IP Library › Granted Patent US 8,786,693
Granted Patent B2
US 8,786,693 · App. 12/912,204 · Granted Jul 22, 2014

Microscope system and method of controlling a microscope system

Inventors: Nobuhiro Kihara (Kanagawa, JP); Kiyoshi Osato (Chiba, JP); Koichiro Kishima (Kanagawa, JP)
Assignee: Sony Corporation
G02B21/365G02B21/006G02B27/0025G02B21/34
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,786,693
App. No.
12/912,204
Granted
Jul 22, 2014
Kind
B2
Abstract

A microscope system includes an accommodation unit, a stage, an optical system, an image pickup unit, a movement mechanism, a control unit, an image processing unit, and a display unit. The accommodation unit is capable of accommodating a plurality of specimens. On the stage, each of the specimens loaded from the accommodation unit is placed. The optical system includes a lens for spherical aberration correction. The image pickup unit is capable of capturing a partial image of each of the specimens placed on the stage, via the optical system. The movement mechanism moves the lens for spherical aberration correction along an optical axis. The control unit controls movement of the lens for spherical aberration correction by the movement mechanism and correct spherical aberration. The image processing unit combines the partial images captured by the image pickup unit and generate a composite image. The display unit displays the generated composite image.

Claims (33)

1. A microscope system, comprising:

an accommodation unit capable of accommodating a plurality of specimens;

a stage on which each of the specimens loaded from the accommodation unit is placed;

an optical system including a lens for spherical aberration correction;

an image pickup unit capable of capturing a partial image of each of the specimens placed on the stage, via the optical system;

a movement mechanism to move the lens for spherical aberration correction along an optical axis;

a control unit to control movement of the lens for spherical aberration correction by the movement mechanism and correct spherical aberration;

an image processing unit to combine the partial images captured by the image pickup unit and generate a composite image;

a display unit to display the generated composite image;

a microscope tube including the optical system;

a movement unit to move at least one of the microscope tube and the stage along the optical axis; and

a distance measurement unit,

wherein the control unit calculates a first distance between an upper surface of each of the specimens and a focus position of the optical system, and controls the movement mechanism to move the lens for spherical aberration correction in accordance with the first distance,

wherein the distance measurement unit measures a second distance between a predetermined position on a microscope tube side and the upper surface of each of the specimens, and

wherein the control unit executes focusing by controlling the movement unit and calculates the first distance based on information of the second distance obtained from the distance measurement unit at a time when focus is obtained.

2. The microscope system according to claim 1 , wherein the control unit moves the lens for spherical aberration correction such that a distance between the focus position of the optical system and an image-forming position is kept constant.

3. The microscope system according to claim 1 , further comprising

a pre-scan unit to pre-scan each of the specimens before the image pickup unit captures the partial image of each of the specimens,

wherein the control unit calculates the first distance based on information obtained by the pre-scan unit.

4. The microscope system according to claim 1 , further comprising

a thickness measurement unit to measure a thickness of each of the specimens,

wherein the control unit calculates the first distance based on information of the thickness of each of the specimens.

5. The microscope system according to claim 1 ,

wherein the control unit executes focusing of a through-the-lens system.

6. A method of controlling a microscope system, comprising:

loading a specimen from an accommodation unit capable of accommodating a plurality of specimens and placing the specimen on a stage;

correcting spherical aberration by control of a movement mechanism that moves a lens for spherical aberration correction along an optical axis of a microscope tube including an optical system including the lens for spherical aberration correction, the correction of spherical aberration including

calculating a first distance between an upper surface of each of the specimens and a focus position of the optical system, and controlling the movement mechanism to move the lens for spherical aberration correction in accordance with the first distance,

measuring a second distance between a predetermined position on a microscope tube side and the upper surface of each of the specimens, and

executing focusing by controlling the movement unit and calculating the first distance based on information of the second distance obtained from the distance measurement unit at a time when focus is obtained;

acquiring information of a partial image of the specimen placed on the stage from an image pickup unit that is capable of capturing the partial image via the optical system;

generating a composite image based on the information of the partial image; and

displaying the generated composite image on a display unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2010
From: KIHARA, NOBUHIRO; OSATO, KIYOSHI; KISHIMA, KOICHIRO
To: SONY CORPORATION
Reel/Frame 025232/0866 →
Priority Claims (1)
JP P2009-252378 · Nov 2, 2009 · national
Continuity (1)
Related Publication 20110102572A1 · May 5, 2011