Sample chamber for laser ablation inductively coupled plasma mass spectroscopy
An improved sample chamber for laser assisted spectroscopy integrates valve mechanisms into the sample drawer, permitting the sample chamber to automatically bypass, purge and resume flow as the sample drawer is opened and closed to insert samples for processing. Integrating valve mechanisms into the sample drawer in this manner eliminates the need for external valves to be operated to bypass, purge and resume flow, thereby increasing system throughput and reducing system complexity.
1. A sample chamber system including a sample chamber having an access opening adapted to have an open position to allow insertion of a sample into said sample chamber and to have a closed position in which said sample chamber is closed in a sealing manner, said system comprising:
a first valve being configured to switch between open and closed states in direct dependence on change in position of the access opening such that said first valve is in the open state and a volume of said sample chamber is in gas flow communication with a source of a carrier gas when (1) the access opening is in transition between the closed position and the open position to cause outflow from the volume through the access opening, when (2) the access opening is in transition between the open position and the closed position to cause outflow from the volume through the access opening, and when (3) the access opening is in the closed position to provide the carrier gas over a sample in the sample chamber, and said first valve is in the closed state and the volume of the sample chamber is not in gas flow-communication with said source of a carrier gas when (1) the access opening is in the open position to permit placement of a sample in the sample chamber; and
a second valve being configured to switch between open and closed states in direct dependence on change in position of the access opening, such that said second valve is in the open state and said volume of said sample chamber is in gas flow communication with a spectral analysis location when (1) the access opening is in the closed position to provide gas flow from the sample chamber to the spectral analysis location, and said second valve is in the closed state and said volume is not in gas flow-communication with said spectral analysis location when (1) the access opening is in the open position, (2) the access opening is in transition between the closed position and the open position to prevent contamination of the spectral analysis location, and (3) the access opening is in transition between the open position and the closed position to prevent contamination of the spectral analysis location.
2. The system of claim 1 wherein said access opening is a door and corresponding doorway.
3. The system of claim 1 wherein said position dependence being a result of a mechanical relationship between said access opening and said first valve and said second valve.
4. The system of claim 3 , said mechanical relationship being a result of a mechanical actuator in mechanical communication between said access opening and said first valve and said second valve.
5. The system of claim 1 said position dependence being a result of an electrical actuator in mechanical communication with said first valve and said second valve, said electrical actuator providing a positional force based upon a position input signal, said signal being based upon said access opening position.
6. A sample chamber for holding a sample in a gas flow separate from room atmosphere having a gas inlet port, and a gas outlet port comprising;
an access port operative to permit access to said sample chamber and having first, second and third positions so that;
when said access port is in said first position, said access port is operative to direct said gas flow from said inlet port to said outlet port while preventing said room atmosphere from entering said outlet port thereby providing bypass flow;
when said access port is in said second position, said access port is operative to direct gas flow from said inlet port to said sample chamber and out through the access port while preventing said room atmosphere from entering said outlet port thereby providing purge flow; and
when said access port is in said third position, said access port is operative to direct said gas flow from said inlet port to said sample chamber and then to said outlet port thereby providing restored flow.
7. The sample chamber of claim 6 wherein the processing system is one of a laser ablation inductively coupled plasma mass spectroscope, a laser ablation inductively coupled plasma emission spectroscope or a matrix assisted laser desorption ionization time of flight spectroscope.
8. The sample chamber of claim 6 wherein said first position is open to allow placement of a sample in the sample chamber through the access port, said second position is partially open and said third position is closed to isolate the sample chamber from exposure to a room atmosphere.
9. The sample chamber of claim 6 wherein said gas flow is an inert gas.
10. The sample processing system of claim 9 wherein said inert gas is one of helium or argon.
11. The sample processing system of claim 6 wherein said gas flow is between 0.05 L/min and 1.0 L/min.