IP Library Granted Patent US 8,759,148
Granted Patent B2
US 8,759,148 · App. 13/836,706 · Granted Jun 24, 2014

Method of mounting semiconductor chips, semiconductor device obtained using the method, method of connecting semiconductor chips, three-dimensional structure in which wiring is provided on its surface, and method of producing the same

Inventors: Shingo Yoshioka (Osaka, JP); Hiroaki Fujiwara (Nara, JP)
Assignee: Panasonic Corporation
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Quick Facts
Patent No.
US 8,759,148
App. No.
13/836,706
Granted
Jun 24, 2014
Kind
B2
Abstract

A method of mounting a semiconductor chip includes: forming a resin coating on a surface of a path connecting a bonding pad on a surface of a semiconductor chip and an electrode pad formed on a surface of an insulating base material; forming, by laser beam machining, a wiring gutter having a depth that is equal to or greater than a thickness of the resin coating along the path for connecting the bonding pad and the electrode pad; depositing a plating catalyst on a surface of the wiring gutter; removing the resin coating; and forming an electroless plating coating only at a site where the plating catalyst remains.

Claims (36)

1. A method of mounting a semiconductor chip for electrically connecting a bonding pad, which is provided on a surface of a semiconductor chip disposed on an insulating base material surface, to an electrode pad corresponding to the bonding pad formed on the insulating base material surface, the method comprising:

forming a resin coating on a surface of a path connecting the bonding pad and the electrode pad;

forming, by laser beam machining, a wiring gutter having a depth that is equal to or greater than a thickness of the resin coating along the path for connecting the bonding pad and the electrode pad;

depositing a plating catalyst or a precursor of the plating catalyst on a surface of the wiring gutter;

removing the resin coating by dissolving or swelling the resin coating in a predetermined liquid; and

forming, after the resin coating is removed, an electroless plating coating only at a site where the plating catalyst or a plating catalyst formed from the plating catalyst precursor remains.

2. The method of mounting a semiconductor chip according to claim 1 , further comprising using the formed electroless plating coating as an electrode and performing electrolytic plating in order to thicken a circuit.

3. The method of mounting a semiconductor chip according to claim 1 , wherein the resin coating contains a fluorescent substance, and

the method further comprising inspecting a coating removal failure by using emission of light from the fluorescent substance after the removing of the resin coating and before the forming of the electroless plating coating.

4. The method of mounting a semiconductor chip according to claim 1 , wherein the thickness of the resin coating is 10 μm or less.

5. The method of mounting a semiconductor chip according to claim 1 , wherein the resin coating comprises swellable resin that can be peeled as a result of being swelled in the predetermined liquid.

6. The method of mounting a semiconductor chip according to claim 1 , wherein the resin coating is formed by applying and subsequently drying a suspension or an emulsion of an elastomer on the insulating base material surface.

7. The method of mounting a semiconductor chip according to claim 1 , wherein the resin coating is formed by transferring a swellable resin coating formed on a support base material to the insulating base material surface.

8. A semiconductor device, wherein a semiconductor chip is mounted on an insulating base material surface by using the mounting method according to claim 1 .

9. A method of connecting semiconductor chips for mutually and electrically connecting bonding pads provided to a plurality of semiconductor chips disposed on an insulating base material surface, the method comprising:

forming a resin coating on a surface of a path connecting a bonding pad formed on a first semiconductor chip and a bonding pad formed on a second semiconductor chip;

forming, by laser beam machining, a wiring gutter having a depth that is equal to or greater than a thickness of the resin coating along the path;

depositing a plating catalyst or a precursor of the plating catalyst on a surface of the wiring gutter;

removing the resin coating by dissolving or swelling the resin coating in a predetermined liquid; and

forming, after the resin coating is removed, an electroless plating coating only at a site where the plating catalyst or a plating catalyst formed from the plating catalyst precursor remains.

10. A method of producing a three-dimensional structure in which a wiring is formed on a surface, the method comprising:

coating, with insulating resin, at least one of a semiconductor chip and a passive element, the at least one of the semiconductor chip and the passive element being disposed on an insulating base material;

forming a resin coating on a surface of the insulating resin or on a surface of the insulating base material;

forming, by performing laser beam machining from an outer surface side of the insulating resin or an outer surface side of the insulating base material, a wiring gutter which has a depth that is greater than a thickness of the resin coating and which is in communication with one end of a connection line in which the other end leads to a bonding pad of the semiconductor chip, a wiring gutter which is in communication with one end of an interconnect line in which the other end leads to the semiconductor chip or the passive element, a wiring gutter including a communication hole leading to the bonding pad of the semiconductor chip, or a wiring gutter including a connection hole leading to the semiconductor chip or the passive element;

depositing a plating catalyst or a precursor of the plating catalyst on a surface of the wiring gutter;

removing the resin coating by dissolving or swelling the resin coating in a predetermined liquid; and

forming, after the resin coating is removed, an electroless plating coating only at a site where the plating catalyst or a plating catalyst formed from the plating catalyst precursor remains.

11. The method of producing a three-dimensional structure according to claim 10 , wherein, in the resin coating, the at least one of the semiconductor chip and the passive element that is mounted on the insulating base material, is coated with the insulating resin.

12. A method of producing a three-dimensional structure in which a wiring is formed on a surface, the method comprising:

coating, with insulating resin, at least one of a semiconductor chip and a passive element, the at least one of the semiconductor chip and the passive element not disposed on an insulating base material;

forming a resin coating on a surface of the insulating resin;

forming, by performing laser beam machining from an outer surface side of the insulating resin, a wiring gutter which has a depth that is greater than a thickness of the resin coating and which is in communication with one end of a connection line in which the other end leads to a bonding pad of the semiconductor chip, a wiring gutter which is in communication with one end of an interconnect line in which the other end leads to the semiconductor chip or the passive element, a wiring gutter including a communication hole leading to the bonding pad of the semiconductor chip, or a wiring gutter including a connection hole leading to the semiconductor chip or the passive element;

depositing a plating catalyst or a precursor of the plating catalyst on a surface of the wiring gutter;

removing the resin coating by dissolving or swelling the resin coating in a predetermined liquid; and

forming, after the resin coating is removed, an electroless plating coating only at a site where the plating catalyst or a plating catalyst formed from the plating catalyst precursor remains.

13. The method of producing a three-dimensional structure according to claim 12 , wherein, in the resin coating, the at least one of the semiconductor chip and the passive element that is not mounted on an insulating base material, is coated with the insulating resin.

Priority Claims (2)
JP 2009-015052 · Jan 27, 2009 · national
JP 2009-253131 · Nov 4, 2009 · national
Continuity (2)
Division 13144112
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