Selective shielding for multiple exposure masks
A system for preparing mask data to create a desired layout pattern on a wafer with a multiple exposure photolithographic printing system. In one embodiment, boundaries of features are expanded to create shields for those features, or portions thereof, that are not oriented in a direction that are printed with greater fidelity by an illumination pattern used in the multiple exposure printing system.
1. A method of preparing data for a mask for printing a target pattern on a wafer with a photolithographic process, comprising:
by a computer, receiving modified data from a remote computer, wherein the modified data represents a number of polygons that define a target pattern of illumination features to be printed on the wafer with the mask, and wherein one or more of the polygons defining illumination features oriented in a first direction are expanded in the target pattern associated with the received modified data, and one or more of the polygons defining illumination features oriented in a second direction are not expanded in the target pattern associated with the received modified data.
2. The method of claim 1 , further comprising transmitting the mask data for printing the target pattern to the remote computer, wherein the modified data is generated by the remote computer.
3. The method of claim 1 , wherein at least one of the polygons defining features oriented in the first direction is modified by optical and process correction (OPC).
4. The method of claim 3 , wherein at least one of the polygons modified by the optical and process correction (OPC) has one or more line ends extended.
5. The method of claim 1 , wherein the polygons defining features oriented in a first direction are expanded outwardly by a substantially identical amount.
6. The method of claim 1 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask; and
the method further comprises receiving modified data for a second mask from a remote computer, wherein:
the modified data for the second mask represents a number of polygons that define a target pattern of features to be printed on the wafer with the second mask, and
the polygons defining features oriented in the second direction are expanded in the modified data for the second mask and the polygons defining features oriented in the first direction are not expanded in the modified data for the second mask.
7. The method of claim 1 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask;
the method further comprises receiving modified data for a second mask from a remote computer;
wherein the target pattern of features includes polygons defining features that are oriented in both the first direction and the second direction; and
the polygons defining the features that are not oriented in either the first direction or the second direction are expanded in the modified data for the first mask and are expanded in the modified data for the second mask.
8. The method of claim 1 , further comprising manufacturing a mask using the modified data.
9. The method of claim 1 , further comprising manufacturing a circuit using the modified data.
10. The method of claim 1 , wherein at least one of the polygons defining features oriented in the first direction is modified by a resolution enhancement technique.
11. One or more computer-readable storage media storing a sequence of program instructions that causes a computer to perform a method, the method comprising:
receiving modified data from a remote computer, the modified data representing a number of polygons that define a target pattern of illumination features to be printed on a wafer with a mask, wherein one or more of the polygons defining illumination features oriented in a first direction are expanded in the target pattern associated with the received modified data, and one or more of the polygons defining illumination features oriented in a second direction are not expanded in the target pattern associated with the received modified data.
12. The computer-readable storage media of claim 11 , wherein the method further comprises transmitting mask data for printing the target pattern to the remote computer, wherein the modified data is generated by the remote computer.
13. The computer-readable storage media of claim 11 , wherein the polygons defining features oriented in a first direction are expanded outwardly by a substantially identical amount.
14. The computer-readable storage media of claim 11 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask; and
the method further comprises receiving modified data for a second mask from a remote computer, wherein:
the modified data for the second mask represents a number of polygons that define a target pattern of features to be printed on the wafer with the second mask, and
the polygons defining features oriented in the second direction are expanded in the modified data for the second mask and the polygons defining features oriented in the first direction are not expanded in the modified data for the second mask.
15. The computer-readable storage media of claim 1 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask;
the method further comprises receiving modified data for a second mask from a remote computer;
wherein the target pattern of features includes polygons defining features that are oriented in both the first direction and the second direction; and
the polygons defining the features that are not oriented in either the first direction or the second direction are expanded in the modified data for the first mask and are expanded in the modified data for the second mask.
