High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials
The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
1. An X-ray scanning system for identifying material composition of an object being scanned comprising:
at least one X-ray source for projecting an X-ray beam on the object, at least a portion of the projected X-ray beam being transmitted through the object;
a first array of detectors, having a first speed, for measuring energy spectra of the transmitted X-rays and for generating a spectroscopic image having a first resolution;
a second array of detectors, having a second speed, for detecting said transmitted X-rays and generating a transmission image having a second resolution, wherein the first resolution is less than the second resolution and wherein the first speed is greater than the second speed; and
a processor for identifying the material composition of said object wherein said processor determines the material composition using said spectra.
2. The X-ray scanning system of claim 1 wherein said identification of the material composition comprises at least one of determining an atomic number of at least some material in said object, determining an atomic number range of at least some material in said object, or determining an areal density of at least some material in said object.
3. The X-ray scanning system of claim 1 wherein said processor determines the material composition using said spectra by:
receiving said energy spectra;
normalizing said energy spectra using a value; and
determining the material composition of the object based upon said normalized energy spectra and a plurality of known spectra.
4. The X-ray scanning system of claim 3 wherein said normalized energy spectra are compared to the plurality of known spectra and wherein the material composition is identified based upon said comparison.
5. The X-ray scanning system of claim 1 wherein the processor determines the material composition using said spectra and said transmission image.
6. The X-ray scanning system of claim 1 further comprising an array of collimated backscatter X-ray detectors for measuring energy spectra of X-rays scattered by the object at an angle greater than 90 degrees for detecting and measuring backscattered X-rays and generating backscatter data therefrom.
7. The X-ray scanning system of claim 6 wherein the processor determines the material composition using said spectra, said backscatter data, and said transmission image.
8. The X-ray scanning system of claim 1 wherein data generated from the second array of detectors is not subject to a spectroscopic analysis.
9. The X-ray scanning system of claim 8 wherein the processor determines the material composition using said spectra and said transmission image.
10. The X-ray scanning system of claim 1 wherein the at least one array of detectors is positioned behind, in front of, or to the side of the second array of detectors.
11. The X-ray scanning system as claimed in claim 1 wherein the at least one array of detectors comprises at least one of fast spectroscopic detectors, a scintillator material comprising plastic, a scintillator material comprising LaBr 3 (Lanthanum Bromide), or a scintillator material comprising LYSO (Lutetium Yttrium Ortho-Silicate).
12. The X-ray scanning system as claimed in claim 1 , wherein the X-ray beam has a pencil shape, fan shape, or conical shape.
13. The X-ray scanning system as claimed in claim 1 , wherein the X-ray source comprises at least one of a continuous X-ray source, pulsed X-ray source, intensity-modulated X-ray source, electron linear accelerator, or X-ray source having an energy level of 1 MeV or greater.
14. The X-ray scanning system of claim 1 wherein said processor determines the material composition using said spectra by:
receiving said energy spectra;
fitting at least one of said energy spectra to an expected energy spectrum, wherein said expected energy spectrum is at least one of a plurality of previously measured X-ray spectra generated by transmitting and detecting X-rays through known materials and correcting said detected X-rays to account for variations in detectors; and
identifying the material composition of the object based upon said fitting.
15. The X-ray scanning system of claim 14 wherein said processor generates a first estimate of said material composition based on at least one of said spectra of the transmitted X-rays and not based on said fitting.
16. The X-ray scanning system of claim 14 wherein said processor identifies the material composition of the object by minimizing differences between at least one of said spectra of the transmitted X-rays and said expected energy spectrum.
17. The X-ray scanning system of claim 14 wherein each of said expected energy spectra is specific to a particular material.