IP Library Granted Patent US 8,758,067
Granted Patent B2
US 8,758,067 · App. 13/412,870 · Granted Jun 24, 2014

Selective metalization of electrical connector or socket housing

Inventor: James Rathburn (Mound, MN)
Assignee: Hsio Technologies, LLC
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Quick Facts
Patent No.
US 8,758,067
App. No.
13/412,870
Granted
Jun 24, 2014
Kind
B2
Abstract

A electrical interconnect adapted to provide an interface between contact pads on an IC device and a PCB. The electrical interconnect includes a multi-layered substrate with a first surface with a plurality of first openings having first cross-sections, a second surface with a plurality of second openings having second cross-sections, and center openings connecting the first and second openings. The center openings include at least one cross-section greater than the first and second cross-sections. A plurality of spring probe contact members are located in the center openings. The contact members include first contact tips extending through the first opening and above the first surface, second contact tips extending through the second openings and above the second surface, and center portions located in the center openings. The center portions include a shape adapted to bias the first and second contact tips toward the IC device and PCB, respectively. A dielectric material different from the material of the substrate is located in at least one of the first opening, the second opening, or the center opening.

Claims (33)

1. An electrical interconnect adapted to provide an interface between contact pads on an IC device and a PCB, the electrical interconnect comprising:

a multi-layered substrate including a plurality of dielectric layers comprising a plurality of first openings with first dielectric surfaces having first cross-sections, a plurality of second openings with second dielectric surfaces having second cross-sections, and a plurality of center openings with center dielectric surfaces connecting the first and second openings, the center openings comprising at least one cross-section greater than the first and second cross-sections;

a metalizing layer formed on at least one of the first dielectric surface, the second dielectric surface, or the center dielectric surface;

a spring probe contact members located in a plurality of the center openings, the contact members comprising first contact tips extending through the first opening and above the first surface, second contact tips extending through the second openings and above the second surface, and center portions located in the center openings, the center portions of the contact members comprise a shape adapted to bias the first and second contact tips toward the IC device and PCB, respectively; and

a dielectric material located on the metalizing layer that insulates the contact members from the metalizing layer.

2. The electrical interconnect of claim 1 wherein the center opening comprises a non-moldable feature.

3. The electrical interconnect of claim 1 wherein at least two of the layers of the substrate comprise different materials.

4. The electrical interconnect of claim 1 comprising metalized layers formed between layers in the substrate that electrically shield the contact members.

5. The electrical interconnect of claim 1 wherein the dielectric material located on the metalizing layer is different from the material of the substrate.

6. The electrical interconnect of claim 1 wherein the metalizing layer is oriented generally parallel to the contact member.

7. The electrical interconnect of claim 1 wherein the multilayered substrate comprises at least one additional circuitry plane selected from one of a ground plane, a power plane, an electrical connection to other circuit members, a dielectric layer, or a flexible circuit.

8. The electrical interconnect of claim 1 comprising at least one electrical device printed on the substrate and electrically coupled to at least a one of the contact members.

9. An electrical interconnect assembly comprising:

a housing that retains the electrical interconnect of claim 1 ;

an IC device located in an openings in the housing and electrically coupled to the first contact tips of the contact members; and

a PCB electrically coupled to the second contact tips of the contact members.

10. A method of making an electrical interconnect adapted to provide an interface between contact pads on an IC device and a PCB, the method comprising the steps of:

forming a multi-layered substrate including a plurality of dielectric layers comprising a plurality of first openings with first dielectric surfaces having first cross-sections, a plurality of second openings with second dielectric surfaces having second cross-sections, and a plurality of center openings with center dielectric surfaces connecting the first and second openings, the center openings comprising at least one cross-section greater than the first and second cross-sections;

metalizing at least one of the first dielectric surface, the second dielectric surface, or the center dielectric surface;

locating a spring probe contact members in a plurality of the center openings so first contact tips of the contact members extend through the first opening and above the first surface, second contact tips extending through the second openings and above the second surface, and center portions located in the center openings bias the first and second contact tips toward the IC device and PCB, respectively; and

forming a dielectric material on the metalizing layer that insulates the contact members from the metalizing layer.

11. The method of claim 10 comprising forming the center opening as a non-moldable feature.

12. The method of claim 10 comprising selecting at least two different materials for the layers of the substrate.

13. The method of claim 10 comprising forming a metal layers between layers in the substrate that electrically shield the contact members.

14. The method of claim 10 wherein the dielectric material located on the metalizing layer is different from the material of the substrate.

15. The method of claim 10 wherein the metalizing layer is oriented generally parallel to the contact member.

16. The method of claim 10 comprising forming at least one additional circuitry plane between layers of the substrate, the additional circuitry plane selected from one of a ground plane, a power plane, an electrical connection to other circuit members, a dielectric layer, or a flexible circuit.

17. The method of claim 10 comprising printing at least one electrical device on the substrate and electrically coupling the electrical device to at least a one of the contact members.

18. A method of making an electrical interconnect assembly comprising the steps of:

locating the electrical interconnect of claim 10 in a housing;

locating an integrated circuit device in the openings in the housing;

electrically coupling the first contact tips of the contact members with the integrated circuit device; and

electrically coupling the second contact tips of the contact members with the PCB.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2023
From: HSIO TECHNOLOGIES, LLC
To: LCP MEDICAL TECHNOLOGIES, LLC
Reel/Frame 065391/0193 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2012
From: RATHBURN, JAMES
To: HSIO TECHNOLOGIES, LLC
Reel/Frame 027811/0686 →
Continuity (6)
Continuation In Part PCTUS2011038845 · Jun 2, 2011
Continuation In Part PCTUS2011062313 · Nov 29, 2011
Provisional Application 61449889 · Mar 7, 2011
Provisional Application 61418625 · Dec 1, 2010
Provisional Application 61351114 · Jun 3, 2010
Related Publication 20120171907A1 · Jul 5, 2012