Method and system for near-field optical imaging
A system and method for optically imaging a sample. The method and system uses a controlled scatterer of light positioned in the near field of a sample. The extinguished power from an incident field, which illuminates both the sample and the controlled scatterer, is then measured as a function of the controlled scatterer position and is used to mathematically reconstruct an image of the sample.
1. A method for optical imaging comprising:
providing a sample;
introducing a controlled scatterer into a near field of the sample whereby changing a position of the controlled scatterer changes a pattern of illumination of said sample;
providing an incident field to illuminate said sample;
measuring extinguished power from the incident field as a function of a position of the controlled scatterer; and
imaging the sample by using the measured extinguished power.
2. The method of claim 1 , further comprising controlling the position of the controlled scatterer.
3. The method of claim 1 , wherein the controlled scatterer is a nano-particle, a scanning near-field tip, an atomic force microscope tip, a near-field scanning optical microscopy tip, or a bow-tie antenna.
4. The method of claim 1 , wherein providing the incident field comprises providing incident light from a monochromatic illumination source having a wavelength λ or a non-monochromatic light source that outputs non-monochromatic light through a filter to obtain wavelength λ.
5. The method of claim 4 , wherein measuring the power comprises measuring electromagnetic power at wavelength λ.
6. The method of claim 1 , further comprising oscillating the controlled scatterer.
7. The method of claim 1 , wherein the step of imaging comprises reconstructing a complex valued susceptibility of the sample with sub-wavelength resolution in three dimensions from the measured extinguished power obtained for different positions of the controlled scatterer distributed on a three-dimensional grid.
8. The method of claim 1 , wherein the step of imaging obtains a sub-wavelength resolution.
9. A system for optical imaging comprising:
a controlled scatterer that is introduced into a near field of a sample and adapted such that changing a position of the controlled scatterer changes a pattern of illumination of said sample;
incident light providing means for providing an incident field that illuminates said sample;
power measuring means for measuring power extinguished from the incident field as a function of a position of the controlled scatterer; and
imaging means for imaging the sample using the measured extinguished power extinguished from the incident field.
10. The system of claim 9 , further comprising means for controlling the position of the controlled scatterer.
11. The system of claim 9 , wherein the controlled scatterer is a nano-particle, an atomic force microscope tip, or a bow-tie antenna.
12. The system of claim 9 , wherein the controlled scatterer is a near-field microscope tip or a near-field scanning optical microscopy tip.
13. The system of claim 9 , wherein the incident light providing means is a monochromatic illumination source having a wavelength λ or a non-monochromatic light source that outputs non-monochromatic light through a filter to obtain wavelength λ.
14. The system of claim 13 , wherein the power measuring means is a photodiode or an avalanche photodiode adapted to measure electromagnetic power at wavelength λ.
15. The system of claim 9 , wherein the controlled scatterer is an oscillating controlled scatterer.
16. The system of claim 9 , wherein the imaging means reconstructs a complex valued susceptibility of the sample with sub-wavelength resolution in three dimensions from measured extinguished power obtained for different positions of the controlled scatterer distributed on a three-dimensional grid.
17. The system of claim 9 , wherein the imaging means obtains a sub-wavelength resolution.
18. A method of optical imaging comprising:
providing a sample;
introducing a controlled scatterer into a near field of the sample whereby changing a position of the controlled scatterer changes a pattern of illumination of said sample;
oscillating the controlled scatterer;
measuring extinguished power obtained for different positions of the controlled scatterer; and
reconstructing a complex valued susceptibility of the sample with sub-wavelength resolution in three dimensions from the measured extinguished power obtained for different positions of the controlled scatterer distributed on a three-dimensional grid outside a region of the sample.
19. The method of claim 18 , wherein the controlled scatterer is a nano-particle, an atomic force microscope tip, or a bow-tie antenna.
20. The method of claim 18 , wherein the controlled scatterer is a near-field microscope tip or a scanning near-field optical microscope tip.