Stacked die assembly

1. An assembly, comprising:

a first interposer, the first interposer having a first offset region;

a second interposer, the second interposer having a second offset region;

a first integrated circuit die interconnected to the first interposer and the second interposer;

a second integrated circuit die interconnected to the second interposer;

a plurality of components that interconnect the first integrated circuit die to the first interposer and the second interposer; and

wherein signals are routed between the first interposer and the second interposer via the first integrated circuit die and the plurality of components, and signals are routed between the first integrated circuit die and the second integrated circuit die via a plurality of conductive lines of the second interposer which are outside of the second offset region.

2. The assembly according to claim 1 , wherein the first interposer and the second interposer are separate dies coupled to one another via the first integrated circuit die and the plurality of components.

3. The assembly according to claim 1 , wherein the first interposer and the second interposer are a single platform from a same substrate.

4. The assembly according to claim 1 , wherein:

the plurality of components includes a plurality of die-to-die interconnects;

a first portion of the plurality of die-to-die interconnects interconnect the first integrated circuit die to the first interposer;

a second portion of the plurality of die-to-die interconnects interconnect the first integrated circuit die to the second interposer;

wherein the first portion and the second portion of the plurality of die-to-die interconnects are disposed on opposing sides of the second offset region;

a third portion of the plurality of die-to-die interconnects interconnect the second integrated circuit die to the second interposer;

a portion of the plurality of conductive lines of the second interposer are coupled to the second portion of the plurality of die-to-die interconnects and the third portion of the plurality of die-to-die interconnects in order to interconnect the first integrated circuit die to the second integrated circuit die, and

wherein the second portion of the plurality of die-to-die interconnects are located outside the second offset region.

5. The assembly according to claim 1 , wherein:

the first offset region has a first boundary that is coterminous with a first edge of the interposer; and

the second offset region has a second boundary that is coterminous with a second edge of the second interposer.

6. The assembly according to claim 1 , wherein the first offset region and the second offset region include no metal layer and no via layer used for providing a fine pitch interconnect.

7. The assembly according to claim 1 , wherein:

the first interposer is formed using a first mask set; and

the second interposer is formed using a second mask set;

the first mask set is substantially different from the second mask set responsive at least in part to the second integrated circuit die being for a different type of integrated circuit than the first integrated circuit die.

8. The assembly according to claim 7 , wherein:

a first height of the first interposer is substantially the same as a second height of the second interposer; and

a first width of the first interposer and a second width of the second interposer are both less than or equal to a same lithographic maximum width.

9. The assembly according to claim 1 , wherein:

the second integrated circuit die includes a vertical stack of memory dies; and

the second integrated circuit die includes interface logic for the vertical stack of memory dies.

10. The assembly according to claim 1 , further comprising chip-to-chip connectors coupled to the first interposer and the second interposer.

11. The assembly according to claim 1 , further comprising a packaging material in which the first interposer and the second interposer are located.

12. The assembly according to claim 1 , wherein the plurality of components that interconnect the first integrated circuit die to the first interposer and the second interposer include fine pitch interconnects.

13. The assembly according to claim 1 , further comprising:

a third integrated circuit die interconnected to both the first interposer and the second interposer,

wherein the third integrated circuit die provides a communication bridge between the first integrated circuit die and the second integrated circuit die; and

wherein the third integrated circuit die includes an array of bidirectional repeaters or a set of crossbar switches each of which is capable of being statically configured for communication between the first integrated circuit die and the second integrated circuit die.

14. The assembly according to claim 13 , further comprising:

a packaging material in which the first interposer and the second interposer are located;

wherein signals are routed via the third integrated circuit die from the first integrated circuit die to the second integrated circuit die avoiding an interconnect restricted area of the first interposer and the second interposer.

15. The assembly according to claim 13 , wherein:

the third integrated circuit die is interconnected to the first interposer via first die-to-die interconnects and the second interposer via second die-to-die interconnects;

the first die-to-die interconnects and the second die-to-die interconnects are outside of the first and second offset regions of the first interposer and the second interposer; and

the first die-to-die interconnects and the second die-to-die interconnects are fine pitch interconnects.

16. A method for forming an assembly, comprising:

interconnecting a first integrated circuit die to a first interposer and a second interposer using a plurality of components, wherein the first interposer has a first offset region and the second interposer has a second offset region;

interconnecting a second integrated circuit die to the second interposer using the plurality of components;

routing signals between the first interposer and the second interposer via the first integrated circuit die and the plurality of components; and

routing signals between the first integrated circuit die and the second integrated circuit die via conductive lines of the second interposer which are outside of the second offset region.

17. The method according to claim 16 , further comprising forming the first interposer and the second interposer on a same substrate as a single platform.

18. The method according to claim 16 , further comprising molding the first interposer and the second interposer in a packaging material.

19. The method according to claim 16 , wherein the first second integrated circuit die provides a communication bridge between the first integrated circuit die and a third integrated circuit die.

20. The method according to claim 16 , wherein:

the interconnecting of the first integrated circuit die to the first interposer and the second interposer is via first fine pitch die-to-die interconnects of the plurality of components; and

the interconnecting of the second integrated circuit die to the second interposer is via second fine pitch die-to-die interconnects of the plurality of components.