Semiconductor package
The invention provides a semiconductor package. The semiconductor package includes a substrate. A first conductive trace is disposed on the substrate. A solder resistance layer is disposed on the substrate, having an extending portion covering a portion of the first conductive trace, wherein a width of the extending portion of the solder resistance layer is larger than that of the portion of the first conductive trace. A semiconductor die is disposed over the first conductive trace.
1. A semiconductor package, comprising:
a substrate;
a first conductive trace disposed on the substrate;
a solder resist layer disposed on the substrate, having an extending portion covering a portion of the first conductive trace, wherein a width of the extending portion of the solder resist layer is larger than that of the portion of the first conductive trace;
a semiconductor die disposed over the first conductive trace; and
an underfill material filling a gap between the substrate and the semiconductor die, surrounding the extending portion of the solder resist layer and the first conductive trace.
2. The semiconductor package as claimed in claim 1 , further comprising:
a second conductive trace disposed on the substrate;
a conductive pillar disposed on the second conductive trace, connecting to a conductive bump of the semiconductor die.
3. The semiconductor package as claimed in claim 1 , further comprising:
a second conductive trace disposed on the substrate;
a solder bump disposed on the second conductive trace, connecting to a bond pad of the semiconductor die.
4. The semiconductor package as claimed in claim 2 , wherein the solder resist layer is disposed away from a portion of the second conductive trace, which overlaps with the conductive pillar, by a distance.
5. The semiconductor package as claimed in claim 1 , wherein the extending portion of the solder resist layer and the portion of the first conductive trace collectively have a T-shaped cross section.
6. The semiconductor package as claimed in claim 1 , wherein the extending portion of the solder resist layer is below the semiconductor die and within a projection area of the semiconductor die.
7. The semiconductor package as claimed in claim 1 , wherein a portion of a bottom surface of the extending portion of the solder resist layer is exposed from the portion of the first conductive trace.
8. The semiconductor package as claimed in claim 7 , wherein the portion of the bottom surface of the extending portion of the solder resist layer is wrapped by the underfill material.
9. The semiconductor package as claimed in claim 1 , wherein the extending portion of the solder resist layer has a vertical sidewall extruding over an adjacent vertical sidewall of the portion of the first conductive trace.
10. The semiconductor package as claimed in claim 1 , wherein the extending portion of the solder resist layer extends along the first conductive trace and under a bottom surface of the semiconductor die.
11. A semiconductor package, comprising:
a substrate;
a first conductive trace disposed on the substrate;
a solder resist layer disposed on the substrate, having an extending portion covering a portion of the first conductive trace, wherein the extending portion of the solder resist layer has a vertical sidewall extruding over an adjacent vertical sidewall of the portion of the first conductive trace;
a semiconductor die disposed over the first conductive trace; and
an underfill material filling a gap between the substrate and the semiconductor die, surrounding the extending portion of the solder resist layer and the first conductive trace.
12. The semiconductor package as claimed in claim 11 , further comprising:
a second conductive trace disposed on the substrate; and
a conductive pillar disposed on the second conductive trace, connecting to a conductive bump of the semiconductor die.
13. The semiconductor package as claimed in claim 11 , further comprising:
a second conductive trace disposed on the substrate; and
a solder bump disposed on the second conductive trace, connecting to a bond pad of the semiconductor die.
14. The semiconductor package as claimed in claim 12 , wherein the solder resist layer is disposed away from a portion of the second conductive trace, which overlaps with the conductive pillar, by a distance.
15. The semiconductor package as claimed in claim 11 , wherein the extending portion of the solder resist layer and the portion of the first conductive trace collectively have a T-shaped cross section.
16. The semiconductor package as claimed in claim 11 , wherein the extending portion of the solder resist layer is below the semiconductor die and within a projection area of the semiconductor die.
17. The semiconductor package as claimed in claim 11 , wherein a portion of a bottom surface of the extending portion of the solder resist layer is exposed from the portion of the first conductive trace.
18. The semiconductor package as claimed in claim 17 , wherein the portion of the bottom surface of the extending portion of the solder resist layer is wrapped by the underfill material.
19. The semiconductor package as claimed in claim 11 , wherein a width of the extending portion of the solder resist layer is larger than that of the portion of the first conductive trace.
20. The semiconductor package as claimed in claim 1 , wherein the extending portion of the solder resist layer extends along the first conductive trace and under a bottom surface of the semiconductor die.