

1. A transistor circuit comprising:

a first high electron mobility transistor; and

a second high electron mobility transistor having a negative threshold voltage,

wherein a source of the second high electron mobility transistor is coupled to a gate of the first high electron mobility transistor, and

a gate of the second high electron mobility transistor is coupled to a source of the first high electron mobility transistor.

2. The transistor circuit according to claim 1 ,

wherein the first high electron mobility transistor includes a first field plate including at least a portion extending between the gate and the drain thereof.

3. The transistor circuit according to claim 2 ,

wherein the first high electron mobility transistor further includes a second field plate including at least a portion extending between the first field plate and the drain thereof.

4. The transistor circuit according to claim 1 ,

wherein the second high electron mobility transistor includes a field plate including at least a portion extending between the gate and the drain thereof and being coupled to the source of the first high electron mobility transistor.

5. The transistor circuit according to claims 1 , further comprising:

a third high electron mobility transistor coupled in series to the second high electron mobility transistor,

wherein the third high electron mobility transistor includes a gate coupled to the drain of the first high electron mobility transistor, and has a negative threshold voltage.

6. The transistor circuit according to claim 1 ,

wherein the second high electron mobility transistor limits a voltage between the source and the gate of the first high electron mobility transistor to a voltage smaller than a gate withstand voltage of the first high electron mobility transistor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2014
From: FUJITSU SEMICONDUCTOR LIMITED
To: TRANSPHORM JAPAN, INC.
Reel/Frame 032865/0131 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2012
From: TAKEMAE, YOSHIHIRO; HOSODA, TSUTOMU; SATO, TOSHIYA
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027558/0362 →
Priority Claims (1)
JP 2011-060723 · Mar 18, 2011 · national
Continuity (1)
Related Publication 20120235210A1 · Sep 20, 2012