Oscilloscope probe
Disclosed is a probe ( 21 ) for an oscilloscope ( 24 ) comprising a multi-stage transistor amplifier ( 26 ) which is used as an impedance transformer and the output of which is connected to the oscilloscope ( 24 ). An electronic switching device ( 27 ) that can be remote-controlled by means of the oscilloscope ( 24 ) is assigned to the input (V in ) of the amplifier ( 26 ). Said electronic switching device ( 27 ) allows frame potential or a reference voltage to be alternatively connected to the amplifier input (V in ) instead of the measuring-circuit voltage of the measuring tip ( 22 ) such that the direct voltage offset is measured when the amplifier input (V in ) is connected to frame while the gain error in the oscilloscope ( 24 ) is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.
1. A probe for ground-referenced signals for an oscilloscope with a multi-stage transistor amplifier acting as an impedance converter, of which the output is connected to the oscilloscope, said probe comprising:
a switching device remote-controllable via the oscilloscope, and through which ground potential and a reference voltage can be connected to the amplifier input instead of the test voltage of a probe tip, is allocated to the input of the amplifier,
wherein the amplifier is a DC-coupled emitter-follower circuit constructed from bipolar transistors or a DC-coupled source-follower circuit constructed from field-effect transistors or a circuit built up from these two circuits, of which the successive amplifier elements are dimensioned and matched to one another in such a manner that the resulting offset direct voltage between the input and the output is minimal.
2. A probe for differential signals for an oscilloscope with a multi-stage transistor amplifier acting as an impedance converter, of which the output is connected to the oscilloscope, said probe comprising:
a switching device allocated to the two differential inputs of the amplifier, and wherein this switching device is remote-controllable in such a manner that instead of the test voltage of the probe tips, both inputs are short-circuited relative to one another or can be connected individually to ground and/or to two arbitrary reference voltages,
wherein the amplifier is a DC-coupled emitter-follower circuit constructed from bipolar transistors or a DC-coupled source-follower circuit constructed from field-effect transistors or a circuit built up from these two circuits, of which the successive amplifier elements are dimensioned and matched to one another in such a manner that the resulting offset direct voltage between the input and the output is minimal.
3. The probe according to claim 1 ,
wherein, in the case of a connection of ground potential to the amplifier input, the direct-voltage offset in the oscilloscope is measured and taken into consideration accordingly in the evaluation of the test voltage in the oscilloscope.
4. The probe according to claim 1 ,
wherein, in the case of a connection of a reference voltage to the amplifier input, the amplification error in the oscilloscope is measured and taken into consideration accordingly in the evaluation of the test voltage in the oscilloscope.
5. The probe according to claim 1 ,
wherein the switching device consists of field-effect transistor switches, MEMS switches or relays, which are remote-controllable via control lines connected to the oscilloscope.
6. The probe according to claim 1 ,
wherein a voltage divider is arranged between the switching device and the probe tip and/or amplifier input.
7. The probe according to claim 1 ,
wherein the transistors of the emitter-follower or respectively source-follower circuits are mixed in such a manner with interconnected diodes and/or resistors that the offset direct voltages is minimal.
8. The probe according to claim 1 ,
wherein the amplifier is an emitter-follower circuit constructed from several bipolar transistors, and the successive transistors are selected in such a mixed manner from npn- or respectively pnp-conductivity type that the sum of the successive base-emitter voltages is minimal.
9. The probe according to claim 1 ,
wherein the amplifier is a self-conducting source-follower circuit consisting of several field-effect transistors, of which the source currents are selected in such a manner that the gate-source voltages of the individual transistors and therefore also their sum is approximately 0 volts.
10. The probe according to claim 1 ,
wherein the DC-coupled amplifier consists of a mixture of bipolar transistors and field-effect transistors and optionally diodes and/or resistors, which are dimensioned and matched to one another in such a manner that the sum of the successive base-emitter voltages, gate-source voltages and optionally rectified voltages of the diodes or respectively voltages of the resistors is approximately 0 volt.
11. The probe according to claim 2 ,
wherein, in the case of a connection of ground potential to the amplifier input, the direct-voltage offset in the oscilloscope is measured and taken into consideration accordingly in the evaluation of the test voltage in the oscilloscope.
12. The probe according to claim 2 ,
wherein, in the case of a connection of a reference voltage to the amplifier input, the amplification error in the oscilloscope is measured and taken into consideration accordingly in the evaluation of the test voltage in the oscilloscope.
13. The probe according to claim 2 ,
wherein the switching device consists of field-effect transistor switches, MEMS switches or relays, which are remote-controllable via control lines connected to the oscilloscope.
14. The probe according to claim 2 ,
wherein a voltage divider is arranged between the switching device and the probe tip and/or amplifier input.
15. The probe according to claim 2 ,
wherein the transistors of the emitter-follower or respectively source-follower circuits are mixed in such a manner with interconnected diodes and/or resistors that the offset direct voltages is minimal.
16. The probe according to claim 2 ,
wherein the amplifier is an emitter-follower circuit constructed from several bipolar transistors, and the successive transistors are selected in such a mixed manner from npn- or respectively pnp-conductivity type that the sum of the successive base-emitter voltages is minimal.
17. The probe according to claim 2 ,
wherein the amplifier is a self-conducting source-follower circuit consisting of several field-effect transistors, of which the source currents are selected in such a manner that the gate-source voltages of the individual transistors and therefore also their sum is approximately 0 volts.
18. The probe according to claim 2 ,
wherein the DC-coupled amplifier consists of a mixture of bipolar transistors and field-effect transistors and optionally diodes and/or resistors, which are dimensioned and matched to one another in such a manner that the sum of the successive base-emitter voltages, gate-source voltages and optionally rectified voltages of the diodes or respectively voltages of the resistors is approximately 0 volt.