Hardware verification using acceleration platform
A method includes executing a first post-silicon testing program by a reference model. During the execution of the first post-silicon testing program, one or more test-cases are generated. The first post-silicon testing program is executed in an offline generation mode. During execution of the first post-silicon testing program each test case is generated in a different memory location. After the execution, generating a second post-silicon testing program that is configured to execute the one or more test-cases. The method further includes executing the second post-silicon testing program on an acceleration platform.
1. A computer-implemented method comprising:
executing a first post-silicon testing program by a reference model, wherein during said executing the first post-silicon testing program one or more test-cases are generated, wherein said first post-silicon testing program is executed in an offline generation mode, in which said generating is performed, wherein during said executing of the first post-silicon testing program each test case is generated in a different memory location;
generating a second post-silicon testing program that is configured to execute the one or more test-cases; and
executing the second post-silicon testing program on an acceleration platform.
2. The computer-implemented method of claim 1 , wherein said executing the first post-silicon testing program is performed off-platform by a computer having a processor and memory.
3. The computer-implemented method of claim 1 , wherein said second post-silicon testing program is configured to check consistency of results of executing the one or more test cases.
4. The computer-implemented method of claim 1 ,
wherein during said executing the first post-silicon testing program expected results are determined,
wherein said second post-silicon testing program is configured to check results of executing the one or more test cases with the expected results according to the reference model.
5. The computer-implemented method of claim 1 , wherein during said executing of the first post-silicon testing program results of each test case are stored in a different memory location.
6. The computer-implemented method of claim 5 , wherein said executing the second post-silicon program is performed by pointing to memory locations associated with the one or more test cases.
7. The computer-implemented method of claim 1 , wherein said executing the second post-silicon testing program comprises: selecting a test case to be executed, executing the test case, and checking results of executing the test case.
8. A computerized apparatus having a processor, the processor being adapted to perform the steps of:
executing a first post-silicon testing program by a reference model, wherein during said executing the first post-silicon testing program one or more test cases are generated, wherein said first post-silicon testing program is executed in an offline generation mode, in which said generating is performed, wherein during said executing of the first post-silicon testing program each test case is generated in a different memory location;
generating a second post-silicon testing program that is configured to execute the one or more test cases; and
wherein said computerized apparatus is operatively coupled to an acceleration platform which is configured to execute the second post-silicon testing program.
9. The computerized apparatus of claim 8 , wherein said second post-silicon testing program is configured to check consistency of results of executing the one or more test cases.
10. The computerized apparatus of claim 8 ,
wherein during said executing the first post-silicon testing program expected results are determined,
wherein said second post-silicon testing program is configured to check results of executing the one or more test cases with the expected results according to the reference model.
11. The computerized apparatus of claim 8 , wherein during said executing of the first post-silicon testing program results of each test case are stored in a different memory location.
12. The computerized apparatus of claim 11 , wherein said acceleration platform is configured to execute the one or more test cases based on a direction by the second post-silicon program to point to memory locations associated with the one or more test cases.
13. The computerized apparatus of claim 8 , wherein the second post-silicon testing program is configured to cause said acceleration platform to perform the steps of: selecting a test case to be executed, executing the test case, and checking results of executing the test case.
14. A computer program product comprising a non-transitory computer readable medium retaining program instructions, the instructions when read by a processor, cause the processor to perform the steps of:
executing a first post-silicon testing program by a reference model, wherein during said executing the first post-silicon testing program one or more test cases are generated, wherein said first post-silicon testing program is executed in an offline generation mode, in which said generating is performed, wherein during said executing of the first post-silicon testing program each test case is generated in a different memory location;
generating a second post-silicon testing program that is configured to execute the one or more test cases; and
executing the second post-silicon testing program on an acceleration platform.
15. The computer program product of claim 14 , wherein said executing the first post-silicon testing program is performed off-platform by a computer having a processor and memory.
16. The computer program product of claim 14 , wherein the second post-silicon testing program is configured to cause said acceleration platform to perform the steps of: selecting a test case to be executed from the one or more test cases, executing the selected test case, and checking results of executing the test case.