IP Library Granted Patent US 8,836,375
Granted Patent B2
US 8,836,375 · App. 13/604,946 · Granted Sep 16, 2014

Continuously self-calibrated latched comparator

Inventor: Kalyan Brata Ghatak (San Jose, CA)
Assignee: LSI Corporation
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Quick Facts
Patent No.
US 8,836,375
App. No.
13/604,946
Granted
Sep 16, 2014
Kind
B2
Abstract

A comparator apparatus includes an amplifier and one or more latched comparators connected to the amplifier that compares input voltage signals to predefined reference voltage signals. The comparator apparatus includes an offset that limits the minimum input differential voltage signal with respect to the predefined voltage signals. A calibration component is electrically connected to the latched comparator and assists in continuously measuring and compensating the offset.

Claims (34)

1. A comparator apparatus, comprising:

a preamplifier and at least one latched comparator connected to said preamplifier to compare input voltage signals to predefined reference voltage signals, said at least one latched comparator responsive to an offset that limits the minimum input differential voltage signal with respect to said predefined voltage signals;

a calibration component electrically connected to said at least one latched comparator and said preamplifier, wherein said calibration component assists in measuring and compensating said offset in order to calibrate changes in said offset that arise due to electrical variations thereof; and

wherein said at least one latched comparator comprises a delay latch that stores a decision output by said at least one latched comparator, wherein said delay latch stores said decision after sampling a common reference voltage and an input offset with respect to said input voltage signals during a reset phase of said at least one latched comparator.

2. The apparatus of claim 1 wherein said calibration component further assists in compensating said offset in order to continuously calibrate changes in said offset that arise to changes in said electrical variations thereof.

3. The apparatus of dam 1 wherein said decision is utilized in said calibration component for offset compensation during a next reset phase of said at least one latched comparator.

4. The apparatus of claim 1 further comprising at least two charge pumps to provide optimum calibration voltages with respect to said amplifier and a measured input offset.

5. The apparatus of claim 1 further comprising:

at least one switching node; and

a cascode transistor that shields a calibration component voltage associated with said calibration component from said at least one switching node.

6. A comparator apparatus, comprising:

a preamplifier and at least one latched comparator connected to said preamplifier to compare input voltage signals to predefined reference voltage signals, said at least one latched comparator responsive to an offset that limits the minimum input differential voltage signal with respect to said predefined voltage signals;

a calibration component electrically connected to said at least one latched comparator and said preamplifier, wherein said calibration component assists in measuring and compensating said offset in order to calibrate changes in said offset that arise due to electrical variations thereof, and wherein said calibration component further assists in compensating said offset in order to continuously calibrate changes in said offset that arise to changes in said electrical variations thereof;

said at least one latched comparator comprises a delay latch that stores a decision output by said at least one latched comparator;

said delay latch stores said decision after sampling a common reference voltage and an input offset with respect to said input voltage signals during a reset phase of said at least one latched comparator; and

said decision is utilized in said calibration component for offset compensation during a next reset phase of said at least one latched cormparator.

7. The apparatus of claim 6 wherein said at least one latched comparator comprises a delay latch that stores a decision output by said at least one latched comparator.

8. The apparatus of claim 7 wherein said delay latch stores said decision after sampling a common reference voltage and an input offset with respect to said input voltage signals during a reset phase of said at least one latched comparator.

9. The apparatus of claim 7 wherein said decision is utilized in said calibration component for offset compensation during a next reset phase of said at least one latched comparator.

10. The apparatus of claim 6 further comprising at least two charge pumps to provide optimum calibration voltages with respect to said amplifier and a measured input offset.

11. The apparatus of claim 6 further comprising:

at least one switching node; and

a cascode transistor that shields a calibration component voltage associated with said calibration component from said at least one switching node.

12. The apparatus of claim 6 further comprising at least two charge pumps to provide optimum calibration voltages with respect to said amplifier and a measured input offset.

13. The apparatus of claim 6 further comprising:

at least one switching node; and

a cascade transistor that shields a calibration component voltage associated with said calibration component from said at least one switching node.

14. A method of measuring and compensating an offset utilizing a comparator apparatus, said method comprising:

comparing input voltage signals to predefined reference voltage signals via a preamplifier connected to at least one latched comparator, said at least one latched comparator responsive to an offset that limits the minimum input differential voltage signal with respect to said predefined voltage signals; and

measuring and compensating said offset in order to calibrate changes in said offset that arise due to electrical variations thereof via a calibration component electrically connected to said at least one latched comparator and said preamplifier;

a delay latch stores said decision after sampling a common reference voltage and an input offset with respect to said input voltage signals during a reset phase of said at least one latched comparator; and

said decision is utilized in said calibration component for offset compensation during a next reset phase of said at least one latched comparator.

15. The method of claim 14 wherein said calibration component further assists in compensating said offset in order to continuously calibrate changes in said offset that arise to changes in said electrical variations thereof.

16. The method of claim 14 wherein said at least one latched comparator further comprises said delay latch, wherein said delay latch that stores a decision output by said at least one latched comparator.

Assignments (6)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2012
From: GHATAK, KALYAN BRATA
To: LSI CORPORATION
Reel/Frame 028906/0476 →
Continuity (1)
Related Publication 20140062569A1 · Mar 6, 2014