Semiconductor memory system including a plurality of semiconductor memory devices
A communication line is connected to first and second chips, and held at a first signal level. A monitor circuit changes a signal level of the communication line from the first signal to a second signal level while one of the first and second chips uses a current larger than a reference current. When the signal level of the communication line is the second signal level, the other of the first and second chips is controlled to a wait state that does not transfer to an operating state of using a current larger than the reference current.
1. A semiconductor memory system comprising:
a first semiconductor memory device;
a second semiconductor memory device; and
a controller electrically connected to the first and second semiconductor memory devices,
the controller controlling program and verify operation of the first and second semiconductor memory devices,
wherein the controller controls the first and second semiconductor memory devices so that a generation timing of peak current thereof is not overlapped.
2. The system according to claim 1 , wherein the first and second semiconductor memory devices, each of which have a high-voltage generation circuit generating a high voltage for controlling program and verify operations.
3. The system according to claim 1 , wherein each of the first and second semiconductor memory devices is a NAND flash memory.
4. The system according to claim 2 , wherein the high-voltage generation circuit of the first semiconductor memory device and the high-voltage generation circuit of the second semiconductor memory device operate simultaneously and supply a necessary voltage for the program and verify operations of each of the first and second semiconductor memory devices.
5. The system according to claim 2 , wherein the high-voltage generation circuit of the first semiconductor memory device and the high-voltage generation circuit of the second semiconductor memory device operate simultaneously and supply a necessary voltage for the program and verify operations of each of the first and second semiconductor memory devices, wherein the first and second semiconductor memory devices include the controller.