IP Library › Granted Patent US 8,836,946
Granted Patent B2
US 8,836,946 · App. 13/530,741 · Granted Sep 16, 2014

Optical device and detection device

Inventors: Jun Amako (Tsurugashima, JP); Kohei Yamada (Minowa, JP); Tatsunori Miyazawa (Chino, JP)
Assignee: Seiko Epson Corporation
G01N21/658B82Y15/00B82Y20/00
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Quick Facts
Patent No.
US 8,836,946
App. No.
13/530,741
Granted
Sep 16, 2014
Kind
B2
Abstract

An optical device includes a group of projections projecting from a conductor surface of a substrate, and arranged along a first direction at a pitch Px, a dielectric layer covering the conductor surface and the group of projections, and a metal nanostructure having metal nanoparticles each having a size d of the order of nanometers arranged on the dielectric layer along the first direction, assuming that the wavelength of irradiation light is λ, λ>Px>d is fulfilled, and assuming that a maximum value of an arrangement pitch between two of the metal nanoparticles adjacent to each other in the first direction is Qx, Px>Qx is fulfilled.

Claims (69)

1. An optical device comprising:

a group of projections projecting from a conductor surface of a substrate, and arranged along a first direction at a pitch Px;

a dielectric layer covering the conductor surface and the group of projections; and

a metal nanostructure having metal nanoparticles each having a size d of the order of nanometers arranged on the dielectric layer along the first direction,

wherein assuming that the wavelength of irradiation light is λ, λ>Px>d is fulfilled, and

assuming that a maximum value of an arrangement pitch between two of the metal nanoparticles adjacent to each other in the first direction is Qx, Px>Qx is fulfilled.

2. The optical device according to claim 1 , wherein

Px/10>Qx is fulfilled, and ten or more of the metal nanoparticles are arranged within the pitch Px along the first direction.

3. The optical device according to claim 1 , wherein

the group of projections are arranged along a second direction perpendicular to the first direction at a pitch Py,

λ>Py>d is fulfilled, and

assuming that a maximum value of an arrangement pitch between two of the metal nanoparticles adjacent to each other in the second direction is Qy, Py>Qy is fulfilled.

4. The optical device according to claim 3 , wherein

Py/10>Qy is fulfilled, and ten or more of the metal nanoparticles are arranged within the pitch Py along the second direction.

5. The optical device according to claim 1 , wherein

the metal nanoparticles are arranged in the first direction at a constant pitch Qx.

6. The optical device according to claim 3 , wherein

the metal nanoparticles are arranged in the second direction at a constant pitch Qy.

7. The optical device according to claim 1 , wherein

a thickness of the dielectric layer is equal to or smaller than 100 nm.

8. A detection device comprising:

the optical device according to claim 1 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

9. A detection device comprising:

the optical device according to claim 2 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

10. A detection device comprising:

the optical device according to claim 3 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

11. A detection device comprising:

the optical device according to claim 4 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

12. A detection device comprising:

the optical device according to claim 5 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

13. A detection device comprising:

the optical device according to claim 6 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

14. A detection device comprising:

the optical device according to claim 7 ;

a light source; and

a light detection section,

wherein a sample is introduced in the metal nanostructure of the optical device,

the optical device emits light reflecting the sample in response to irradiation of light from the light source, and

the light detection section detects the light reflecting the sample from the optical device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 22, 2012
From: AMAKO, JUN; YAMADA, KOHEI; MIYAZAWA, TATSUNORI
To: SEIKO EPSON CORPORATION
Reel/Frame 028427/0648 →
Priority Claims (1)
JP 2011-139526 · Jun 23, 2011 · national
Continuity (1)
Related Publication 20120327417A1 · Dec 27, 2012