Microelectronic component support with reinforced structure
A microelectronic support assembly has a support member formed from plateable resin, such as liquid crystalline polymer and the support member is configured with a laser to define holes in the support member. These holes and other areas of the support member are plated and the plating forms a plurality of hollow metal columns that provide reinforcement to the support member so that it can resist wire bonding pressures.
1. A support carrier, comprising:
a support member, the support member formed of a material with a compressive strength of less than 50 MPa at one percent deflection, the support member including a first side and an opposing second side, the first side including a support area for supporting the microelectronic device and a termination area, the support area having a conductive floor disposed for contacting the microelectronic device and the termination area having a conductive trace disposed thereon, the conductive trace and conductive floor being spaced apart from each other;
a first support structure extending from the second side to the conductive trace, the first support structure comprising a metal plating formed on an aperture in the support member, wherein the support structure substantially increases a compressive strength of the support carrier at the termination area; and
a second support structure disposed beneath the conductive floor, the second support structure comprising a plating on a cavity that extends from the second side to the conductive floor.
2. The support carrier of claim 1 , wherein the second support structure has a general frusto-conical configuration.
3. The support carrier of claim 1 , further including an additional metal layer plated on a second surface of the support member, the additional metal layer having the form of a flat plate extending at least partially around a second end.
4. The support carrier of claim 1 , further including an inverted V-shaped hollow frame member communicating with the reinforcement member.
5. The support carrier of claim 4 , wherein the frame member is aligned with one of the conductive traces.
6. The support carrier of claim 1 , wherein the support member further include a plurality of channels formed in a surface thereof, each of the channels containing a single one of the conductive traces therein.
7. The support carrier of claim 6 , wherein the channels extend lengthwise along the support member and a pair of holes are spaced apart from each other lengthwise within the conductive trace.
8. The support carrier of claim 7 , wherein the support member further includes conductive traces disposed on a bottom surface of the support member interconnecting bottom ends of the pairs of columns together formed in the holes when plated.
9. The support carrier of claim 7 , wherein each of the pairs of holes include a third hole, the three holes arranged at apexes of an imaginary triangle, the three holes defining three hollow metal columns when plated.
10. The support carrier of claim 7 , further including an additional pair of holes associated with each pair of holes, the four holes being arranged at apexes of an imaginary four-sided figure, the four holes defining four hollow metal columns when plated.
11. A support system, comprising:
a support member, the support member formed of a plateable plastic with a compressive strength, the support member including a first side and an opposing second side and an aperture extending between the first side and the second side, the first side including a support area for supporting a microelectronic device and a termination area, the support area having a conductive floor for contacting the microelectronic device and the termination area having a conductive trace disposed thereon, the conductive trace and conductive floor being spaced apart from each other; and
a support structure extending from the second side to the conductive trace, the first support structure comprising a metal plating formed on the aperture in the support member and a plated base, the metal plating on the aperture forms a first column that extends between the plated base and the conductive trace, the first column providing a first opening in the conductive trace, wherein the support structure increases the compressive strength at one percent deflection of the support carrier at the termination area by at least a factor of four (4).
12. The connector of claim 11 , wherein the support structure increases the compressive strength at the termination area by at least a factor of ten (10).
13. The connector of claim 11 , wherein the support structure further comprises a second column provided on a second aperture, the second column extending between the plated base and the conductive trace and providing a second opening in the conductive trace, wherein the termination area is positioned between the first and second opening.
14. The connector of claim 11 , wherein the support structure is configured to prevent more than five (5) percent deformation of the support member at the termination area when a wire-bond is applied to the termination area.