IP Library Granted Patent US 8,858,694
Granted Patent B2
US 8,858,694 · App. 13/681,108 · Granted Oct 14, 2014

Zinc oxide precursor containing alkyl zinc halide and method of depositing zinc oxide-based thin film using the same

Inventors: Sooho Park (ChungCheongNam-Do, KR); Seohyun Kim (ChungCheongNam-Do, KR); Jeongwoo Park (ChungCheongNam-Do, KR); Taejung Park (ChungCheongNam-Do, KR); Young Zo Yoo (ChungCheongNam-Do, KR); GunSang Yoon (ChungCheongNam-Do, KR); Eun-Ho Choi (ChungCheongNam-Do, KR); Myong Woon Kim (ChungCheongNam-Do, KR); Bogyeong Kim (ChungCheongNam-Do, KR); Hyung Soo Shin (ChungCheongNam-Do, KR); Seung Ho Yoo (ChungCheongNam-Do, KR); Sang Do Lee (ChungCheongNam-Do, KR); Sang Ick Lee (ChungCheongNam-Do, KR); Sang Jun Yim (ChungCheongNam-Do, KR)
Assignee: Samsung Corning Precision Materials Co., Ltd.
C07F3/06C23C16/407C23C16/08
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Quick Facts
Patent No.
US 8,858,694
App. No.
13/681,108
Granted
Oct 14, 2014
Kind
B2
Abstract

A zinc oxide precursor for use in deposition of a zinc oxide-based thin film contains an alkyl zinc halide having the following formula: R—Zn—X, where R is an alkyl group C n H 2n+1 , and X is a halogen group. The n is a number ranging from 1 to 4, and the alkyl group is one selected from among a methyl group, an ethyl group, an i-propyl group and a t-butyl group. The halogen group contains one selected from among F, Br, Cl and I. A method of depositing a zinc oxide-based thin film includes loading a substrate into a deposition chamber; and supplying the zinc oxide precursor which contains the above-described alkyl zinc halide and an oxidizer into the deposition chamber and forming a zinc oxide-based thin film on the substrate via chemical vapor deposition. The zinc oxide-based thin film is deposited on the substrate via atmospheric pressure chemical vapor deposition.

Claims (11)

1. A zinc oxide precursor composition for use in deposition of a zinc oxide-based thin film, comprising:

an alkyl zinc halide having the following formula:

R—Zn—X,

where R is an alkyl group C n H 2n+1 , and X is a halogen group;

a carrier gas; and

an oxidizing gas.

2. The zinc oxide precursor composition of claim 1 , wherein the n in the alkyl group is a number ranging from 1 to 4.

3. The zinc oxide precursor composition of claim 2 , wherein the alkyl group comprises one selected from the group consisting of a methyl group, an ethyl group, an i-propyl group and a t-butyl group.

4. The zinc oxide precursor composition of claim 1 , wherein the halogen group comprises one selected from the group consisting of F, Br, Cl and I.

5. The zinc oxide precursor composition of claim 1 , wherein the alkyl group comprises a methyl group or an ethyl group, and the halogen group comprises Cl.

6. The zinc oxide precursor composition of claim 1 , comprising a zinc oxide precursor for use in atmospheric pressure chemical vapor deposition.

Assignments (2)
CHANGE OF NAME Recorded Jan 27, 2015
From: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
To: CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 034825/0890 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 22, 2014
From: PARK, SOOHO; KIM, SEOHYUN; PARK, JEONGWOO; PARK, TAEJUNG; YOO, YOUNGZO; YOON, GUNSANG; CHOI, EUN-HO; KIM, MYONG WOON; KIM, BOGYEONG; SHIN, HYUNG SOO; YOO, SEUNG HO; LEE, SANG DO; LEE, SANG ICK; YIM, SANG JUN
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 033366/0009 →
Priority Claims (1)
KR 10-2011-0120424 · Nov 17, 2011 · national
Continuity (1)
Related Publication 20130129923A1 · May 23, 2013