Complex semiconductor device for use in mobile equipment
Provided is a complex semiconductor device. The complex semiconductor device includes first memory chips in a first package, second memory chips in a second package configured for mass storage of data, and a controller packaged with either the first package or the second package in a complex package. The controller is connected to the first package via a first internal bus and to the second package via a second internal bus, and the first package, second package and controller are commonly packaged within a single complex package.
1. A semiconductor device configured to receive data from and communicate data to a host, and comprising:
a multi-chip package (MCP) comprising at least a stacked plurality of memory chips; and
an embedded multimedia card (eMMC) comprising a controller and a plurality of nonvolatile memory chips configured for mass storage of user data,
wherein the controller and the plurality of nonvolatile memory chips are commonly disposed on a substrate during fabrication of the eMMC to form a complex semiconductor package,
the controller is independently and respectively connected to the MCP via a first internal bus and to the plurality of nonvolatile memory chips via a second internal bus,
the MCP and the eMMC are commonly packaged within a single complex package, and
the host is directly connected to the MCP via an external bus.
2. The semiconductor device of claim 1 , wherein the single complex package is fabricated using package-on-package techniques.
3. The semiconductor device of claim 2 , wherein the controller is connected to the external bus via contact terminals having a double-layer arrangement.
4. The semiconductor device of claim 1 , wherein the single complex package is fabricated using system-in-package techniques.
5. The semiconductor device of claim 4 , wherein the controller is connected to the external bus via contact terminals having a single-layer arrangement.
6. The semiconductor device of claim 1 , wherein the stacked plurality of memory chips includes a volatile memory and a nonvolatile memory,
the volatile memory is one of a mobile DRAM, an EDP, a PRAM, a Pseudo SRAM, an LpDDR-based DRAM, an FRAM, a Graphic DRAM, and a ReRAM; and
the nonvolatile memory is one of a NAND flash memory, a NOR flash memory, a PRAM, and a ReRAM.
7. The semiconductor device of claim 1 , wherein the plurality of nonvolatile memory chips comprises at least one of a NAND flash memory, a NOR flash memory, a PRAM, and a ReRAM.
8. The semiconductor device of claim 1 , wherein the external bus is directly connected to only the MCP.
9. The semiconductor device of claim 1 , wherein the external bus is directly connected to only the MCP and the plurality of nonvolatile memory devices of the eMMC.
10. The semiconductor device of claim 1 , wherein the external bus is directly connected to the MCP, the controller, and the plurality of nonvolatile memory devices of the eMMC.
11. The semiconductor device of claim 1 , wherein the single complex package is connected to a terminal controller within a mobile device and configured with the host to function as a storage element storing multimedia data within the mobile device.
12. A semiconductor device configured during testing to receive data from an external tester via an external bus, the semiconductor device, comprising:
a multi-chip semiconductor package (MCP) comprising a stacked plurality of memory chips; and
an embedded multimedia card (eMMC) comprising a controller including tester logic and a plurality of nonvolatile memory chips configured for mass storage of user data,
wherein the controller and the plurality of nonvolatile memory chips are commonly disposed on a substrate during fabrication of the eMMC to form a complex semiconductor package,
the controller is independently and respectively connected to the MCP via a first internal bus and to the plurality of nonvolatile memory chips via a second internal bus,
the MCP and the eMMC are commonly packaged within a single complex package, and
the external tester is connected via the external bus to communicate data with the tester logic.
13. The semiconductor device of claim 12 , wherein the stacked plurality of memory chips includes a volatile memory and a nonvolatile memory, and the plurality of nonvolatile memory chips includes at least one of a NAND flash memory, a NOR flash memory, a PRAM, and a ReRAM.
14. The semiconductor device of claim 13 , wherein the controller comprises:
a controller core unit including embedded firmware;
a host interface unit that connects the external bus to the controller core unit;
a multi-chip package interface that connects to the MCP to the controller core unit;
a flash memory interface unit that connects the plurality of nonvolatile memory chips to the controller core unit,
wherein the tester logic controls execution of a test operation via the controller core unit directed to one of the stacked plurality of memory chips and the plurality of nonvolatile memory chips during testing of the semiconductor device.
15. The semiconductor device of claim 14 , wherein the controller further comprises a register connected to the controller core unit and configured to store information defining the test operation.
16. The semiconductor device of claim 12 , wherein the external bus is directly connected to only the MCP.
17. The semiconductor device of claim 12 , wherein the external bus is directly connected to only the MCP and the plurality of nonvolatile memory chips.
18. The semiconductor device of claim 12 , wherein the external bus is directly connected to only the plurality of nonvolatile memory chips.
19. The semiconductor device of claim 18 , wherein the plurality of nonvolatile memory chips comprises a plurality of NAND flash memory chips.