Method for multi-page programming a non-volatile memory device by simultaneously activating a plurality of selection lines based on programmed data

1. A method of programming a non-volatile memory device including a plurality of strings of transistors arranged in series, the plurality of strings arranged in rows and columns, the method comprising:

simultaneously activating all or a part of selection lines in one column at the same time depending upon data to be programmed;

driving a bit line corresponding to the one column with a bit line program voltage; and

repeating the activating and the driving until bit lines corresponding to all of the columns are driven.

2. The method of claim 1 , wherein each of the strings is a vertical string which is formed to be vertical to a substrate.

3. The method of claim 2 , wherein each of the vertical strings includes memory cell transistors, which are respectively controlled by corresponding word lines each formed on word line layers, and word lines on the same word line layer are connected electrically to each other.

4. The method of claim 3 , further comprising applying a program voltage to word lines of a selected word line layer at the same time.

5. The method of claim 4 , wherein the simultaneously activating the all or the part of the selection lines in the one column comprises:

judging a state to be programmed among states of data to be stored in memory cell transistors in each column;

activating selection lines corresponding to memory cell transistors of the state to be programmed; and

inactivating selection lines corresponding to memory cell transistors of remaining states other than the state to be programmed.

6. The method of claim 5 , further comprising judging whether the memory cell transistors of the state to be programmed are programmed to a required state,

wherein the judging whether the memory cell transistors of the state to be programmed are programmed to the required state includes performing a verify operation for the state to be programmed,

wherein the verify operation for the state to be programmed is made by applying a verify voltage for verifying the state to be programmed to the word lines, with rows of selection lines sequentially activated.

7. The method of claim 4 , wherein when a current program loop number is less than M, the activating the all or the part of the selection lines in the one column comprises judging a first state of states of data to be stored in memory cells in each column, activating selection lines corresponding to memory cell transistors of the first state, and inactivating selection lines corresponding to memory cell transistors of remaining states except for the first state.

8. The method of claim 7 , further comprising judging whether the memory cell transistors of the first state are programmed to a required state,

wherein the judging whether the memory cell transistors of the first state are programmed to the required state includes performing a verify operation for the first state,

wherein the verify operation for the first state is made by applying a verify voltage for verifying the first state to the word lines, with rows of selection lines sequentially activated.

9. The method of claim 7 , wherein when a current program loop number is more than M and less than N, the activating the all or the part of selection lines in the one column comprises judging first and second states of states of data to be stored in memory cells in each column, activating selection lines corresponding to memory cell transistors of the first and second states, and inactivating selection lines corresponding to memory cell transistors of remaining states other than the first and second states.

10. The method of claim 9 , further comprising determining whether the memory cell transistors of the first and second states are programmed to the required states.

11. The method of claim 10 , wherein the determining of whether the memory cell transistors of the first and second states are programmed to the required states comprises performing a verify operation for the first state and performing a verify operation for the second state,

wherein the verify operation for the first state is made by applying a verify voltage for verifying the first state to the word lines, with rows of selection lines sequentially activated, and the verify operation for the second state is made by applying a verify voltage for verifying the second state to the word lines, with the rows of the selection lines sequentially activated.

12. The method of claim 10 , wherein the determining of whether the memory cell transistors of the first and second states are programmed to the required states comprises:

continuously performing verify operations for the first and second states, with one of rows of the selection lines activated; and

repeating the continuously performing of the verify operations until the rows of the selection lines are all activated.

13. The method of claim 3 , further comprising charging channels of vertical strings connected with word lines of a selected word line layer, up to a bit line program-inhibit voltage.