IP Library › Granted Patent US 8,711,263
Granted Patent B2
US 8,711,263 · App. 13/317,469 · Granted Apr 29, 2014

Solid-state imaging device and electronic apparatus with antireflection structure

Inventors: Kenju Nishikido (Kumamoto, JP); Kazunori Nagahata (Kumamoto, JP)
Assignee: Sony Corporation
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Quick Facts
Patent No.
US 8,711,263
App. No.
13/317,469
Granted
Apr 29, 2014
Kind
B2
Abstract

A solid-state imaging device includes a pixel region formed on a semiconductor substrate, an effective pixel region and a shielded optical black region in the pixel region, a multilayer wiring layer formed on a surface of the side opposite to a light incident side of the semiconductor substrate, a supporting substrate bonded to a surface of the multilayer wiring layer side, and an antireflection structure that is formed on the bonding surface side of the supporting substrate.

Claims (38)

1. A solid-state imaging device comprising:

a pixel region formed on a semiconductor substrate;

an effective pixel region and a shielded optical black region in the pixel region;

a multilayer wiring layer formed on a surface of the side opposite to a light incident side of the semiconductor substrate;

a supporting substrate bonded to a surface of the multilayer wiring layer side; and

an antireflection structure formed on the bonding surface side of the supporting substrate,

wherein the antireflection structure comprises:

a surface of the supporting substrate;

an insulating film of the surface side of the supporting substrate; and

a film disposed between the supporting substrate and the insulating film, and includes an intermediate refractive index between the refractive index of the supporting substrate and the refractive index of the insulating film.

2. A solid-state imaging device comprising:

a pixel region formed on a semiconductor substrate;

an effective pixel region and a shielded optical black region in the pixel region;

a multilayer wiring layer formed on a surface of the side opposite to a light incident side of the semiconductor substrate;

a supporting substrate bonded to a surface of the multilayer wiring layer side;

an antireflection structure formed on the bonding surface side of the supporting substrate,

wherein the antireflection structure comprises a moth-eye structure at the bonding surface side of the supporting substrate, and

a planarized film formed on the surface of the moth-eye structure, and

wherein the supporting substrate includes a silicon substrate, and

the multilayer wiring layer and the supporting substrate are bonded to each other between the planarized film and the multilayer wiring layer.

3. An electronic apparatus comprising:

a solid-state imaging device;

an optical system that introduces incident light to a photoelectric conversion portion of the solid-state imaging device; and

a signal processing circuit that processes an output signal of the solid-state imaging device,

the solid-state imaging device including a pixel region formed on a semiconductor substrate, an effective pixel region and a shielded optical black region in the pixel region, a multilayer wiring layer formed on a surface of the side opposite to a light incident side of the semiconductor substrate, a supporting substrate bonded to a surface of the multilayer wiring layer side, and an antireflection structure formed on the bonding surface side of the supporting substrate,

wherein the antireflection structure comprises:

a surface of the supporting substrate;

an insulating film of the surface side of the supporting substrate; and

a film disposed between the supporting substrate and the insulating film, and includes an intermediate refractive index between the refractive index of the supporting substrate and the refractive index of the insulating film.

4. An electronic apparatus comprising:

a solid-state imaging device;

an optical system that introduces incident light to a photoelectric conversion portion of the solid-state imaging device; and

a signal processing circuit that processes an output signal of the solid-state imaging device,

the solid-state imaging device including a pixel region formed on a semiconductor substrate, an effective pixel region and a shielded optical black region in the pixel region, a multilayer wiring layer formed on a surface of the side opposite to a light incident side of the semiconductor substrate, a supporting substrate bonded to a surface of the multilayer wiring layer side, and an antireflection structure formed on the bonding surface side of the supporting substrate,

wherein the antireflection structure comprises a moth-eye structure at the bonding surface side of the supporting substrate, and

a planarized film formed on the surface of the moth-eye structure, and

wherein the supporting substrate includes a silicon substrate, and

the multilayer wiring layer and the supporting substrate are bonded to each other between the planarized film and the multilayer wiring layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2011
From: NISHIKIDO, KENJU; NAGAHATA, KAZUNORI
To: SONY CORPORATION
Reel/Frame 027240/0578 →
Priority Claims (1)
JP 2010-254074 · Nov 12, 2010 · national
Continuity (1)
Related Publication 20120120294A1 · May 17, 2012