Low power and soft error hardened dual edge triggered flip flop
A dual edge triggered flip flop can pass data values on a clock rising or falling edge. The dual edge triggered flip flop can be operated at half the clock speed of a single edge triggered flip flop and produce substantially the same throughput. The dual edge triggered flip flop may use less power than a single edge triggered flip flop due at least in part to the construction of an intermediate gate as a data interlock gate. The dual edge triggered flip flop may contain a plurality of master nodes, and is soft error hardened compared to a single edge triggered flip flop.
1. A flip-flop apparatus comprising:
a first and second data transfer gate, wherein the first data transfer gate is operable to open when a clock signal is high, and the second data transfer gate is operable to open when the clock signal is low, the data transfer gates comprising a pair of transistors, wherein the data transfer gates are operable to pass a data value along an input to a respective first and second storage node when the respective first and second data transfer gates are open;
wherein each of the first and second storage nodes are comprised of a pair of inverters coupled in series in a feedback loop, such that the output of a first inverter of the pair of inverters is coupled to the input of a second inverter of the pair of inverters, and the output of the second inverter is coupled to the input of the first inverter,
wherein the input to each storage node is also coupled to the input of the first inverter and the output of the second inverter, and is further coupled to an output line from the storage node to a first and second pass-through gate,
wherein the output line from each storage node is operable to provide an output value to the first pass-through gate and an inverted output value to the second pass-through gate; and
wherein the pass-through gates are operable to open to pass a value to a data output when the output lines from both storage nodes provide the same value, wherein the first pass-through gate is operable to open if both storage nodes are storing a high value, and wherein the second pass-through gate is operable to open if both storage nodes are storing a low value, wherein both pass-through gates operate independent of a value of the clock signal.