IP Library Granted Patent US 8,673,676
Granted Patent B2
US 8,673,676 · App. 12/973,345 · Granted Mar 18, 2014

Surface processing method of silicon substrate for solar cell, and manufacturing method of solar cell

Inventor: Byung-Jun Kim (Cheonan, KR)
Assignee: Wonik IPS Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,673,676
App. No.
12/973,345
Granted
Mar 18, 2014
Kind
B2
Abstract

Disclosed is a surface processing method of a crystalline silicon substrate for a solar cell, and a method for manufacturing a solar cell. The surface processing method of a substrate for a solar cell comprises first surface processing step for forming a plurality of first protrusions on surfaces of a substrate by etching the crystalline silicon substrate by using an aqueous solution, second surface processing step for forming a plurality of second protrusions smaller than the first protrusions by adhering etching residues onto an upper surface, a light receiving surface among the surfaces of the substrate, by using first etching gas, and residue removing step for removing etching residues adhered onto the upper surface of the substrate having undergone the second surface processing step.

Claims (23)

1. A surface processing method of a crystalline silicon substrate for a solar cell, the method comprising:

a crystalline silicon substrate providing step for providing a substrate which comprises crystalline silicon;

a first surface processing step for forming a plurality of first protrusions on surfaces of the substrate by etching the substrate by using an aqueous solution;

a second surface processing step for forming a plurality of second protrusions smaller than the first protrusions by adhering etching residues onto an upper surface, a light receiving surface among the surfaces of the substrate, by using a first etching gas; and

a residue removing step for removing the etching residues adhered onto the upper surface of the substrate having undergone the second surface processing step,

wherein in an assumption that an area of a surface in a completely flat state where an anti-reflection film is to be formed, among the surfaces of the substrate having undergone the first surface processing step, is an ideal surface area, a ratio between a substantial surface area etched in the first surface processing step and the ideal surface area is in the range of 1.2˜3.2.

2. The method of claim 1 , wherein the aqueous solution used in the first surface processing step includes HF and HNO3.

3. The method of claim 1 , further comprising a substrate damage removing step for removing damages formed on the surfaces of the crystalline silicon substrate sliced from a crystalline silicon ingot, by using an acid aqueous solution or alkali aqueous solution, before the first surface processing step.

4. The method of claim 1 , wherein the crystalline silicon substrate is a monocrystalline silicon substrate or a multicrystalline silicon substrate.

5. The method of claim 1 , wherein in the residue removing step, the etching residues are removed by dipping the substrate in a wet station containing residue removing liquid, or by transferring the substrate by roller.

6. The method of claim 5 , wherein the residue removing liquid is hydrofluoric acid aqueous solution.

7. The method of claim 5 , wherein the residue removing liquid includes water or hydrofluoric acid aqueous solution, and ultrasonic waves are applied to the residue removing liquid when performing the residue removing step.

8. The method of claim 1 , wherein in the residue removing step, the etching residues remaining on an upper surface of the substrate are removed by plasmarizing a second etching gas.

9. The method of claim 8 , wherein the second etching gas includes fluorine or chlorine.

10. The method of claim 8 , wherein the second etching gas includes one of HCl , ClF3, NF, CF4, C3F8, NF3, C2F6, F2, CHF3, SF6 and Cl2.

11. The method of claim 8 , wherein the second etching gas has a lower reactivity with the substrate than the first etching gas.

12. The method of claim 8 , wherein the first etching gas is gas including elements which belong to Group VII, and the second etching gas is gas including at least one of elements rather than the elements which belong to Group VII.

13. The method of claim 8 , wherein the second etching gas includes at least one of inert gas and oxygen.

14. The method of claim 5 , further comprising a hydrofluoric acid dipping step of dipping the substrate in hydrofluoric acid aqueous solution, after the residue removing step.

15. A method for manufacturing a solar cell including the surface processing method of a substrate for a solar cell according to claim 1 .

16. The method of 15 , further comprising a hydrofluoric acid dipping step of dipping the substrate in hydrofluoric acid aqueous solution, after the residue removing step.

17. A method for manufacturing a solar cell including the surface processing method of a substrate for a solar cell according claim 4 .

18. A method for manufacturing a solar cell including the surface processing method of a substrate for a solar cell according claim 1 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2016
From: WONIK IPS CO., LTD.
To: WONIK IPS CO., LTD.
Reel/Frame 038523/0270 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 14, 2012
From: KIM, BYUNG-JUN
To: WONIK IPS CO., LTD.
Reel/Frame 028785/0767 →
Priority Claims (1)
KR 10-2010-0088935 · Sep 10, 2010 · national
Continuity (1)
Related Publication 20120060925A1 · Mar 15, 2012