Methods and devices to increase memory device data reliability
A first data set is written to first memory units identified as having a higher data reliability and a second data set is written to second memory units identified as having a lower data reliability than the first memory units. In some cases, the second data set may include metadata or redundancy information that is useful to aid in reading and/or decoding the first data set. The act of writing the second data set increases the data reliability of the first data set. The second data set may be a null pattern, such as all erased bits.
1. A memory device, comprising:
memory storage including first memory units and second memory units identified as having lower data reliability than the first memory units; and
a memory controller configured to write a first data set to the first memory units and to write a second data set to the second memory units identified as having lower data reliability than the first memory units, wherein the second data set includes one or both of 1) information that is useable to interpret the first data set and 2) a dummy pattern.
2. The memory device of claim 1 , wherein the dummy pattern is a fixed pattern.
3. The memory device of claim 1 , wherein the second data set comprises one or both of multiple redundant copies of metadata used to aid in reading or decoding the first data set and redundancy information configured to protect the data stored in the first memory units.
4. The memory device of claim 3 , wherein the redundancy information comprises redundancy information associated with multiple types of error correcting code.
5. The memory device of claim 4 , wherein the controller is further configured to:
decode the data stored in the first memory cells using the redundancy information of each of the multiple types of error correcting code to provide multiple sets decoded data; and
implement a voting scheme among the multiple sets of decoded data to identify correctly decoded data.
6. The memory device of claim 1 , wherein the second data set comprises a test pattern.
7. The memory device of claim 6 , wherein the controller is configured to:
read the test pattern; and
use results of reading the test pattern to determine parameters to read the first memory units.
8. The memory device of claim 1 , wherein the controller is configured to identify the second memory units as having lower reliability.
9. The memory device of claim 1 , wherein the second memory units have lower data reliability due to non-random errors arising from one or both of hardware configuration of the memory device and algorithmic operation of the memory device.
10. The memory device of claim 1 , wherein the dummy pattern comprises one or both of erased bits or random bits.
11. The memory device of claim 1 , wherein the memory storage comprises flash memory.
12. The memory device of claim 11 , wherein the second memory units comprise a predetermined number of memory pages of a memory block that are written last during a write operation of the memory block.
13. The memory device of claim 11 , wherein the information is useable to increase reliability of the first data set.