Combined distance-of-flight and time-of-flight mass spectrometer

1. A mass spectrometry instrument comprising:

an ion source configured to produce ions having varying mass-to-charge ratios;

a first detector configured to determine when each of the ions travels a predetermined distance;

a second detector configured to determine how far each of the ions travels in a predetermined time; and

a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.

2. The mass spectrometry instrument of claim 1 , wherein the detector extraction region is operable to direct a first portion of the ions to the first detector and to direct a second portion of the ions to the second detector.

3. The mass spectrometry instrument of claim 1 , wherein the detector extraction region directs ions toward the second detector when activated and directs ions toward the first detector when deactivated.

4. The mass spectrometry instrument of claim 1 , wherein the detector extraction region directs ions toward the first detector when activated and directs ions toward the second detector when deactivated.

5. The mass spectrometry instrument of claim 3 , wherein the detector extraction region comprises an electrostatic field when activated.

6. The mass spectrometry instrument of claim 5 , wherein the ions have a first direction of travel when entering the detector extraction region and the electrostatic field deflects the ions in a second direction, the second direction being nonparallel to the first direction.

7. The mass spectrometry instrument of claim 6 , wherein the detector extraction region comprises a repeller plate which generates the electrostatic field when supplied with a voltage.

8. The mass spectrometry instrument of claim 1 , further comprising a source extraction region which applies an acceleration pulse to the ions produced by the ion source.

9. The mass spectrometry instrument of claim 8 , wherein the acceleration pulse imparts mass-to-charge ratio dependent velocities on the ions.

10. The mass spectrometry instrument of claim 9 , wherein the acceleration pulse has a longer period than the time it takes for all of the ions to exit the source extraction region.

11. The mass spectrometry instrument of claim 9 , wherein the acceleration pulse has a shorter period than the time it takes for any of the ions to exit the source extraction region.

12. The mass spectrometry instrument of claim 11 , further comprising a reflectron configured to provide energy focus to a portion of the ions with a range of initial energies.

13. A method comprising:

generating an ion beam having ions of varying mass-to-charge ratios;

transmitting the ion beam into a detector extraction region; and

directing portions of the ion beam toward one of a first detector configured to determine when each of the ions travels a predetermined distance and a second detector configured to determine how far each of the ions travels in a predetermined time.

14. The method of claim 13 , wherein directing portions of the ion beam toward one of the first detector and the second detector comprises:

directing a first portion of the ion beam to the first detector; and

directing a second portion of the ion beam to the second detector.

15. The method of claim 13 , wherein directing portions of the ion beam toward one of the first detector and the second detector comprises activating and deactivating the detector extraction region.

16. The method of claim 15 , wherein activating and deactivating the detector extraction region comprises selectively generating an electrostatic field.

17. The method of claim 13 , wherein directing portions of the ion beam toward the first detector comprises allowing portions of the ion beam to pass through the detector extraction region without disturbing a prior trajectory of the ion beam.

18. The method of claim 17 , wherein directing portions of the ion beam toward the second detector comprises deflecting portions of the ion beam from the prior trajectory.

19. The method of claim 13 , wherein directing portions of the ion beam toward the second detector comprises allowing portions of the ion beam to pass through the detector extraction region without disturbing a prior trajectory of the ion beam.

20. The method of claim 19 , wherein directing portions of the ion beam toward the first detector comprises deflecting portions of the ion beam from the prior trajectory.

21. The method of claim 13 , further comprising applying an acceleration pulse to the ion beam to impart mass-to-charge ratio dependent velocities on the ions.

22. The method of claim 21 , further comprising transmitting the ion beam through a reflectron configured to provide energy focus to a portion of the ions with a range of initial energies.

23. The method of claim 13 , further comprising:

receiving data from the first detector regarding the mass-to-charge ratios of the ions; and

determining which portions of the ion beam to direct toward the second detector in response to the data.

24. The mass spectrometry instrument of claim 1 , wherein the second detector comprises a linear array of discrete charge-collecting Faraday strips for collecting the portions of the ions directed to the second detector.

25. The mass spectrometry instrument of claim 24 , wherein the second detector further comprises a first amplifier associated with each of the Faraday strips, each first amplifier having a capacitance in circuit with the first amplifier to form an integrator.

26. The mass spectrometry instrument of claim 25 , wherein the second detector further comprises:

a second amplifier associated with each of the integrators; and

a computing device configured to control the second amplifiers to sample charges resulting from impingement of ions onto the Faraday strips and to hold the charges resulting from the impingement of ions onto the Faraday strips for a time.

27. The mass spectrometry instrument of claim 1 , wherein the second detector comprises a focal plane camera, an active area of the focal plane camera extending along a mass-separation axis of the detector extraction region, a focal plane of the focal plane camera being positioned at a space-focus plane of the mass spectrometry instrument during distance-of-flight mass spectrometry.

28. The mass spectrometry instrument of claim 27 , wherein the second detector further comprises a structure providing an extraction orifice positioned between the detector extraction region and the focal plane of the focal plane camera, the structure providing the extraction orifice being maintained at about ground potential.

29. The mass spectrometry instrument of claim 27 , further comprising a chiller mounted in a heat conducting relationship with the focal plane camera.

30. The mass spectrometry instrument of claim 29 , further comprising a fluid circuit coupled to the chiller and to a source of refrigerant, the fluid circuit configured to carry heat away from the chiller.