IP Library › Granted Patent US 8,704,338
Granted Patent B2
US 8,704,338 · App. 13/247,162 · Granted Apr 22, 2014

Chip comprising a fill structure

Inventors: Gunther Mackh (Neumarkt, DE); Gerhard Leschik (Regensburg, DE); Adolf Koller (Regensburg, DE); Harald Seidl (Poering, DE)
Assignee: Infineon Technologies AG
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Quick Facts
Patent No.
US 8,704,338
App. No.
13/247,162
Granted
Apr 22, 2014
Kind
B2
Abstract

A chip includes a dielectric layer and a fill structure in the dielectric layer, wherein the fill structure extends along a dicing edge of the chip, with the fill structure abutting the dicing edge.

Claims (27)

1. A chip comprising a dielectric layer and a fill structure in the dielectric layer, wherein the fill structure extends along a dicing edge of the chip, with the fill structure abutting the dicing edge,

wherein a chip area of the chip is smaller than 10 mm 2 ,

wherein the fill structure forms a periodic structure having a periodicity with a periodic pitch in a lateral dimension parallel to and/or perpendicular to the dicing edge, and wherein the periodic pitch is smaller than 5 μm.

2. The chip according to claim 1 , wherein the dicing edge is straight and the fill structure abuts the dicing edge along an entire length of the dicing edge.

3. The chip according to claim 1 , wherein the chip comprising four dicing edges surrounding a chip area, wherein the dicing edge is straight and the fill structure abuts the dicing edge along an entire length of the dicing edge.

4. The chip according to claim 1 , wherein the fill structure comprises metal, oxide and/or polysilicon.

5. The chip according to claim 1 , wherein the periodic structure is formed by a grid of metal vias or metal conductor line fragments.

6. The chip according to claim 1 , wherein the periodic structure is formed by a plurality of metal, oxide and/or polysilicon layers extending within the dielectric layer and/or within an insulating layer.

7. The chip according to claim 6 , wherein the metal, oxide and/or polysilicon layers comprise interconnecting lines formed within the chip in order to connect logic elements.

8. The chip according to claim 1 , wherein the chip comprises a sealing ring which extends in parallel to the dicing edge within the dielectric layer.

9. The chip according to claim 1 , wherein the dielectric layer has a dielectric constant smaller than 3.9.

10. The chip according to claim 1 , wherein average half-pitch of the chip is smaller than 65 nm.

11. The chip according to claim 1 , wherein the dicing edge extends straightly along a direction defined by a grid of the periodic fill structure.

12. A chip comprising a dielectric layer having a dielectric constant smaller than 3.9 and a fill structure in the dielectric layer,

wherein the fill structure extends along a dicing edge of the chip, with the fill structure abutting the dicing edge along an entire length of the dicing edge, and

wherein the fill structure forms a periodic structure having a periodic pitch which is smaller than 5 μm.

13. A wafer comprising a plurality of chip areas separated by at least a dicing line,

wherein the wafer comprises a dielectric layer, and

wherein the dielectric layer comprises a fill structure within the dicing line having a width of which is smaller than 25 μm,

wherein the fill structure forms a periodic structure having a periodic pitch which is smaller than 5 μm and which extends in a lateral dimension parallel and perpendicular to the dicing line, and

wherein the fill structure laterally occupies more than 25% of the dicing line.

14. The wafer according to claim 13 , wherein the periodic structure is formed by a grid of metal vias or metal conductor line fragments.

15. The wafer according to claim 13 , wherein the periodic structure is formed by a plurality of metal, oxide and/or polysilicon layers extending within the dielectric layer and/or within an insulating layer.

16. The wafer according to claim 13 , wherein the fill structure comprises metal, oxide and/or polysilicon.

17. The wafer according to claim 13 , wherein the fill structure comprises a density of metal of at least 10%.

18. The wafer according to claim 13 , wherein the chip areas are smaller than 3 mm 2 .

19. The wafer according to claim 13 , wherein the dielectric layer has a dielectric constant smaller than 3.9.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 17, 2011
From: MACKH, GUNTHER; LESCHIK, GERHARD; KOLLER, ADOLF; SEIDL, HARALD
To: INFINEON TECHNOLOGIES AG
Reel/Frame 027070/0216 →
Continuity (1)
Related Publication 20130075869A1 · Mar 28, 2013