IP Library Granted Patent US 8,791,562
Granted Patent B2
US 8,791,562 · App. 13/183,645 · Granted Jul 29, 2014

Stack package and semiconductor package including the same

Inventors: Chung-sun Lee (Gunpo-si, KR); Jung-Hwan Kim (Bucheon-si, KR); Yun-hyeok Im (Yongin-si, KR); Ji-hwan Hwang (Asan-si, KR); Hyon-chol Kim (Hwaseong-si, KR); Kwang-chul Choi (Suwon-si, KR); Eun-kyoung Choi (Bucheon-si, KR); Tae-hong Min (Gumi-si, KR)
Assignee: SAMSUNG Electronics Co., Ltd.
H01L25/0657H01L2225/107H01L2924/01019H01L2924/15311H01L25/0655H01L2924/09701H01L2225/1094H01L2224/73265H01L2224/32225H01L2224/48227H01L2924/3511H01L2224/32245H01L2224/0557H01L2224/16145H01L2224/32145H01L25/105H01L2924/01087H01L2224/97H01L2224/73204H01L2924/15331H01L2225/1023H01L2224/73253H01L2225/06565H01L2924/18161H01L24/97H01L2224/16225
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Quick Facts
Patent No.
US 8,791,562
App. No.
13/183,645
Filed
Jul 15, 2011
Granted
Jul 29, 2014
Kind
B2
Examiner
LAM, CATHY N
Art Unit
2811
USPC
257/698
Abstract

A stack package usable in a three-dimensional (3D) system-in-package (SIP) includes a first semiconductor chip, a second semiconductor chip, and a supporter. The first semiconductor chip includes a through silicon via (TSV), and the second semiconductor chip is stacked on the first semiconductor chip and is electrically connected to the first semiconductor chip through the TSV of the first semiconductor chip. The supporter is attached onto the first semiconductor chip so as to be spaced apart from an edge of the second semiconductor chip.

Claims (40)

1. A stack package comprising:

a first semiconductor chip comprising a through silicon via (TSV);

a second semiconductor chip that is stacked on a first surface of the first semiconductor chip and is electrically connected to the first semiconductor chip through the TSV of the first semiconductor chip;

a supporter that is attached onto the first surface of the first semiconductor chip so as to be spaced apart from an edge of the second semiconductor chip; and

a molding member that covers an upper surface of the first semiconductor chip so as to seal the second semiconductor chip and the supporter,

wherein the supporter comprises a material having a Young's modulus greater than a Young's modulus of the molding member and smaller than a Young's modulus of the first semiconductor chip.

2. The stack package of claim 1 , wherein the supporter has a ring shape surrounding the edge of the second semiconductor chip.

3. The stack package of claim 1 , wherein the supporter comprises a bar-shaped portion that extends along at least a portion of a lateral surface of the second semiconductor chip.

4. The stack package of claim 1 , wherein the supporter comprises a corner reinforcing portion that is bent so as to correspond to a corner of the second semiconductor chip. Zone Name: OCRZone

5. The stack package of claim 1 , wherein an upper surface of the second semiconductor chip and an upper surface of the supporter are disposed at the same layer level, and

wherein the molding member exposes the upper surface of the second semiconductor chip and the upper surface of the supporter.

6. The stack package of claim 5 , further comprising:

a thermal interface material layer disposed on the upper surface of the second semiconductor layer; and

a head spreader disposed on the thermal interface material layer.

7. The stack package of claim 6 , further comprising a solder layer that is interposed between the supporter and the heat spreader so as to fix the supporter and the heat spreader to each other.

8. The stack package of claim 1 , wherein the first semiconductor chip comprises a heat dissipation through silicon via (TSV) that is connected to the supporter so that heat is transferred between the supporter and the heat dissipation TSV.

9. The stack package of claim 1 , wherein the second semiconductor chip comprises a plurality of semiconductor chips stacked on each other.

10. A semiconductor package comprising:

a first substrate;

a first semiconductor chip installed on the first substrate and comprising a through silicon via (TSV);

a second semiconductor chip that is stacked on a first surface of the first semiconductor chip and is electrically connected to the first semiconductor chip through the TSV of the first semiconductor chip;

a supporter that is attached onto the first surface of the first semiconductor chip to be spaced apart from an edge of the second semiconductor chip; and

an internal molding member that covers an upper surface of the first semiconductor chip to seal the second semiconductor chip and the supporter,

wherein the supporter comprises a material having a Young's modulus greater than a Young's modulus of the internal molding member and smaller than a Young's modulus of the first semiconductor chip.

11. A stack package comprising:

a first semiconductor chip;

a second semiconductor chip disposed on a first area of a first surface of the first semiconductor chip and electrically connected to the first semiconductor chip;

a supporter disposed on a second area of the first surface of the first semiconductor chip to protect the first semiconductor chip; and

a molding member that covers an upper surface of the first semiconductor chip so as to seal the second semiconductor chip and the supporter,

wherein the supporter comprises a material having a Young's modulus greater than a Young's modulus of the molding member and smaller than a Young's modulus of the first semiconductor chip.

12. The stack package of claim 11 , wherein the first area is spaced apart from the second area by a distance shorter than a height or a width of the supporter.

13. The stack package of claim 11 , wherein the second semiconductor comprises a memory unit to store and read data, and the first semiconductor comprises a circuit device to process the read data and the data to be stored in the memory unit.

14. The stack package of claim 11 , wherein the first semiconductor chip comprises a through silicon via (TSV) formed therein to provide an electrical communication between a first side on which the second semiconductor chip is disposed and a second side on which a bump is formed to provide another communication between an external device and at least one of the first semiconductor chip and the second semiconductor chip through the TSV.

15. The stack package of claim 11 , wherein the first semiconductor chip comprises:

a first through silicon via (TSV) formed in the first area and formed of an conductive material to electrically connect the first semiconductor chip and the second semiconductor chip; and

a second through silicon via (TSV) formed in the second area and formed of a heat dissipating material to thermally connect the supporter and an outside thereof.

16. The stack package of claim 11 , further comprising:

the molding member to cover at least a portion of the supporter, the first semiconductor chip, and the second semiconductor chip,

wherein the supporter is spaced apart from a lateral surface of the second semiconductor chip by a first distance, spaced apart from an external surface of the molding member by a second distance, and has a width wider than at least one of the first distance and the second distance.

17. The stack package of claim 11 , wherein the supporter has a height from the first semiconductor chip to correspond to a height of the second semiconductor chip from the first semiconductor chip.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2011
From: LEE, CHUNG-SUN; KIM, JUNG-HWAN; IM, YUN-HYEOK; HWANG, JI-HWAN; KIM, HYON-CHOL; CHOI, KWANG-CHUL; CHOI, EUN-KYOUNG; MIN, TAE-HONG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 026598/0009 →
Priority Claims (1)
KR 10-2010-0070471 · Jul 21, 2010 · national
Continuity (1)
Related Publication 20120018871A1 · Jan 26, 2012