Structures embedded within core material and methods of manufacturing thereof
Embodiments of the present disclosure provide a method that comprises providing a first die having a surface comprising a bond pad to route electrical signals of the first die and attaching the first die to a layer of a substrate. The method further comprises forming one or more additional layers of the substrate to embed the first die in the substrate and coupling a second die to the one or more additional layers, the second die having a surface comprising a bond pad to route electrical signals of the second die. The second die is coupled to the one or more additional layers such that electrical signals are routed between the first die and the second die.
1. An apparatus comprising:
a substrate having (i) a first laminate layer, (ii) a second laminate layer, and (iii) a core material that is disposed between the first laminate layer and the second laminate layer;
a first die having a first surface that is coupled to the first laminate layer, the first die having a second surface that is opposite to the first surface of the first die, wherein the second surface of the first die comprises a bond pad to route electrical signals of the first die, and wherein the first die is embedded in the core material of the substrate such that the core material separates at least a section of the second surface of the first die from the second laminate; and
a second die coupled to the second laminate layer, the second die having a surface comprising a bond pad to route electrical signals of the second die,
wherein the second die is coupled to the second laminate layer such that electrical signals are routed between the first die and the second die.
2. The apparatus of claim 1 , wherein the second die is coupled to the second laminate layer via solder balls.
3. The apparatus of claim 2 , further comprising:
underfill material between the second die and the second laminate layer.
4. The apparatus of claim 1 , further comprising:
a heat sink coupled to the second die,
wherein the second die is coupled to the second laminate layer at a first surface of the second die, and
wherein the heat sink is coupled to the second die at a second surface of the second die that is opposite to the first surface of the second die.
5. The apparatus of claim 4 , wherein the second die is coupled to the second laminate layer via solder balls.
6. The apparatus of claim 5 , further comprising:
underfill material between the second die and the second laminate layer.
7. The apparatus of claim 1 , further comprising:
a third die coupled to the first laminate layer, the third die including a surface comprising a bond pad to route electrical signals of the third die,
wherein the third die is embedded in the core material of the substrate, and
wherein the second die is coupled to the second laminate layer such that electrical signals are routed between the third die and the second die.
8. The apparatus of claim 7 , wherein the third die is positioned in one of either (i) a substantially side-by-side arrangement with respect to the first die or (ii) a substantially stacked arrangement with respect to the first die.
9. The apparatus of claim 7 , further comprising:
a fourth die coupled to the first laminate layer, the fourth die including a surface comprising a bond pad to route electrical signals of the fourth die, wherein the fourth die is embedded in the core material of the substrate; and
a fifth die coupled to the first laminate layer, the fifth die including a surface comprising a bond pad to route electrical signals of the fifth die, wherein the fifth die is embedded in the core material of the substrate,
wherein the third die is positioned over the first die such that the third die and the first die are in a substantially stacked arrangement,
wherein the fifth die is positioned over the fourth die such that the fifth die and the fourth die are in a substantially stacked arrangement,
wherein the first and third dies and the fourth and fifth dies are arranged in a substantially side-by-side arrangement,
wherein the second die is coupled to the second laminate layer such that electrical signals are routed between the fourth die and the second die, and
wherein the second die is coupled to the second laminate layer such that electrical signals are routed between the fifth die and the second die.
10. The apparatus of claim 1 , wherein the first die is a memory device and the second die is an integrated circuit configured to include one or more Systems-on-Chip (SoCs).
11. The apparatus of claim 1 , wherein the second die is not embedded in the core material of the substrate.
12. The apparatus of claim 1 , wherein the first laminate layer and the second laminate layer comprises laminate material.
13. The apparatus of claim 12 , wherein the laminate material comprises one of epoxy/resin based materials, Flame Retardant 4 (FR4) or Bismaleimide-Triazine (BT).