Information recording/reproducing device

1. An information recording/reproducing device comprising:

a memory cell array area and an alignment mark area,

the memory cell array area comprising: an insulating layer on a semiconductor substrate; a first interconnect layer filled in a first groove of the insulating layer; a first stacked layer structure on the first interconnect layer, the first stacked layer structure including a storage layer and an electrode layer; and a second interconnect layer on the first stacked layer structure;

the alignment mark area comprising: the insulating layer; a conductive layer as an alignment mark filled in a second groove of the insulating layer; and a second stacked layer structure on the insulating layer, the second stacked layer structure surrounding the conductive layer and including the storage layer and the electrode layer;

wherein all of the layers in the first and second stacked layer structures comprise a material with a permeability of visible light of 1% or more.

2. The device of claim 1 , further comprising:

a third stacked layer structure between the first stacked layer structure and the second interconnect layer, the third stacked layer structure including the storage layer and the electrode layer.

3. The device of claim 2 ,

wherein the third stacked layer structure comprises an insulating layer that does not have an alignment mark.

4. The device of claim 2 ,

wherein the third stacked layer structure comprises an insulating layer that has an alignment mark.

5. The device of claim 1 ,

wherein the memory cell array area comprises a cross-point memory cell array.

6. The device of claim 1 ,

wherein the storage layer comprises a material selected from groups of:

L1 x M1 y X 4 (0.1 ≦x ≦2.2, 1.8 ≦y ≦2),  (i)

L1 x M1 y X 3 (0.5 ≦x ≦1.1, 0.9 ≦y ≦1),  (ii)

L2 x M2 y X 4 (0.5≦x≦1.1, 0.9 ≦y ≦1),  (iii)

M3 x O y (0.5 ≦x ≦1.1, 0.9 ≦y ≦1),  (iv)

where L1 is at least one element selected from the group of Na, K, Rb, Be, Mg, Ca, Sr, Ba, Al, Ga, Mn, Fe, Co, Ni, Cu, Zn, Ge, Ag, Au, Cd, Sn, Sb, Pt, Pd, Hg, Tl, Pb and Bi,

M1 is at least one element selected from the group of Al, Ga, Ti, Ge, Sn, V, Cr, Mn, Fe, Co, Ni, Nb, Ta, Mo, W, Ru and Rh,

L2 is at least one element selected from the group of Mg, Ca, Sr, Al, Ga, Sb, Ti, V, Cr, Mn, Fe, Co, Rh, In, Sb, Tl, Pb and Bi,

M2 is at least one element selected from the group of Al, Ga, Ti, Ge, Sn, V, Nb, Ta, Cr, Mn, Mo, W, Ir and Os, and

M3 is at least one element selected from the group of Al and transition metal elements;

in regard to (i) and (ii), L1 and M1 are elements that are different from one another, and in regard to (iii), L2 and M2 are elements that are different from one another; and

X is at least one element selected from the group of O and N.

7. The device of claim 1 ,

wherein the electrode layer comprises a material selected from groups of:

A1 1-x B1 x O y   (i)

where A1 is at least one element selected from the group of Sn and Pb, B1 is at least one element selected from the group of P, As, Sb and Bi, O is elemental oxygen, and 0.01≦x≦0.15, 1.5≦y2.8;

A1 1-x B2 x O y   (ii)

where A1 is at least one element selected from the group of Sn and Pb, B2 is at least one element selected from the group of F, Cl and Br, O is elemental oxygen, and 0.05≦x≦0.60, 1.5≦y≦2.8;

A3 1-x B3 x O y   (iii)

where A3 is at least one element selected from the group of Zn and Cd, B3 is at least one element selected from the group of Al, Ga, B and In, O is elemental oxygen, and 0.01x≦0.20, 1.5≦y≦2.8;

Ti 1-x B4 x O y   (iv)

where Ti is elemental titanium, B4 is at least one element selected from the group of V, Nb, Ta, Cr, Mo and W, O is elemental oxygen, and 0.01≦x≦0.20, 1.5≦y≦2.8; and

In 1-x B5 x O y   (v)

where In is elemental indium, B5 is at least one element selected from the group of Zn, Cd, Ge and Sn, O is elemental oxygen, and 0.01≦x≦0.20, 1.5≦y≦2.8.

8. The device of claim 1 ,

wherein a thickness of the electrode layer is 250 nm or more and 5 .mu.m or less.

9. The device of claim 1 ,

wherein the permeability of the insulating layer and the conductive layer are different from each other.

10. The device of claim 1 ,

wherein the first interconnect layer functions as a first conductive line extending in a first direction, and

the first interconnect layer and the conductive layer comprise an identical material.

11. The device of claim 10 ,

wherein the electrode layer in the first stacked layer structure is an uppermost layer in the first stacked layer structure, and the electrode layer in the first stacked layer structure is connected to the second interconnect layer which functions as a second conductive line extending in a second direction that intersects with the first direction.

12. The device of claim 11 ,

wherein the second conductive line is not arranged above the alignment mark.

13. The device of claim 1 ,

wherein the first stacked layer structure further comprises a diode.

14. The device of claim 1 , further comprising:

a silicon oxide layer above the alignment mark.

15. The device of claim 1 ,

wherein the second stacked layer structure comprises the storage layer and the electrode layer above the alignment mark.

16. The device of claim 1 ,

wherein the first and second stacked layer structures comprise a barrier metal layer and a polysilicon layer.