16. A method of preparing data for a mask for printing a target pattern on a wafer with a photolithographic process, comprising:
by a computer, receiving modified data from a remote computer, wherein the modified data represents a number of polygons that define a target pattern of illumination features to be printed on the wafer with the mask, and wherein polygons defining illumination features oriented in a first direction have edges that have been outwardly expanded in the target pattern associated with the received modified data, and polygons defining illumination features oriented in a second direction have edges that have not been outwardly expanded in the target pattern associated with the received modified data.
17. The method of claim 16 , further comprising transmitting the mask data for printing the target pattern to the remote computer, wherein the modified data is generated by the remote computer.
18. The method of claim 16 , wherein at least one of the polygons defining features oriented in the first direction has one or more edges that have been modified by optical and process correction (OPC).
19. The method of claim 18 , wherein at least one of the polygons modified by the optical and process correction (OPC) has one or more line ends extended.
20. The method of claim 16 , wherein the expanded edges are expanded outwardly by a substantially identical amount.
21. The method of claim 16 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask; and
the method further comprises receiving modified data for a second mask from a remote computer, wherein:
the modified data for the second mask represents a number of polygons that define a target pattern of features to be printed on the wafer with the second mask, and
the polygons defining features oriented in the second direction have edges that have been outwardly expanded in the modified data for the second mask.
22. The method of claim 16 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask;
the method further comprises receiving modified data for a second mask from a remote computer;
wherein the target pattern of features includes polygons defining features that are oriented in both the first direction and the second direction; and
the polygons defining the features that are not oriented in either the first direction or the second direction have edges that have been outwardly expanded in the modified data for the first mask and have edges that have been outwardly expanded in the modified data for the second mask.
23. The method of claim 16 , further comprising manufacturing a mask using the modified data.
24. The method of claim 16 , further comprising manufacturing a circuit using the modified data.
25. The method of claim 16 , wherein at least one of the polygons defining features oriented in the first direction has one or more edges that have been modified by a resolution enhancement technique.
26. One or more computer-readable storage media storing a sequence of program instructions that causes a computer to perform a method, the method comprising:
receiving modified data from a remote computer, wherein the modified data represents a number of polygons that define a target pattern of illumination features to be printed on a wafer with a mask, and wherein polygons defining illumination features oriented in a first direction have edges that have been outwardly expanded in the target pattern associated with the received modified data, and polygons defining illumination features oriented in a second direction have edges that have not been outwardly expanded in the target pattern associated with the received modified data.
27. The computer-readable storage media of claim 26 , wherein the method further comprises transmitting the mask data for printing the target pattern to the remote computer, wherein the modified data is generated by the remote computer.
28. The computer-readable storage media of claim 26 , wherein the expanded edges are expanded outwardly by a substantially identical amount.
29. The computer-readable storage media of claim 26 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask; and
the method further comprises receiving modified data for a second mask from a remote computer, wherein:
the modified data for the second mask represents a number of polygons that define a target pattern of features to be printed on the wafer with the second mask, and
the polygons defining features oriented in the second direction have edges that have been outwardly expanded in the modified data for the second mask.
30. The computer-readable storage media of claim 26 , wherein:
the mask is a first mask;
the modified data is modified data for the first mask;
the method further comprises receiving modified data for a second mask from a remote computer;
wherein the target pattern of features includes polygons defining features that are oriented in both the first direction and the second direction; and
the polygons defining the features that are not oriented in either the first direction or the second direction have edges that have been outwardly expanded in the modified data for the first mask and have edges that have been outwardly expanded in the modified data for the second mask.
31. A method, comprising:
by a computer:
transmitting data for a target pattern of illumination features to be printed on a wafer with a mask to a remote computer; and
receiving modified data from the remote computer, wherein:
the modified data represents the target pattern of illumination features,
one or more of the illumination features oriented in a first direction are expanded in the target pattern associated with the received modified data, and
one or more of the illumination features oriented in a second direction are not expanded in the target pattern associated with the received modified data.
32. The method of claim 31 , wherein the modified data for the features is defined as a plurality of polygons.
33. The method of claim 31 , wherein the modified data for the features is defined as a plurality of edges.